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jean-marc-galliere

luigi-dilillo

	Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell , Luigi Dilillo DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229 Communication dans un congrès lirmm-00370798v1