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CNRS research officer : III-Nitride Nanowires for nanoenergy applications

Williams Lefebvre   

Journal articles2 documents

  • E. Di Russo, F. Moyon, N. Gogneau, L. Largeau, E. Giraud, et al.. Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe Tomography. Journal of Physical Chemistry C, American Chemical Society, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩. ⟨hal-01928844⟩
  • L. Rigutti, L. Mancini, E. Di Russo, I. Blum, F. Moyon, et al.. Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem. Microscopy and Microanalysis, Cambridge University Press (CUP), 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩. ⟨hal-01954232⟩