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51 résultats
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triés par
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Managing Wear out and Variability Monitors: IEEE 1687 to the RescueEast West Design and test Symposium, Oct 2016, Yerevan, Armenia
Communication dans un congrès
hal-01513840v1
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On the Need for Common Evaluation Methods for Fault Tolerance Costs in Microprocessors2005, pp.247- 252, ⟨10.1109/IOLTS.2005.46⟩
Communication dans un congrès
hal-00103942v1
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Conception d'un Système Embarque Sur et SécuriséMicro et nanotechnologies/Microélectronique. Institut National Polytechnique de Grenoble - INPG, 2006. Français. ⟨NNT : ⟩
Thèse
tel-00163980v1
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A highly flexible hardened RTL processor core based on LEON8th European Conference on Radiation and its Effects on Components and Systems (RADECS'05), Sep 2005, Cap d'Agde, France
Communication dans un congrès
hal-01400092v1
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Fast register criticality evaluation in a SPARC microprocessor10th Conference on Ph.D Research in Microelectronics and Electronics (PRIME'14), Jun 2014, Grenoble, France. pp.1-4
Communication dans un congrès
hal-01132407v1
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Targeting approximation through data lifetime: a quest for optimization metrics4th Approximate Computing Workshop (AxC 2019), Mar 2019, Florence, Italy
Communication dans un congrès
hal-02108592v1
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Operating system function reuse to achieve low-cost fault tolerance2004, pp.167- 172
Communication dans un congrès
hal-00130530v1
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Integrated circuit test apparatus and methodUnited States, Patent n° : US 20200150177 A1. 2020
Brevet
hal-03812150v1
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Fast accurate evaluation of register lifetime and criticality in a pipelined microprocessor22nd IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC'14), Oct 2014, Playa del Carmen, Mexico. pp.260-265
Communication dans un congrès
hal-01131896v1
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Reliability of computing systems: From flip flops to variablesIOLTS: International On-Line Testing Symposium, Jul 2017, Thessaloniki, Greece. pp.196-198, ⟨10.1109/IOLTS.2017.8046242⟩
Communication dans un congrès
lirmm-01700744v1
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New Perspectives on Core In-field Path Delay TestInternational Test Conference (ITC 2020), Nov 2020, Washington DC, United States
Communication dans un congrès
hal-03001829v1
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Refreshing the JTAG FamilyIEEE 41st VLSI Test Symposium (VTS 2023), Apr 2023, San Diego, United States. ⟨10.1109/VTS56346.2023.10140015⟩
Communication dans un congrès
hal-04143227v1
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Approximate computing design exploration through data lifetime metrics24th IEEE European Test Symposium (ETS 2019), May 2019, Baden Baden, Germany
Communication dans un congrès
hal-02110003v1
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I Wish IJTAG would do this27th IEEE European Test Symposium (ETS 2022), May 2022, Barcelona, Spain
Communication dans un congrès
hal-03780250v1
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Simulation-based Equivalence Checking between IEEE 1687 ICL and RTLInternational Test Conference (ITC 2019), Nov 2019, Washington DC, United States
Communication dans un congrès
hal-02376427v1
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Usefulness and effectiveness of HW and SW protection mechanisms in a processor-based systemIEEE International Conference on Electronics, Circuits and Systems (ICECS'08), Sep 2008, Saint Julians, Malta. pp.113-116
Communication dans un congrès
hal-00322962v1
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System Level Coordination of Multiple-Standard DfTTest Standards Application Workshop (TESTA’16), May 2016, Amsterdam, Netherlands
Communication dans un congrès
hal-01524100v1
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Criticality evaluation of embedded software running on a pipelined microprocessor and impact of compilation optionsIEEE International Conference on Electronics, Circuits and Systems (ICECS), Dec 2014, Marseille, France. pp.778-781
Communication dans un congrès
hal-01103166v1
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A Comprehensive End-to-end Solution for a Secure and Dynamic Mixed-signal 1687 System2020 International Symposium on On-Line Testing and Robust System Design (IOLTS 2020), Jul 2020, Naples (Virtual Conference), Italy. ⟨10.1109/IOLTS50870.2020.9159721⟩
Communication dans un congrès
hal-02939302v1
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Standards: Can they co-exist for System Level Test?VLSI Test Symposium, Apr 2016, Las Vegas, NE, United States
Communication dans un congrès
hal-01445024v1
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Réalisation d'une tolérance aux fautes à bas coût dans les SoCs en utilisant le système d'exploitationVIIème Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM'04), May 2004, Marseille, France. pp.454-456
Communication dans un congrès
hal-01400098v1
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A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable NetworksEuropean Test Symposium (ETS 2019), May 2019, Baden Baden, Germany
Poster de conférence
hal-02326980v1
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Towards a secure and reliable system2005, pp.1085-1098, ⟨10.1007/11596356_108⟩
Communication dans un congrès
istex
hal-00130542v1
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L’apprentissage par projet en microélectronique numérique Vers l’acquisition d’un savoir-faireJournal sur l'enseignement des sciences et technologies de l'information et des systèmes, 2022, 21 (1015), pp.7. ⟨10.1051/j3ea/20221015⟩
Article dans une revue
hal-04018033v1
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Flexible and Portable Management of Secure Scan Implementations Exploiting P1687.1 ExtensionsIEEE Design & Test, 2022, IEEE Design & Test, 39 (3), pp.117-124. ⟨10.1109/MDAT.2021.3117875⟩
Article dans une revue
hal-03370952v1
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Secure Test with RSNs: Seamless Authenticated Extended Confidentiality19th IEEE International New Circuits and Systems Conference (NEWCAS 2021), Jun 2021, Toulon, France
Communication dans un congrès
hal-03287523v1
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A context-switch based checkpoint and rollback scheme19th Conference on Design of Circuits and Integrated Systems (DCIS'04), Nov 2004, Bordeaux, France. pp.423-428
Communication dans un congrès
hal-01393251v1
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Evaluating Application-Aware Soft Error Effects in Digital Circuits Without Fault Injections or Probabilistic Computations22nd IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS'16), Jul 2016, St Feliu de Guixols, Spain. pp.54-59
Communication dans un congrès
hal-01444967v1
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Evolutions of the Software Flow for Automated TestingAutomatic. Université Grenoble Alpes, 2024
HDR
tel-04526188v1
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Analyse de criticité des registres dans un microprocesseur SPARC17èmes Journées Nationales du Réseau Doctoral en Microélectronique (JNRDM), May 2014, Lille, France
Communication dans un congrès
hal-01061243v1
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