Réseaux sociaux

Mots-clés

Nombre de documents

71

Marise BAFLEUR


 

M. Bafleur received her Ph.D. degree and the State Doctorate degree in 1982 and 1987, respectively, from Paul Sabatier University, Toulouse, France. During her Ph.D. thesis, she worked on defect characterization of molecular beam epitaxy grown GaAs layers. Since 1983, she joined the Centre National de la Recherche Scientifique (CNRS) at the Laboratory of Analysis and Architecture of Systems (LAAS-CNRS) in Toulouse, France. From the mid eighties to 1994, she developed research activities in the emerging field of smart power IC's design and technologies. Since 1997, she has been leading at LAAS-CNRS a research activity in the field of Electrostatic Discharge (ESD) in CMOS and smart power technologies. From 2005 to 2012, she has been managing the “Integration of Systems for Energy Management” research group at LAAS-CNRS whose activities focus on the integration of advanced power devices, passive components and DC-DC converters, energy-autonomous wireless sensor networks as well as on providing integrated ESD protection solutions for advanced CMOS and smart power technologies. Since the end of 2014, she is leading “SYNERGY” strategic research at LAAS-CNRS dedicated to systems for smart energy management. Since 2007, she started research activities in the field of the energy autonomy of wireless sensors for aeronautics applications, in particular, within cooperative projects with AIRBUS Group. She is author and co-author of more than 240 articles in international journals and conferences and owns 7 patents.

 

Senior Member, IEEE N°40081234,
active since 1994

 


