Noelle Gogneau

Documents

Présentation

blum-ivan

"jean-michel-chauveau"

	Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem Lorenzo Rigutti , L. Mancini , Enrico Di Russo , Ivan Blum , F. Moyon Microscopy and Microanalysis, 2016, 22 (S3), pp.650-651. ⟨10.1017/S1431927616004104⟩ Article dans une revue hal-01954232v1