Année de production

Identifiants chercheur

Nombre de documents

1

Olivier FRUCHART - List of publications


"Rachid Belkhou"    Journal of Applied Physics   

Article dans une revue1 document

  • Fabien Cheynis, Nicolas Rougemaille, Rachid Belkhou, Jean-Christophe Toussaint, Olivier Fruchart. X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced Néel-cap reversal. Journal of Applied Physics, American Institute of Physics, 2008, 103, pp.07D915. 〈10.1063/1.2832332〉. 〈hal-00243082〉