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Myriam ZERRAD - Institut Fresnel - scientific production


"F. Lemarchand"    "V. Aubry"   

Journal articles1 document

  • Aude L. Lereu, F. Lemarchand, M. Zerrad, D. Niu, V. Aubry, et al.. Sensitivity of resonance properties of all-dielectric multilayers driven by statistical fluctuations. Optics Express, Optical Society of America, 2019, 27 (21), pp.30654. ⟨10.1364/OE.27.030654⟩. ⟨hal-02322711⟩