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    69

    Publications of Michel Renovell


    Serge Bernard   

    Journal articles12 documents

    • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectronics Journal, Elsevier, 2015, 46 (11), pp.1091-1102. ⟨10.1016/j.mejo.2015.09.014⟩. ⟨lirmm-01232890⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Enhancing Confidence in Indirect Analog/RF Testing against the Lack of Correlation between Regular Parameters and Indirect Measurements. Microelectronics Journal, Elsevier, 2014, 45 (3), pp.336-344. ⟨10.1016/j.mejo.2013.12.006⟩. ⟨lirmm-00936443⟩
    • Vincent Kerzérho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, et al.. A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. Microelectronics Journal, Elsevier, 2013, 44 (9), pp.840-843. ⟨10.1016/j.mejo.2013.06.009⟩. ⟨lirmm-00875985⟩
    • Vincent Kerzérho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, et al.. Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. Journal of Electronic Testing, Springer Verlag, 2011, 27 (3), pp.335-350. ⟨10.1007/s10836-011-5194-y⟩. ⟨lirmm-00609243⟩
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, et al.. ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design, Hindawi Publishing Corporation, 2008, 2008 (Article ID 482159), pp.8. ⟨10.1155/2008/482159⟩. ⟨lirmm-00346722⟩
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. Fully Digital Test Solution for a Set of ADCs and DACs embedded in a SiP or SoC. IET Computers & Digital Techniques, Institution of Engineering and Technology, 2007, 1 (3), pp.146-153. ⟨lirmm-00195172⟩
    • Serge Bernard, Vincent Kerzérho, Philippe Cauvet, Florence Azaïs, Mariane Comte, et al.. A Novel DFT Technique to Test a Complete Set of ADC's and DAC's Embedded in a Complex SiP. IEEE Design & Test, IEEE, 2006, 23 (3), pp.237-243. ⟨lirmm-00115131⟩
    • Florence Azaïs, Serge Bernard, Mariane Comte, Yves Bertrand, Michel Renovell. Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. Journal of Electronic Testing, Springer Verlag, 2005, 21 (3), pp.291-298. ⟨lirmm-00105322⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. Journal of Electronic Testing, Springer Verlag, 2004, 20 (4), pp.375-387. ⟨lirmm-00108545⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. A-to-D Converter Static Error Detection from Dynamic Parameter Measurements. Microelectronics Journal, Elsevier, 2003, 34 (10), pp. 945-953. ⟨lirmm-00269601⟩
    • Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST. Journal of Electronic Testing, Springer Verlag, 2003, 19 (4), pp. 469-479. ⟨lirmm-00269602⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Analog Built-In Saw-Tooth Generator for ADC Histogram Test. Microelectronics Journal, Elsevier, 2002, 33 (10), pp.781-789. ⟨lirmm-00268587⟩

