CV Accueil - Archive ouverte HAL

	Local strain measurements at dislocations, disclinations and domain boundaries Martin Hÿtch , Christophe Gatel , Axel Lubk , Thibaud Denneulin , Lise Durand Microscopy and Microanalysis, 2014, 20 (3), pp.1044-1045. ⟨10.1017/S1431927614006941⟩ Article dans une revue hal-01721157v1
	Dynamic scattering theory for dark-field electron holography of 3D strain fields Axel Lubk , Elsa Javon , Nikolay Cherkashin , Shay Reboh , Christophe Gatel Ultramicroscopy, 2014, 136, pp.42-49. ⟨10.1016/j.ultramic.2013.07.007⟩ Article dans une revue hal-01721153v1
	Dynamical effects in strain measurements by dark-field electron holography Elsa Javon , Axel Lubk , Robin Cours , Shay Reboh , Nikolay Cherkashin Ultramicroscopy, 2014, 147, pp.70-85. ⟨10.1016/j.ultramic.2014.06.005⟩ Article dans une revue hal-01721158v1

	Advanced characterization of semiconductors Nikolay Cherkashin , François-Xavier Darras , Maxim Korytov , Christophe Gatel , Martin Hÿtch XV B-MRS, Sep 2016, Campinas, Brazil Communication dans un congrès hal-01767758v1

	Dark-Field Electron Holography for Strain Mapping Martin Hÿtch , Florent Houdellier , Nikolay Cherkashin , Shay Reboh , Elsa Javon Alain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩ Chapitre d'ouvrage hal-01736026v1

Nikolay Cherkashin