Number of documents

34

Myriam ZERRAD - Institut Fresnel - scientific production


"Carole Deumié"    Institut FRESNEL   

Journal articles9 documents

  • Michel Lequime, Myriam Zerrad, Carole Deumie, Claude Amra. A goniometric light scattering instrument with high-resolution imaging. Optics Communications, Elsevier, 2009, 282, pp.1265-1273. ⟨hal-00385367⟩
  • Laurent Arnaud, Gaelle Georges, Jacques Sorrentini, Myriam Zerrad, Carole Deumie, et al.. An enhanced contrast to detect bulk objects under arbitrary rough surfaces. Optics Express, Optical Society of America, 2009, 17 (7), pp.5758-5773. ⟨hal-00385371⟩
  • Claude Amra, Myriam Zerrad, Laure Siozade, Gaelle Georges, Carole Deumie. Partial polarization of light induced by random defects at surfaces or bulks. Optics Express, Optical Society of America, 2008, 16 (14), pp.10372-10383. ⟨hal-00385374⟩
  • Gaelle Georges, Laurent Arnaud, Laure Siozade, Norah Leneindre, Frederic Chazalet, et al.. From angle resolved ellipsometry of light scattering to imaging in random media. Applied optics, Optical Society of America, 2008, 47, pp.C257-C265. ⟨hal-00361018⟩
  • Myriam Zerrad, Carole Deumie, Michel Lequime, Claude Amra. An alternative scattering method to characterize surface roughness from transparent substrates. Optics Express, Optical Society of America, 2007, 15 (15), pp.9222-9231. ⟨hal-00092525⟩
  • Myriam Zerrad, Carole Deumie, Sebastien Rul, Eugénie Degbé. Optical characterization of photochromic effect. Optics Communications, Elsevier, 2007, 273 (2), pp.344-351. ⟨hal-00141832⟩
  • Philippe Voarino, Myriam Zerrad, Carole Deumie, Claude Amra. Multidielectric quarter-wave coatings on microspheres: A study in colorimetric space. Applied optics, Optical Society of America, 2006, 45, pp.1469. ⟨hal-00081346⟩
  • F. Lemarchand, Carole Deumie, Myriam Zerrad, L. Abel-Tiberini, Bertrand Bertussi, et al.. Optical Characterisation of an unknown single layer: Institut Fresnel contribution to OIC 2004 Measurement Problem. Applied optics, Optical Society of America, 2006, 45, pp.1312-1318. ⟨hal-00081179⟩
  • Myriam Zerrad, Carole Deumie, Michel Lequime, Claude Amra, M. Ewart. Light-scattering characterization of transparent substrates. Applied optics, Optical Society of America, 2006, 45, pp.1402. ⟨hal-00081344⟩

