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MR
michel renovell
6
Documents
Identifiants chercheurs
- michel-renovell
- 0000-0002-3896-8231
- IdRef : 031539130
Présentation
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A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADCMicroelectronics Journal, 2013, 44 (9), pp.840-843. ⟨10.1016/j.mejo.2013.06.009⟩
Article dans une revue
lirmm-00875985v1
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On the use of redundancy to reduce prediction error in alternate analog/RF testIMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩
Communication dans un congrès
lirmm-00803556v1
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Making predictive analog/RF alternate test strategy independent of training set sizeITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.9, ⟨10.1109/TEST.2012.6401560⟩
Communication dans un congrès
lirmm-00803564v1
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Smart selection of indirect parameters for DC-based alternate RF IC testingVTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩
Communication dans un congrès
lirmm-00803453v1
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Adaptive LUT-Based System for In Situ ADC Auto-correctionIMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A
Communication dans un congrès
lirmm-00494424v1
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Implementing model redundancy in predictive alternate test to improve test confidenceETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013, ⟨10.1109/ETS.2013.6569386⟩
Poster de conférence
lirmm-00820077v1
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