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Martin HYTCH

7
Documents

Présentation

Dr Martin Hytch develops quantitative electron microscopy techniques for materials science applications. After carrying out his thesis at the University of Cambridge on the quantitative analysis of high-resolution images (HRTEM) of compound semiconductors in 1991, he moved to France to work at the CECM-CNRS in Paris, where he subsequently joined the CNRS in 1995. He is notably the inventor of the Geometric Phase Analysis (GPA) technique for the determination of strain from high-resolution images and has applied the technique to a wide range of materials problems and nanostructures. He moved to the CEMES-CNRS in Toulouse in 2004 to work on aberration-corrected HRTEM and electron holography. In 2007, he invented the new technique of dark-field electron holography for the measurement of strain and in 2008, he was recipient of the prestigious European Microscopy Award (FEI-EMA), awarded every 4 years at the European Microscopy Congress. Between 2009 and 2014, he headed the nanomaterials group at the CEMES (30 permanent staff). He has authored or coauthored over 130 scientific papers and given 70 invited talks at conferences and workshops.

Publications

marc-monthioux

In situ electron microscopy of hard and soft matter

Ludvig de Knoop , Florent Houdellier , Christophe Gatel , Aurélien Masseboeuf , Marc Monthioux
Joint XIII Interamerican Microscopy Congress & XVI Venezuelan Congress for Microscopy and Microanalysis 'CIASEM-2015', Oct 2015, Isla de Margarita, Venezuela
Communication dans un congrès hal-02123302v1

Development of TEM and SEM high brightness electron guns using cold field emission from a carbon nanotip

Florent Houdellier , Ludvig de Knoop , Christophe Gatel , Aurélien Masseboeuf , Shuichi Mamishin
PICO-2015, Apr 2015, Jülich, Netherlands
Communication dans un congrès hal-02123316v1

Synthesis and applications of individual carbon-nanotube-supported carbon nanocones

Marc Monthioux , Mathieu Delmas , Florent Houdellier , Thierry Ondarçuhu , Aurélien Masseboeuf
IEEE Nanotechnology Materials and Devices Conference, Oct 2014, Aci Castello, Italy
Communication dans un congrès hal-02123308v1