Noelle Gogneau

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martin-foldyna

"jean-christophe-harmand"

	Electron beam induced current microscopy investigation of GaN nanowire arrays grown on Si substrates Vladimir Neplokh , Ahmed Ali , François H. Julien , Martin Foldyna , Ivan Mukhin Materials Science in Semiconductor Processing, 2016, 55, pp.72 - 78. ⟨10.1016/j.mssp.2016.03.002⟩ Article dans une revue hal-01401078v1