- 2
Nikolay Cherkashin
2
Documents
Identifiants chercheurs
- nikolay-cherkashin
- 0000-0002-0322-0864
- IdRef : 183426924
Présentation
Publications
- 2
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
Local strain measurements at dislocations, disclinations and domain boundariesMicroscopy and Microanalysis, 2014, 20 (3), pp.1044-1045. ⟨10.1017/S1431927614006941⟩
Article dans une revue
hal-01721157v1
|
Dark-Field Electron Holography for Strain MappingAlain Claverie; Mireille Mouis. Transmission Electron Microscopy in Micro-Nanoelectronics, Wiley-Blackwell, pp.81--106, 2013, ⟨10.1002/9781118579022.ch4⟩
Chapitre d'ouvrage
hal-01736026v1
|