Article dans une revue25 documents

  • Romain Monthéard, Marise Bafleur, Vincent Boitier, Xavier Dollat, Nicolas Nolhier, et al.. Coupling Supercapacitors and Aeroacoustic Energy Harvesting for Autonomous Wireless Sensing in Aeronautics Applications. Energy Harvesting and Systems, DE GRUYTER, 2016, 3 (4), pp.265-276. <https://www.degruyter.com/view/j/ehs>. <10.1515/ehs-2016-0003>. <hal-01497529>
  • Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Impact of non-linear capacitances on transient waveforms during system level ESD stress. Microelectronics Reliability, Elsevier, 2016, Proceedings of the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 64, pp.88 - 92. <10.1016/j.microrel.2016.07.046>. <hal-01497515>
  • Claude Vanhecke, Laurent Assouère, Anqing Wang, Paul Durand-Estèbe, Fabrice Caignet, et al.. Multisource and Battery-free Energy Harvesting Architecture for Aeronautics Applications. Power Electronics, IEEE Transactions on, 2015, 30 (6), pp.3215-3227. <10.1109/TPEL.2014.2331365>. <hal-01020992v2>
  • Marise Bafleur, Philippe Perdu, François Marc, Hélène Frémont, Nicolas Nolhier. Editorial, Microelectronics Reliability, Volume 55, Issues 9–10, August–September 2015. Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.1269-1270. <10.1016/j.microrel.2015.09.028>. <hal-01257965>
  • Houssam Arbess, Marise Bafleur, David Trémouilles, Moustafa Zerarka. Optimization of a MOS–IGBT–SCR ESD protection component in smart power SOI technology. Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.1476-1480. <10.1016/j.microrel.2015.06.138>. <hal-01238569>
  • Paul Durand-Estèbe, Vincent Boitier, Marise Bafleur, Jean-Marie Dilhac, Sébastien Berhouet. Power supply for a wireless sensor network: Airliner flight test case study. Journal of Energy and Power Engineering, 2014, 8 (12), pp.2058-2064. <hal-01100084>
  • Jean-Marie Dilhac, Marise Bafleur. Energy harvesting in aeronautics for battery-free wireless sensor networks. Aerospace and Electronic Systems Magazine, IEEE, 2014, 29 (8), pp.18-22. <10.1109/MAES.2014.130002>. <hal-01064311>
  • Bertrand Courivaud, Nicolas Nolhier, G Ferru, Marise Bafleur, Fabrice Caignet. Reliability of ESD protection devices designed in a 3D technology. Microelectronics Reliability, Elsevier, 2014, Microelectronics Reliability, 54 (9), pp.2272-2277. <http://www.journals.elsevier.com/microelectronics-reliability>. <10.1016/j.microrel.2014.07.136>. <hal-01218702>
  • Jean-Marie Dilhac, Romain Monthéard, Marise Bafleur, Vincent Boitier, Nicolas Nolhier, et al.. Implementation of Thermoelectric Generators in Airliners for Powering,Battery-free Wireless Sensor Networks. Journal of Electronic Materials, Institute of Electrical and Electronics Engineers, 2014, 43 (6), pp.2444-2451. <hal-00998857>
  • Nicolas Monnereau, Fabrice Caignet, David Trémouilles, Nicolas Nolhier, Marise Bafleur. A System-Level Electrostatic-Discharge-Protection Modeling Methodology for Time-Domain Analysis. IEEE Transactions on Electromagnetic Compatibility, Institute of Electrical and Electronics Engineers, 2013, 55 (1), pp.45-57. <10.1109/TEMC.2012.2208973>. <hal-00941876>
  • Houssam Arbess, Marise Bafleur, David Trémouilles, Moustafa Zerarka. Combined MOS-IGBT-SCR structure for a compact high-robustness ESD power clamp in smart power SOI technology. IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2013, 14 (1), pp. 432-440. <10.1109/TDMR.2013.2281726>. <hal-00941891>
  • Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, Anqing Wang, Nicolas Mauran. On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress. Microelectronics Reliability, Elsevier, 2013, 53 (9-11), pp.1278-1283. <10.1016/j.microrel.2013.07.056>. <hal-00941840>
  • Marianne Diatta, David Trémouilles, Emilien Bouyssou, Marise Bafleur. Investigation on statistical tools to analyze repetitive-electrostatic-discharge endurance of system-level protections. IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2012, 12 (4), pp.607--614. <10.1109/TDMR.2012.2230093>. <hal-00787197>
  • Nicolas Monnereau, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, David Trémouilles. Investigation of Modeling System ESD Failure and Probability Using IBIS ESD Models. IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2012, 12 (4), pp.599-606. <10.1109/TDMR.2012.2218605>. <hal-00941823>
  • Marianne Diatta, David Trémouilles, Emilien Bouyssou, Raphaël Perdreau, Christine Anceau, et al.. Understanding the Failure Mechanisms of Protection Diodes During System Level ESD: Toward Repetitive Stresses Robustness. IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2012, 59 (1), pp.108 - 113. <10.1109/TED.2011.2173576>. <hal-00668818>
  • Marianne Diatta, Emilien Bouyssou, David Trémouilles, P. Martinez, F. Roqueta, et al.. Failure Mechanisms of Discrete Protection Device subjected to Repetitive ElectroStatic Discharges. Microelectronics Reliability, Elsevier, 2009, 49 (9-11), pp.1103-1106. <10.1016/j.microrel.2009.06.010>. <hal-00941812>
  • Lena Saint Macary, Myrtil Kahn, Claude Estournès, Pierre Fau, David Trémouilles, et al.. Size effects on varistor properties made from zinc oxide nanoparticles by low temperature spark plasma sintering. Advanced Functional Materials, Wiley, 2009, 19 (11), p.1775-1783. <hal-00383348>
  • Amaury Gendron, Philippe Renaud, Marise Bafleur, Nicolas Nolhier. Analytical description of the injection ratio of self-biased bipolar transistors under the very high injection conditions of ESD events. Solid-State Electronics, Elsevier, 2007, 52 (5), pp.663-674. <hal-00382960>
  • Fabien Essely, Nicolas Guitard, Frédéric Darracq, Vincent Pouget, Marise Bafleur, et al.. Optimizing pulsed OBIC technique for ESD defect localization. IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2007, 7 (4), pp.617-624. <hal-00382949>
  • Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, et al.. Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. Microelectronics Reliability, Elsevier, 2007, 47 (9-11), pp.1456-1461. <hal-00385697>
  • Christophe Salamero, Nicolas Nolhier, Amaury Gendron, Marise Bafleur, Patrice Besse, et al.. TCAD methodology for ESD robustness prediction of smart power ESD devices. IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers, 2006, 6 (3), pp.399-407. <hal-00195294>
  • Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Félix Beaudoin, et al.. Application of various optical techniques for ESD defect localization. Microelectronics Reliability, Elsevier, 2006, 46 (9-11), pp.1563-1568, 10.1016/j.microrel.2006.07.021. <10.1016/j.microrel.2006.07.021>. <hal-00204570>
  • Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, et al.. Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability, Elsevier, 2005, 45 (9), pp.1415-1420. <hal-00397706>
  • Géraldine Bertrand, Christelle Delage, Marise Bafleur, Nicolas Nolhier, Jean-Marie Dorkel, et al.. Analysis and Compact Modeling of a Vertical Grounded-Base NPN Bipolar Transistor used as ESD Protection in a Smart Power Technology. IEEE Journal of Solid-State Circuits, Institute of Electrical and Electronics Engineers, 2001, 36 (9), pp.1373-1381. <hal-00143927>
  • Marise Bafleur, A. Munoz-Yague. INFLUENCE DU PROCESSUS D'ELABORATION SUR LES DEFAUTS CRISTALLOGRAPHIQUES DANS LES COUCHES DE GaAs EPITAXIEES PAR JETS MOLECULAIRES. Journal de Physique Colloques, 1982, 43 (C5), pp.C5-465-C5-472. <10.1051/jphyscol:1982556>. <jpa-00222276>

