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Pascal Benoit
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Dc and Low Frequency Noise analysis of hot-carrier induced degradation of low complexity 0.13 µm CMOS bipolar transistors, Microelectronics ReliabilityMicroelectronics Reliability, 2005, 45, pp.1800-1806. ⟨10.1016/j.microrel.2005.07.097⟩
Article dans une revue
hal-00329201v1
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