- 1
- 1
Noelle Gogneau
2
Documents
Présentation
Domaines de recherche
Compétences
Publications
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
Composition Metrology of Ternary Semiconductor Alloys Analyzed by Atom Probe TomographyJournal of Physical Chemistry C, 2018, 122 (29), pp.16704--16714. ⟨10.1021/acs.jpcc.8b03223⟩
Article dans une revue
hal-01928844v1
|
|
Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological ProblemMicroscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩
Article dans une revue
hal-01954232v1
|