Communication dans un congrès40 documents

  • Vincent Boitier, Marise Bafleur, Paul Durand-Estèbe, Jean-Marie Dilhac. Thermogeneration harvesting in an aeronautical application, from specification to realization. 7èmes Journées Nationales sur la Récupération et le Stockage d’Energie (JNRSE 2017), May 2017, Lyon, France. 2p., 2017, <https://jnrse-2017.sciencesconf.org/>. <hal-01546372>
  • A Álvarez, Marise Bafleur, Jean-Marie Dilhac, J Colomer, Daniela Dragomirescu, et al.. Self-Powered energy harvester strain sensing device for structural health monitoring. POWERMEMS, Dec 2016, Paris, France. Journal of Physics: Conference Series, 773, pp.12070 - 12070, 2016, 16th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS 2016). <www.powermems2016.org>. <10.1088/1742-6596/773/1/012070>. <hal-01497552>
  • Jean-Marie Dilhac, Marise Bafleur. Energy Harvesting for Sensor Networks in Aeronautics: True Lies?. 4th SENSO Conference, Nov 2016, Gardanne, France. 10p, 2016, <http://www.sensoconference.com/>. <hal-01497785>
  • Zheng Chew, Tingwen Ruan, Meiling Zhu, Marise Bafleur, Jean-Marie Dilhac. A multifunctional device as both strain sensor and energy harvester for structural health monitoring. IEEE SENSORS 2016, Oct 2016, Orlando, United States. IEEE SENSORS 2016, pp.1 - 3, 2016, <http://ieee-sensors2016.org/>. <10.1109/ICSENS.2016.7808554>. <hal-01502753>
  • Fabien Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. From quasi-static to transient system level ESD simulation: Extraction of turn-on elements. Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2016 38th, Sep 2016, Anaheim, United States. Proceedings of Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), pp.1 - 10, 2016, <https://www.esda.org/>. <10.1109/EOSESD.2016.7592563>. <hal-01387072>
  • Marise Bafleur, Jean-Marie Dilhac, Vincent Boitier. Coupling Ultracapacitors and Energy Harvesting for Autonomous Battery-Free Wireless Sensing in Aeronautics Applications. Energy Materials Nanotechnology Meeting on Batteries, Feb 2016, Orlando, FL, United States. 18p., 2016, <http://emnmeeting.org/>. <hal-01497565>
  • Firdaous El Mahboubi, Marise Bafleur, Vincent Boitier, A Alvarez, J Colomer, et al.. Self-Powered Adaptive Switched Architecture Storage. 16th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS 2016), Dec 2016, Paris, France. Journal of Physics: Conference Series, 773, pp.012103, 2016, 16th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS 2016). <10.1088/1742-6596/773/1/012103>. <hal-01497546>
  • Firdaous El Mahboubi, Marise Bafleur, Vincent Boitier, Jean-Marie Dilhac. Self-Adaptive Switched Architecture for Ultra-Capacitors Storage. Journées Nationales sur la Récupération et le Stockage d'Energie (JNRSE’2016) , May 2016, BORDEAUX, France. 4p., 2016, <https://jnrse2016.sciencesconf.org/>. <hal-01497557>
  • Paul Durand-Estèbe, Vincent Boitier, Marise Bafleur, Jean-Marie Dilhac. Thermoelectric Harvester to power SHM Sensors in Aircraft Pylon. 5èmes Journées Nationales sur la Récupération et le Stockage d’Énergie pour l'Alimentation des Microsystèmes Autonomes (JNRSE’2015), May 2015, Orsay, France. 2015. <hal-01239488>
  • Rémi Bèges, Fabrice Caignet, Patrice Besse, Jean-Philippe Laine, Alain Salles, et al.. TLP-based Human Metal Model stress generator and analysis method of ESD generators. Electrical Overstress / Electrostatic Discharge Symposium (EOS/ESD 2015), Sep 2015, Reno, United States. 2015, <10.1109/EOSESD.2015.7314777>. <hal-01239451>
  • Fabrice Caignet, Nicolas Nolhier, Marise Bafleur. Dynamic system level ESD current measurement using magnetic field probe. Asia-Pacific International Symposium on Electromagnetic Compatibility ( APEMC ), May 2015, Taipei, Taiwan. 2015, <10.1109/APEMC.2015.7175400>. <hal-01239444>
  • Paul Durand-Estèbe, Vincent Boitier, S Berhouet, B Labrousse, Marise Bafleur, et al.. Energy Harvesting for Wireless in Flight Testing on A321 Aircraft. More Electric Aircraft, Feb 2015, TOULOUSE, France. 2015. <hal-01238556>