Conference papers25 documents

  • Myriam Zerrad, Michel Lequime, Carole Deumie, Claude Amra. A goniometric instrument for a spatially resolved scattering and polarimetric characterisation of optical coatings. Optical Interference Coatings, Jun 2010, Tucson, United States. ⟨hal-00471680⟩
  • Myriam Zerrad, Michel Lequime, Carole Deumie, Claude Amra. CCD-ARS set-up: a comprehensive and fast high sensitivity characterisation tool for optical components. Optical Micro- and Nanometrology, Apr 2010, Brussels, Belgium. pp.77189. ⟨hal-00477724⟩
  • C. Zerrouki, N. Fourati, Z. Silvestri, P. Pinot, H. Nasrallah, et al.. Vers des surfaces de références ; intérêt de la densité spectrale de puissance. Journées Nationales en Nanosciences et Nanotechnologies, 2009, Toulouse, France. ⟨hal-00459430⟩
  • Claude Amra, Jacques Sorrentini, Laurent Arnaud, Myriam Zerrad, Philippe Tchamitchian, et al.. Angle-Resolved Ellipsometric Data for Selective Imaging in Scattering Media. European Conferences On Biomedical Optics (ECBO), Jun 2009, Munich, Germany. pp.736910. ⟨hal-00413241⟩
  • C. Zerrouki, N. Fourati, Z. Silvestri, P. Pinot, H. Nasrallah, et al.. Nanorugosité et surfaces de référence ; intérêt de la densité spectrale de puissance. Réunion Générale "interférences d'ondes", 2009, Paris, France. ⟨hal-00459429⟩
  • C. Zerrouki, P. Pinot, N. Fourati, Z. Silvestri, H. Nasrallah, et al.. Phénomènes de surfaces à l'échelle nanométrique et moyens de caractérisation: Vers des étalons de rugosité. J3N, 2009, Toulouse, France. ⟨hal-00459431⟩
  • Claude Amra, Carole Deumie, Michel Lequime, Myriam Zerrad, Gaelle Georges, et al.. Light Scattering in Multilayer Optics: Review and Progress. FOCASIA, Frontiers of Optical Coatings, 2009, xian, China. ⟨hal-00459732⟩
  • Carole Deumie, Claude Amra, Anabela Da Silva, Gaelle Georges, Gael Latour, et al.. Imagerie sélective en milieu diffusant. Workshop Cerimed, 2009, marseille, France. ⟨hal-00496601⟩
  • Myriam Zerrad, Jacques Sorrentini, Laurent Arnaud, Gaelle Georges, Carole Deumie, et al.. Signatures statistiques de milieux diffusants : corrélation aux données ellipsométriques. 7èmes Journées OPTDIAG Diagnostic et imagerie optique en médecine, 2009, France. pp./. ⟨hal-00385404⟩
  • Jacques Sorrentini, Myriam Zerrad, Laurent Arnaud, Carole Deumie, Claude Amra. Analyse des signaux ellipsométriques pour l'imagerie optique sélective. ONC2009, 2009, France. pp./. ⟨hal-00385402⟩
  • C. Zerrouki, P. Pinot, N. Fourati, Z. Silvestri, H. Nasrallah, et al.. Phénomènes de surfaces à l'échelle nanométrique et moyens de caractérisation: Vers des étalons de rugosité. Journées Nationales en Nanosciences et Nanotechnologies, 2008, grenoble, France. ⟨hal-00459428⟩
  • C. Zerrouki, P. Pinot, F. de Fornel, N. Fourati, H. Nasrallah, et al.. Random roughness standards: needs and applications. JNTE08, 2008, Toulouse, France. ⟨hal-00459426⟩
  • N. Fourati, Z. Silvestri, H. Nasrallah, Myriam Zerrad, C. Zerrouki, et al.. Towards nanoroughness standards with a continuum of spatial frequencies. NanoScale 2008, 2008, Turin, Italy. ⟨hal-00459427⟩
  • Myriam Zerrad, Michel Lequime, Carole Deumié-Raviol, Claude Amra. Characterization and cleaning control of optical coatings by using a goniometric light scatter instrument with sample imaging ability. International Conference on Space Optics 2008, Oct 2008, Toulouse, France. ⟨10.1117/12.2308188⟩. ⟨hal-01932721⟩
  • Myriam Zerrad, Michel Lequime, Carole Deumie, Claude Amra. Characterization and cleaning control of opticla coatings by using a goniometric light scatter instrument with sample imaging ability". international Conference on Space Optics, 2008, toulouse, France. ⟨hal-00475914⟩
  • Claude Amra, Myriam Zerrad, Laure Siozade, Gaelle Georges, Laurent Arnaud, et al.. Dépolarisation induite par la présence de centres diffusants : analyse multi-échelle. ONC2008, 2008, France. pp./. ⟨hal-00385406⟩
  • Myriam Zerrad, Michel Lequime, Carole Deumie, Claude Amra. Development of a goniometric light scatter instrument with sample imaging ability. Europe Optical Systems Design, Optical Fabrication, Testing, and Metrology III, 2008, Glascow, United Kingdom. ⟨hal-00385380⟩
  • N. Fourati, Z. Silvestri, H. Nasrallah, Myriam Zerrad, C. Zerrouki, et al.. Phénomènes de surfaces à l'échelle nanométrique et moyens de caractérisation: Vers des étalons de rugosité. Journées Nationales en Nanosciences et Nanotechnologies, 2007, Paris, France. ⟨hal-00459425⟩
  • Myriam Zerrad, Michel Lequime, Carole Deumie, Claude Amra. Characterization of Optical Coatings with a CCD angular and Spatial Resolved Scatterometer. Optical Interference Coatings (OIC) 2007, 2007, Tucson, United States. ⟨hal-00243136⟩
  • Claude Amra, Carole Deumie, Gaelle Georges, Laurent Arnaud, Myriam Zerrad, et al.. Selective cancellation of scattered light in optical substrates and coatings. Laser-Induced Damage in Optical Materials: 2007, 2007, Boulder, United States. pp.67201G. ⟨hal-00385389⟩
  • Myriam Zerrad, Michel Lequime, Carole Deumie. Développement d'un analyseur CCD pour la caractérisation d'une surface optique. Conférence Mesures Optiques pour l'Industrie (CMOI), 2006, Mulhouse, France. ⟨hal-00243138⟩
  • Myriam Zerrad, Carole Deumie, Michel Lequime, Claude Amra. Caractérisation par diffusion lumineuse des deux faces d'un échantillon transparent. CRIEC 2005, 2005, Lille, France. ⟨hal-00081349⟩
  • Myriam Zerrad, Carole Deumie, Michel Lequime, Claude Amra, M. Ewart. Light-scattering characterization of superpolished transparent substrates. Optical Interference Coatings, 2004, Tucson, United States. ⟨hal-00081348⟩
  • Carole Deumie, Myriam Zerrad, Michel Lequime, Claude Amra. Light scattering characterization of superpolished transparent substrates. Optical Interference Coatings, 2004, banff, Canada. pp.WE3. ⟨hal-00493777⟩
  • Myriam Zerrad, Carole Deumie, Michel Lequime. Diffusion de la lumière par des substrats transparents: caractérisation d'états de surfaces. Horizons de l'Optique 2003, 2003, toulouse, France. ⟨hal-00081347⟩