Accéder directement au contenu
MR

michel renovell

6
Documents
Identifiants chercheurs

Présentation

Publications

859549

On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing

Piet Engelke , Ilia Polian , Michel Renovell , Sandip Kundu , Bharath Seshadri
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2008, 27 (2), pp.327-338. ⟨10.1109/TCAD.2007.913382⟩
Article dans une revue lirmm-00375007v1

Simulating Resistive-Bridging and Stuck-At Faults

Piet Engelke , Ilia Polian , Michel Renovell , Bernd Becker
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006, 25 (10), pp.2181-2192. ⟨10.1109/TCAD.2006.871626⟩
Article dans une revue lirmm-00375012v1
Image document

An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects

Nicolas Houarche , Mariane Comte , Michel Renovell , Alejandro Czutro , Piet Engelke
VTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. pp.21-26, ⟨10.1109/VTS.2009.57⟩
Communication dans un congrès lirmm-00374941v1

A Model for Resistive Open Recursivity in CMOS Random Logic

Michel Renovell , Mariane Comte , Nicolas Houarche , Ilia Polian , Piet Engelke
EWDTS: East-West Design & Test Symposium, Oct 2008, Lviv, Ukraine. pp.21-24
Communication dans un congrès lirmm-00381465v1

A Specific ATPG Technique for Resistive Open with Sequence Recursive Dependency

Michel Renovell , Mariane Comte , Ilia Polian , Piet Engelke , Bernd Becker
ATS: Asian Test Symposium, Nov 2006, Fukuoka, Japan. pp.273-278, ⟨10.1109/ATS.2006.261031⟩
Communication dans un congrès lirmm-00117022v1
Image document

Analysing the Memory Effect of Resistive Open in CMOS Random Logic

Michel Renovell , Mariane Comte , Ilia Polian , Piet Engelke , Bernd Becker
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2006, Tunis, Tunisia. pp.251-256
Communication dans un congrès lirmm-00093383v1