  • Romain Monthéard, C Airiau, Marise Bafleur, Vincent Boitier, Jean-Marie Dilhac, et al.. Powering a Commercial Datalogger by Energy Harvesting from Generated Aeroacoustic Noise Powering a Commercial Datalogger by Energy Harvesting from Generated Aeroacoustic Noise. IOP Publishing. PowerMEMS 2014, Nov 2014, Awaji Island, Hyogo, Japan. Journal of Physics, 557, pp.12025, Conference Series. <10.1088/1742-6596/557/1/012025>. <hal-01092975>
  • Paul Durand-Estèbe, Vincent Boitier, Marise Bafleur, Jean-Marie Dilhac, S. Berhouet. Photovoltaic Power Supply for an Airliner Wireless Sensor Network. IDTechEx Energy Harvesting and Storage 2014, Apr 2014, Berlin, Germany. 2014. <hal-00991273>
  • Romain Monthéard, Marise Bafleur, Vincent Boitier, Jean-Marie Dilhac, Nicolas Nolhier, et al.. An aeroacoustic energy harvester for supplying power to embedded sensors in aircrafts. Quatrièmes Journées Nationales sur la Récupération et le Stockage d'Energie (JNRSE 2014), Apr 2014, ANNECY, France. <hal-01067808>
  • Marise Bafleur, Fabrice Caignet, Nicolas Nolhier, David Trémouilles. Tackling the challenges of System level ESD: from efficient ICs ESD protection to system level predictive modeling. Taiwan ESD and Reliability Conference, Nov 2013, Hsinchu, Taiwan. 2013. <hal-00957728>
  • David Trémouilles, Antoine Delmas, Nicolas Mauran, Nicolas Nolhier, Houssam Arbess, et al.. Transient-TLP (T-TLP): a simple method for accurate ESD protection transient behavior measurement. EOS/ESD Symposium, Sep 2013, LAS VEGAS, United States. pp.258-267, 2013. <hal-01056511>
  • Romain Monthéard, S. Carbonne, Marise Bafleur, Vincent Boitier, Jean-Marie Dilhac, et al.. Proof of concept of energy harvesting from aero acoustic noise. 12th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS 2012), Dec 2012, Atlanta, United States. pp. 267-270, 2012. <hal-00945046>
  • Fabrice Caignet, Nicolas Monnereau, Nicolas Nolhier, Marise Bafleur. Behavioral ESD Protection Modeling to perform System Level ESD Efficient Design. Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), May 2012, SINGAPORE, Singapore. pp.401-404, 2012. <hal-00722644>
  • Marise Bafleur. Energy and smart systems. EPOSS Annual Forum 2012, Sep 2012, PARIS, France. 2012. <hal-01056528>
  • Nicolas Monnereau, Fabrice Caignet, Nicolas Nolhier, David Trémouilles, Marise Bafleur. Behavioral-Modeling Methodology to Predict Electrostatic-Discharge Susceptibility Failures at System Level : an IBIS Improvement. Int. Symposium on Electromagnetic Compatibility (EMC Europe 2011), Sep 2011, YORK, United Kingdom. pp.457-463, 2011. <hal-00722643>
  • Houssam Arbess, David Trémouilles, Marise Bafleur. High-temperature operation MOS-IGBT power clamp for improved ESD protection in smart power technology. Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD 2011), Sep 2011, ANAHEIM, United States. pp.1B.2-1B.8, 2011. <hal-00722642>
  • Marise Bafleur. Introduction générale sur les EOS/ESD. Tutorial Décharges électrostatiques (ESD) : du composant au système, Dec 2010, TOULOUSE, France. <hal-01057804>
  • Antoine Delmas, Amaury Gendron, Marise Bafleur, Nicolas Nolhier, Chai Gill. Transient Voltage Overshoots of High Voltage ESD Protections Based on Bipolar Transistors in Smart Power Technology. Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), Oct 2010, AUSTIN, United States. pp.253-256, 2010. <hal-00722641>
  • Antoine Delmas, Nicolas Nolhier, David Trémouilles, Marise Bafleur, Nicolas Mauran, et al.. Accurate Transient Behavior Measurement of High- Voltage ESD Protections Based on a Very Fast Transmission-Line Pulse System. 31st Electrical Overstress/Electrostatic Discharge Symposium, 2009. EOS/ESD Symposium, Aug 2009, ANAHEIM, United States. pp.165-172, 2009. <hal-00445676>
  • Johan Bourgeat, Christophe Entringer, Philippe Galy, Pascal Fonteneau, Marise Bafleur. Local ESD protection structure based on Silicon Controlled Rectifier achieving very low overshoot voltage. 31st Electrical Overstress/Electrostatic Discharge Symposium, 2009. EOS/ESD 2009, Aug 2009, ANAHEIM, United States. pp.314-321, 2009. <hal-00445672>
  • Claude Vanhecke, Laurent Assouère, Marise Bafleur, Jean-Marie Dilhac, Carole Rossi. Convertisseur à faible consommation pour la récupération d'énergie ambiante combinant deux sources pour application aéronautique. 8ème journées d'étude Faible Tension Faible Consommation (FTFC 2009), Jun 2009, NEUCHATEL, Suisse. pp.80, 2009. <hal-00382788>
