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Nikolay Cherkashin
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- nikolay-cherkashin
- 0000-0002-0322-0864
- IdRef : 183426924
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Compositional accuracy in atom probe tomography analyses performed on III-N light emitting diodesJournal of Applied Physics, 2019, 126 (12), pp.124307. ⟨10.1063/1.5113799⟩
Article dans une revue
hal-02298940v1
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Extended Defects Formation in Nanosecond Laser-Annealed Ion Implanted SiliconNano Letters, 2014, 14 (4), pp.1769-1775. ⟨10.1021/nl4042438⟩
Article dans une revue
hal-01659180v1
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Extended defects in ion-implanted si during nanosecond laser annealingJunction Technology (IWJT), 2014 International Workshop on, May 2014, Shanghai, China. pp.7-12, ⟨10.1109/IWJT.2014.6842019⟩
Communication dans un congrès
hal-01721156v1
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