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MR
michel renovell
6
Documents
Identifiants chercheurs
- michel-renovell
- 0000-0002-3896-8231
- IdRef : 031539130
Présentation
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On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage TestingIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2008, 27 (2), pp.327-338. ⟨10.1109/TCAD.2007.913382⟩
Article dans une revue
lirmm-00375007v1
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Simulating Resistive-Bridging and Stuck-At FaultsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006, 25 (10), pp.2181-2192. ⟨10.1109/TCAD.2006.871626⟩
Article dans une revue
lirmm-00375012v1
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An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short DefectsVTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. pp.21-26, ⟨10.1109/VTS.2009.57⟩
Communication dans un congrès
lirmm-00374941v1
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A Model for Resistive Open Recursivity in CMOS Random LogicEWDTS: East-West Design & Test Symposium, Oct 2008, Lviv, Ukraine. pp.21-24
Communication dans un congrès
lirmm-00381465v1
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A Specific ATPG Technique for Resistive Open with Sequence Recursive DependencyATS: Asian Test Symposium, Nov 2006, Fukuoka, Japan. pp.273-278, ⟨10.1109/ATS.2006.261031⟩
Communication dans un congrès
lirmm-00117022v1
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Analysing the Memory Effect of Resistive Open in CMOS Random LogicDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2006, Tunis, Tunisia. pp.251-256
Communication dans un congrès
lirmm-00093383v1
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