  • Jean-Marie Dilhac, Marise Bafleur, Jean-Yves Fourniols, Christophe Escriba, Robert Plana, et al.. Cross-functional design of wireless sensor networks applied to Aircraft Health Monitoring. Fu-Kuo Chang. International Workshop on Structural Health Monitoring, Sep 2009, Stanford, United States. DEStech publications, 1, pp.901-908, 2009. <hal-00419192>
  • Nicolas Bailly, Jean-Marie Dilhac, Christophe Escriba, Claude Vanhecke, Nicolas Mauran, et al.. ENERGY SCAVENGING BASED ON TRANSIENT THERMAL GRADIENTS: APPLICATION TO STRUCTURAL HEALTH MONITORING OF AIRCRAFTS. 8th International Workshop on Micro and Nanotechnology for Power Generation and Energy Conversion Applications (PowerMEMS 2008), Nov 2008, SENDAI, Japan. pp.205-208, 2008. <hal-00384129>
  • David Trémouilles, Yuan Gao, Marise Bafleur. Pushing away the silicon limits of ESD protection structures: exploration of crystallographic orientation. BIPOLAR/BiCMOS Circuits and Technology Meeting (BCTM), Oct 2008, Monterey, United States. pp.200-203, 2008. <hal-00383353>
  • Ali Alaeldine, Nicolas Lacrampe, Fabrice Caignet, Richard Perdriau, Marise Bafleur, et al.. Efficiency of Embedded On-Chip EMI Protections to Continuous Harmonic and Fast Transient Pulses with Respect to Substrate Injection. IEEE EMC 2007 International Symposium on Electromagnetic Compatibility, Jul 2007, Honolulu (Hawaii), United States. 2007. <hal-00239403>
  • Philippe Renaud, Amaury Gendron, Marise Bafleur, Nicolas Nolhier. High robustness PNP-based structure for the ESD protection of high voltage I/Os in an advanced smart power technology. Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), Oct 2007, BOSTON, United States. pp.359, 2007. <hal-00195362>
  • Nicolas Lacrampe, Ali Alaeldine, Fabrice Caignet, Richard Perdriau, Marise Bafleur, et al.. Investigation on ESD Transient Immunity of Integrated Circuit. IEEE EMC 2007 International Symposium on Electromagnetic Compatibility, Jul 2007, Honolulu (Hawaii), United States. 2007. <hal-00239408>
  • Fabien Essely, Nicolas Guitard, Frédéric Darracq, Vincent Pouget, Marise Bafleur, et al.. Optimizing pulsed OBIC technique for ESD defect localization. 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Jul 2006, Singapour, Singapore. IEEE, pp.270-275, 10.1109/IPFA.2006.251044, 2006, <10.1109/IPFA.2006.251044>. <hal-00204574>
  • Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Félix Beaudoin, et al.. Applications of various optical techniques for ESD defect localization. European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), 2006, wuppertal, Germany. pp.1563-1568, 2006. <hal-00401519>
  • F. Essely, Nicolas Guitard, F. Darracq, V. Pouget, Marise Bafleur, et al.. OBIC technique for ESD defect localization : Influence of the experimental procedure. 3th Workshop EOS/ESD/EMI, May 2006, Toulouse, France. pp.79-81, 2006. <hal-00327412>
  • Isabelle Bertrand, Vasanta Pathirana, Éric Imbernon, Florin Udrea, Marise Bafleur, et al.. New lateral DMOS and IGBT structures realized on a partial SOI substrate based on LEGO process. Bipolar/BiCMOS Circuits and Technology Meeting (BCTM2005), Oct 2005, Santa Barbara, United States. pp.74-77, 2005. <hal-00385958>
  • Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, et al.. Different failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. European Symposium on Reliability of Electron Devices, Failure Physics and analysis (ESREF), 2005, arcachon, France. pp.1415-1420, 2005. <hal-00401483>
  • Nicolas Guitard, David Trémouilles, Stéphane Alves, Marise Bafleur, Félix Beaudoin, et al.. ESD Induced Latent Defects In CMOS ICs And Reliability Impact. Electrical Overstress and Electrostatic Discharge (EOS/ESD) Symposium, Sep 2004, Dallas, United States. pp.174-181, 2004. <hal-00385694>
  • David Trémouilles, Géraldine Bertrand, Marise Bafleur, Nicolas Nolhier, Lionel Lescouzères. Design Guidelines to Achieve a Very High ESD Robustness in a Self-Biased NPN. Electrical Overstress and Electrostatic Discharge Symposium, Oct 2002, Charlotte, United States. pp.281-288, 2002. <hal-00383352>