    Conference papers37 documents

    • Achraf Lamlih, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Mariane Comte, et al.. Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systems. IWIS: International Workshop on Impedance Spectroscopy, Sep 2016, Chemnitz, Germany. ⟨lirmm-01457544⟩
    • Vincent Kerzérho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, et al.. Toward adaptation of ADCs to operating conditions through on-chip correction. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.634-639, ⟨10.1109/ISVLSI.2015.62⟩. ⟨lirmm-01233117⟩
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. A framework for efficient implementation of analog/RF alternate test with model redundancy. ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.621-626, ⟨10.1109/ISVLSI.2015.30⟩. ⟨lirmm-01233104⟩
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. A generic methodology for building efficient prediction models in the context of alternate testing. IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177873⟩. ⟨lirmm-01233150⟩
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, et al.. Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW: Latin American Test Workshop, Mar 2014, Fortaleza, Brazil. ⟨10.1109/LATW.2014.6841930⟩. ⟨lirmm-01119361⟩
    • Mouhamadou Dieng, Florence Azaïs, Mariane Comte, Serge Bernard, Vincent Kerzérho, et al.. Study of adaptive tuning strategies for Near Field Communication (NFC) transmitter module. IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto ALegre, Brazil. ⟨10.1109/IMS3TW.2014.6997401⟩. ⟨lirmm-01119365⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Syhem Larguech, et al.. Investigations on alternate analog/RF test with model redundancy. STEM Workshop, May 2014, Paderborn, Germany. ⟨lirmm-01119374⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. New implementions of predictive alternate analog/RF test with augmented model redundancy. DATE: Design, Automation and Test in Europe, Mar 2014, Dresden, Germany. ⟨10.7873/DATE2014.144⟩. ⟨lirmm-00994714⟩
    • Vincent Kerzérho, Florence Azaïs, Mouhamadou Dieng, Mariane Comte, Serge Bernard, et al.. Self-Adaptive NFC Systems. IOLTS: International On-Line Testing Symposium, Jul 2014, Platja d'Aro, Spain. ⟨lirmm-01084355⟩
    • Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, et al.. Solutions for the self-adaptation of communicating systems in operation. IOLTS: International On-line Test Symposium, Jul 2014, Platja d’Aro, Spain. pp.234-239, ⟨10.1109/IOLTS.2014.6873705⟩. ⟨hal-01118068⟩
    • Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzérho, Mariane Comte, et al.. A Comparative Analysis of Indirect Measurement Selection Strategies for Analog/RF Alternate Testing. 3rd IEEE International Workshop on Test and Validation of High Speed Analog Circuits, Sep 2013, Anaheim, CA, United States. ⟨lirmm-00985422⟩
    • Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzérho, Florence Azaïs, et al.. Accurate and Efficient Analytical Electrical Model of Antenna for NFC Applications. NEWCAS: New Circuits and Systems, Jun 2013, Paris, France. pp.137-141, ⟨10.1109/NEWCAS.2013.6573657⟩. ⟨lirmm-00839190⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. On the use of redundancy to reduce prediction error in alternate analog/RF test. IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, May 2012, Taipei, Taiwan. pp.34-39, ⟨10.1109/IMS3TW.2012.17⟩. ⟨lirmm-00803556⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Making predictive analog/RF alternate test strategy independent of training set size. ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.9, ⟨10.1109/TEST.2012.6401560⟩. ⟨lirmm-00803564⟩
    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, et al.. Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.19-24, ⟨10.1109/VTS.2012.6231074⟩. ⟨lirmm-00803453⟩
    • Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Vincent Kerzérho, et al.. Adaptive LUT-Based System for In Situ ADC Auto-correction. IMS3TW'10: 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A. ⟨lirmm-00494424⟩
    • Vincent Kerzérho, Florence Azaïs, Mariane Comte, Philippe Cauvet, Serge Bernard, et al.. ANC-Based Method for Testing Converters with Random-Phase Harmonics. IMS3TW'10: 16th International Mixed-Signals, Sensors and Systems Test Workshop, La Grande Motte, Montpellier, France. pp.N/A. ⟨lirmm-00494578⟩
    • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. LH-BIST for Digital Correction of ADC Offset. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.199-203. ⟨lirmm-00375659⟩
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. A Multi-Converter DFT Technique for Complex SIP: Concepts and Validation. ECCTD: European Conference on Circuit Theory and Design, Aug 2009, Antalya, Turkey. pp.747-750. ⟨lirmm-00448863⟩
    • Philippe Cauvet, Serge Bernard, Michel Renovell. System-in-Package, a Combination of Challenges and Solutions. ETS: European Test Symposium, May 2007, Freiburg, Germany. pp.193-199. ⟨lirmm-00158123⟩
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, et al.. Fully-Efficient ADC Test Technique for ATE with Low Resolution Arbitrary Wave Generators. IMSTW'07: International Mixed-Signals Testing Workshop and 3rd International GHz/Gbps Test Workshop, Jun 2007, Povoa de Varzim, Portugal. pp.196-201. ⟨lirmm-00161708⟩
    • Vincent Kerzérho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, et al.. "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS: European Test Symposium, May 2007, Freiburg, Germany. pp.211-216, ⟨10.1109/ETS.2007.1⟩. ⟨lirmm-00158527⟩
    • Serge Bernard, Florence Azaïs, Philippe Cauvet, Mariane Comte, Vincent Kerzérho, et al.. Experimental Validation of the "Analogue Network of Converters" Technique to Test Complex SiP/SoC. IEEE International Mixed-Signal Testing Workshop, Jun 2006, Paris, France. pp.84-88. ⟨lirmm-00119266⟩
    • Serge Bernard, Michel Renovell. State of the art in soc testing: The analog challenge. DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2006, Tunis, Tunisia. ⟨lirmm-00407019⟩
    • Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Vincent Kerzérho, et al.. “Analogue Network of Converters”: A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS: European Test Symposium, May 2006, Southampton, United Kingdom. pp.159-164. ⟨lirmm-00115676⟩
    • Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. Fast and Fully-Efficient Test Flow for ADCs. IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.244-249. ⟨lirmm-00106523⟩
    • Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell. A New Methodology for ADC Test Flow Optimization. ITC: International Test Conference, Sep 2003, Charlotte, NC, United States. pp.201-209, ⟨10.1109/TEST.2003.1270841⟩. ⟨lirmm-00269527⟩
    • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. An Automatic Tool for Generation of ADC BIST Architecture. IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.79-84. ⟨lirmm-00269580⟩
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Analysis of the Specification Influence on the Efficiency of an Optimized Test Flow for ADCs. IMSTW: International Mixed-Signal Testing Workshop, Jun 2003, Sevilla, Spain. pp.185-190. ⟨lirmm-00269583⟩
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On the Efficiency of Measuring ADC Dynamic Parameters to Detect ADC Static Errors. LATW: Latin American Test Workshop, Feb 2003, Natal, Brazil. pp.198-203. ⟨lirmm-00269498⟩
    • Serge Bernard, Florence Azaïs, Mariane Comte, Yves Bertrand, Michel Renovell. Automatic Generation of LH-BIST Architecture for ADC Testing. IWADC'03: IEEE International Workshop on ADC Modelling and Testing, Sep 2003, Perugia, Italy. pp.7-12. ⟨lirmm-00269683⟩
    • Serge Bernard, Florence Azaïs, Yves Bertrand, Michel Renovell. A High Accuracy Triangle-Wave Signal Generator for On-Chip ADC Testing. ETW: European Test Workshop, 2002, Corfu, Greece. pp.89-94. ⟨lirmm-00268483⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On-Chip Generator of a Saw-Tooth Test Stimulus for ADC BIST. VLSI-SoC: Very Large Scale Integration of Systems-on-Chips, 2002, Montpellier, France. pp.425-436. ⟨lirmm-00268477⟩
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Mesure des Paramètres Statiques des Convertisseurs A/N par une Analyse Spectrale. Colloque du GDR CAO de Circuits et Systèmes Intégrés, May 2002, Paris, France. pp.47-50. ⟨lirmm-00269325⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, et al.. Estimating Static Parameters of A-to-D Converters from Spectral Analysis. LATW: Latin American Test Workshop, Feb 2002, Montevideo, Uruguay. pp.174-179. ⟨lirmm-00269320⟩
    • Mariane Comte, Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. On the Evaluation of ADC Static Parameters Through Dynamic Testing. ADDA & EWADC, Jun 2002, Prague, Czech Republic. pp.95-98. ⟨lirmm-00269338⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell. Evaluation of ADC Static Parameters via Frequency Domain. IMSTW'02: 8th IEEE International Mixed-Signal Testing Workshop, Jun 2002, Montreux, Switzerland. pp.165-169. ⟨lirmm-00269347⟩

