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	Deriving an Electrical Model for Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects Nicolas Houarche , Alejandro Czutro , Mariane Comte , Piet Engelke , Ilia Polian LATW'09: 10th Latin-American Test Workshop, Mar 2009, Armaçao dos Buzios, Brazil, pp.N/A Communication dans un congrès lirmm-00367708v1
	An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects Nicolas Houarche , Mariane Comte , Michel Renovell , Alejandro Czutro , Piet Engelke VTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. pp.21-26, ⟨10.1109/VTS.2009.57⟩ Communication dans un congrès lirmm-00374941v1
	A Model for Resistive Open Recursivity in CMOS Random Logic Michel Renovell , Mariane Comte , Nicolas Houarche , Ilia Polian , Piet Engelke EWDTS: East-West Design & Test Symposium, Oct 2008, Lviv, Ukraine. pp.21-24 Communication dans un congrès lirmm-00381465v1
	A Simulator of Small-Delay Faults Caused by Resistive-Open Defects Alejandro Czutro , Nicolas Houarche , Piet Engelke , Ilia Polian , Mariane Comte ETS: European Test Symposium, May 2008, Verbania, Italy. pp.113-118 Communication dans un congrès lirmm-00285886v1

michel renovell