Chapitre d'ouvrage1 document

  • Marise Bafleur, Fabrice Caignet, Nicolas Nolhier, Patrice Besse, Jean-­‐philippe Lainé. Protecting Mixed-­Signal Technologies Against Electrostatic Discharges: Challenges and Protection Strategies from Component to System. Thomas NOULIS. Mixed-signal circuits, CRC PRESS, 40p. Chapter 3, 2015, Devices, Circuits, and Systems Series, 9781482260625. <https://www.crcpress.com/>. <hal-01218627>

Direction d'ouvrage, Proceedings1 document

  • Philippe Perdu, François Marc, Marise Bafleur, Hélène Fremont, Nicolas Nolhier. Microelectronics Reliability Volume 55, Issues 9–10. France. Volume 55, ( Issues 9–10), 2015, Microelectronics Reliability. <hal-01257945>

Brevet2 documents

  • Xavier Lafontan, Vincent Boitier, Romain Monthéard, Marise Bafleur, Jean-Marie Dilhac. Circuit électronique de récupération, de stockage et de restitution d'énergie électrique et le procédé associé. France, N° de brevet: EP2624410. rapport LAAS n° 12036. 2013, pp.13. <hal-01008123>
  • Sylvie Roux, Jean-Marie Dilhac, Marise Bafleur, Georges Charitat, Irénée Pagès. Method to form a localized Silicon On Insulator structure. France, Patent n° : EP1193752. 2002, pp.10. <hal-00412522>

Autre publication2 documents

  • Marise Bafleur, Jean-Marie Dilhac. Réseaux de capteurs sans fil au Japon : aperçu du contexte industriel et dernières avancées présentées à la conférence PowerMEMS 2008. Rapport LAAS n° 10792. Rapport de mission n°SMM09_018 pour l'Ambassade de France au Japon. 2009, 17p. <hal-00412524>
  • Marise Bafleur, Laurent Clavier, Jean-Marie Dilhac. Un aperçu des réseaux de capteurs sans fil au Japon : de la gestion de l'énergie à l'architecture des réseaux. 08888. Rapport de mission n° SMM08_042 pour l'Ambassade de France au Japon. 2008. <hal-00412549>