    Poster communications1 document

    • Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzérho, et al.. Implementing model redundancy in predictive alternate test to improve test confidence. ETS: European Test Symposium, May 2013, Avignon, France. 18th IEEE European Test Symposium, 2013, ⟨10.1109/ETS.2013.6569386⟩. ⟨lirmm-00820077⟩

    Books1 document

    • Florence Azaïs, Serge Bernard, Yves Bertrand, Marie-Lise Flottes, Patrick Girard, et al.. Test de Circuits et de Systèmes Intégrés. Collection EGEM, Ed.Hermès, 2004, 2-7462-0864-4. ⟨lirmm-00109158⟩

    Book sections2 documents

    • Achraf Lamlih, Vincent Kerzérho, Serge Bernard, Fabien Soulier, Mariane Comte, et al.. Mixed-level simulation tool for design optimization of electrical impedance spectroscopy systems. Kanoun, Olfa. Impedance Spectroscopy
      Advanced Applications: Battery Research, Bioimpedance, System Design
      , Walter de Gruyter, pp.71-80, 2018, 9783110558920. ⟨10.1515/9783110558920-008⟩. ⟨lirmm-02007013⟩
    • Serge Bernard, Philippe Cauvet, Michel Renovell. SIP Test Architectures. Morgan Kaufmann Publishers. System-on-chip Test Architectures: Nanometer Design for Testability, Elsevier, pp.405-441, 2007, 978-0-12-373973-5. ⟨lirmm-00195243⟩

