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57 résultats
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Powering a Commercial Datalogger by Energy Harvesting from Generated Aeroacoustic Noise Powering a Commercial Datalogger by Energy Harvesting from Generated Aeroacoustic NoisePowerMEMS 2014, University of Hyogo, Japan, Nov 2014, Awaji Island, Hyogo, Japan. pp.12025, ⟨10.1088/1742-6596/557/1/012025⟩
Communication dans un congrès
hal-01092975v1
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Analytical description of the injection ratio of self-biased bipolar transistors under the very high injection conditions of ESD eventsSolid-State Electronics, 2007, 52 (5), pp.663-674
Article dans une revue
hal-00382960v1
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Implementation of Thermoelectric Generators in Airliners for Powering,Battery-free Wireless Sensor NetworksJournal of Electronic Materials, 2014, 43 (6), pp.2444-2451
Article dans une revue
hal-00998857v1
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ESD Protection Methodologies: From Component to SystemElsevier, 284p., 2017, 978-1-78548-122-2
Ouvrages
hal-01613901v1
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Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field ProbesIEEE Transactions on Instrumentation and Measurement, 2021, 70, ⟨10.1109/TIM.2021.3126376⟩
Article dans une revue
hal-03423272v1
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Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit LevelInternational Symposium on Electromagnetic Compatibility (EMC Europe 2022), Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9900970⟩
Communication dans un congrès
hal-03773209v1
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A Nanosatellite Optoelectronic Payload Dedicated to Radiation-Induced Degradation Measurement in Erbium-Doped Fiber10th European CubeSat Symposium, Dec 2018, Toulouse, France
Communication dans un congrès
hal-01925595v1
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On-chip measurement to analyze failure mechanisms of ICs under system level ESD stressMicroelectronics Reliability, 2013, 53 (9-11), pp.1278-1283. ⟨10.1016/j.microrel.2013.07.056⟩
Article dans une revue
hal-00941840v1
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Practical Transient System-level ESD Modeling - Environment ContributionElectrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), Sep 2014, Tucson, AZ, United States. 10p
Communication dans un congrès
hal-01843080v1
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Frequency Based Method Investigation to Extract an ESD Protection Dynamic SPICE Model from TLP MeasurementsIEEE Transactions on Electromagnetic Compatibility, 2022, 64 (1), pp.47 - 57. ⟨10.1109/TEMC.2021.3106770⟩
Article dans une revue
hal-03408285v1
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On the Correlation between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part IIIEEE Transactions on Electromagnetic Compatibility, 2022, 64 (5), pp.1493 - 1505. ⟨10.1109/TEMC.2022.3172601⟩
Article dans une revue
hal-03681022v1
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Protecting Mixed-Signal Technologies Against Electrostatic Discharges: Challenges and Protection Strategies from Component to SystemThomas NOULIS. Mixed-signal circuits, CRC PRESS, 40p. Chapter 3, 2015, Devices, Circuits, and Systems Series, 9781482260625
Chapitre d'ouvrage
hal-01218627v1
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Méthodologies de protection ESD : du composant au systèmeISTE Editions. 280p., 2018, 9781784053260
Ouvrages
hal-01702094v1
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LIN communication behaviours against ESD events2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Sep 2017, Angers, France. ⟨10.1109/EMCEurope.2017.8094675⟩
Communication dans un congrès
hal-01698505v1
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Voiture autonome : le défi du zéro défaut pour la fiabilité des systèmes électroniques embarquésTransports du futur: Regards croisés de chercheur.e.s, 37, pp.20, 2018, Collection Petit illustré
Chapitre d'ouvrage
hal-01980187v1
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Proof of concept of energy harvesting from aero acoustic noise12th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS 2012), Dec 2012, Atlanta, United States. pp. 267-270
Communication dans un congrès
hal-00945046v1
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An aeroacoustic energy harvester for supplying power to embedded sensors in aircraftsQuatrièmes Journées Nationales sur la Récupération et le Stockage d'Energie (JNRSE 2014), Apr 2014, ANNECY, France
Communication dans un congrès
hal-01067808v1
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NIMPH: EDMon (Erbium Doped fiber Monitoring)Journée du Club Opto Microonde, Jul 2018, Toulouse, France
Communication dans un congrès
hal-02022183v1
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Evidence of impurity impact ionization avalanche in P-type diamond11th Expert Meeting on Evaluation & Control of Coumpound Semiconductor Materials and Technologies, EXMATEC 2012, 2012, Porquerolles, France. pp.1-2
Communication dans un congrès
hal-00801157v1
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TCAD methodology for ESD robustness prediction of smart power ESD devicesIEEE Transactions on Device and Materials Reliability, 2006, 6 (3), pp.399-407
Article dans une revue
hal-00195294v1
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Modélisation de système pour la prédiction de défaillances dues aux décharges électrostatiquesJournées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2016), May 2016, Toulouse, France. 5p
Communication dans un congrès
hal-01698411v1
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Novel 3D back-to-back diodes ESD protectionInternational ESD Workshop (IEW) , May 2014, Villard de Lans, France. 2p
Communication dans un congrès
hal-01843394v1
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Proceedings of the 32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis32nd European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Oct 2021, Bordeaux, France. Microelectronics Reliability, pp.114403, 2021, ⟨10.1016/j.microrel.2021.114403⟩
N°spécial de revue/special issue
hal-03408633v1
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Reliability of ESD protection devices designed in a 3D technologyMicroelectronics Reliability, 2014, Microelectronics Reliability, 54 (9), pp.2272-2277. ⟨10.1016/j.microrel.2014.07.136⟩
Article dans une revue
hal-01218702v1
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High robustness PNP-based structure for the ESD protection of high voltage I/Os in an advanced smart power technologyBipolar/BiCMOS Circuits and Technology Meeting (BCTM), Oct 2007, BOSTON, United States. pp.359
Communication dans un congrès
hal-00195362v1
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Behavioral-Modeling Methodology to Predict Electrostatic-Discharge Susceptibility Failures at System Level : an IBIS ImprovementInt. Symposium on Electromagnetic Compatibility (EMC Europe 2011), Sep 2011, YORK, United Kingdom. pp.457-463
Communication dans un congrès
hal-00722643v1
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Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structureEuropean Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), 2005, arcachon, France. pp.1415-1420
Communication dans un congrès
hal-00401483v1
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Investigation of Modeling System ESD Failure and Probability Using IBIS ESD ModelsIEEE Transactions on Device and Materials Reliability, 2012, 12 (4), pp.599-606. ⟨10.1109/TDMR.2012.2218605⟩
Article dans une revue
hal-00941823v1
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Accurate Transient Behavior Measurement of High- Voltage ESD Protections Based on a Very Fast Transmission-Line Pulse System31st Electrical Overstress/Electrostatic Discharge Symposium, 2009. EOS/ESD Symposium, Aug 2009, ANAHEIM, United States. pp.165-172
Communication dans un congrès
hal-00445676v1
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Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structureMicroelectronics Reliability, 2005, 45 (9), pp.1415-1420
Article dans une revue
hal-00397706v1
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