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Voltage scaling and aging effects on soft error rate in SRAM-based FPGAsMicroelectronics Reliability, 2014, 54 (9-10), pp.2344-2348. ⟨10.1016/j.microrel.2014.07.100⟩
Article dans une revue
lirmm-01138923v1
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Aging and voltage scaling impacts under neutron-induced soft error rate in SRAM-based FPGAsETS: European Test Symposium, May 2014, Paderborn, Germany. ⟨10.1109/ETS.2014.6847845⟩
Communication dans un congrès
lirmm-01421128v1
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Analysing the Impact of Aging and Voltage Scaling under Neutron-induced Soft Error Rate in SRAM-based FPGAsESREF: European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2014, Berlin, Germany
Communication dans un congrès
lirmm-01253184v1
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Using electromagnetic emanations for variability characterization in Flash-based FPGAsISVLSI: International Symposium on Very Large Scale Integration, Aug 2013, Natal, Brazil. pp.109-114, ⟨10.1109/ISVLSI.2013.6654631⟩
Communication dans un congrès
lirmm-00985447v1
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