    Other publications14 documents

    • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Rapport Technique de fin d'année, Contrat TOETS CT 302, Programme CEE CATRENE. 2011. ⟨lirmm-00679022⟩
    • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Rapport Technique intermédiaire, Contrat TOETS CT 302, Programme CEE CATRENE. 2011. ⟨lirmm-00679018⟩
    • Patrick Girard, Serge Bernard, Florence Azaïs, Alberto Bosio, Luigi Dilillo, et al.. Contrat TOETS CT 302 - Programme CEE CATRENE (Rapport Intermédiaire). 2010. ⟨lirmm-00504873⟩
    • Patrick Girard, Florence Azaïs, Serge Bernard, Alberto Bosio, Luigi Dilillo, et al.. TOETS CT302 - Programme CEE CATRENE - Summary Technical Report 2S-2009 - Rapport Technique de Fin d'année. 2010. ⟨lirmm-00461745⟩
    • Patrick Girard, Serge Bernard, Alberto Bosio, Luigi Dilillo, Marie-Lise Flottes, et al.. Rapport Technique de fin de Contrat NanoTEST 2A702, Programme CEE MEDEA+. 2009. ⟨lirmm-00406974⟩
    • Patrick Girard, Serge Bernard, Alberto Bosio, Marie-Lise Flottes, Serge Pravossoudovitch, et al.. Contrat NanoTEST 2A702 - Programme CEE MEDEA - Rapport Technique intermédiaire. 2007. ⟨lirmm-00199966⟩
    • Patrick Girard, Serge Bernard, Alberto Bosio, Marie-Lise Flottes, Serge Pravossoudovitch, et al.. Contrat NanoTEST 2A702 - Programme CEE MEDEA - Rapport Technique de fin d'année. 2007. ⟨lirmm-00199958⟩
    • Patrick Girard, Serge Bernard, Marie-Lise Flottes, Christian Landrault, Serge Pravossoudovitch, et al.. Contrat NanoTEST 2A702 - Programme CEE MEDEA+. 2006. ⟨lirmm-00102699⟩
    • Patrick Girard, Serge Bernard, Marie-Lise Flottes, Christian Landrault, Serge Pravossoudovitch, et al.. Contrat NanoTEST 2A702, Programme CEE MEDEA +. 2006. ⟨lirmm-00130759⟩
    • Patrick Girard, Serge Bernard, Marie-Lise Flottes, Christian Landrault, Serge Pravossoudovitch, et al.. Contrat NanoTEST 2A702, Programme CEE MEDEA+. 2006. ⟨lirmm-00130758⟩
    • Patrick Girard, Michel Renovell, Serge Bernard, Marie-Lise Flottes, Serge Pravossoudovitch, et al.. Advanced Solutions for Innovative SOC Testing in Europe. 2004. ⟨lirmm-00109190⟩
    • Patrick Girard, Michel Renovell, Florence Azaïs, Serge Bernard, Marie-Lise Flottes, et al.. Advanced Solutions for Innovative SOC Testing in Europe, Contrat CEE ASSOCIATE A503, Programme MEDEA+ (Rapport Technique de Fin d'Année). 2003, pp.P nd. ⟨lirmm-00269749⟩
    • Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell. Mixed-Signal BISR. 2002. ⟨lirmm-00268607⟩
    • Patrick Girard, Florence Azaïs, Serge Bernard, Yves Bertrand, Marie-Lise Flottes, et al.. Advanced Solutions for Innovative SOC Testing in Europe. 2002. ⟨lirmm-00268586⟩

    Reports2 documents

    • Patrick Girard, Serge Bernard, Alberto Bosio, Marie-Lise Flottes, Serge Pravossoudovitch, et al.. Contrat Nano TEST 2A702, Programme CEE MEDEA (Rapport Intermédiaire). 08027, 2008. ⟨lirmm-00344415⟩
    • Patrick Girard, Serge Bernard, Alberto Bosio, Marie-Lise Flottes, Serge Pravossoudovitch, et al.. Contrat Nano TEST 2A702, Programme CEE MEDEA (Rapport Technique de fin d'année). 08026, 2008. ⟨lirmm-00344408⟩