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	Sensitivity to Laser Fault Injection: CMOS FD-SOI vs. CMOS bulk J.-M. Dutertre , Vincent Beroulle , Philippe Candelier , Stephan de Castro , Louis-Barthelemy Faber IEEE Transactions on Device and Materials Reliability, 2019, 19 (1), pp.6-15. ⟨10.1109/TDMR.2018.2886463⟩ Article dans une revue hal-01971932v1

	The case of using CMOS FD-SOI rather than CMOS bulk to harden ICs against laser attacks Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Louis-Barthelemy Faber , Marie-Lise Flottes IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d’Aro, Spain. pp.214-219, ⟨10.1109/IOLTS.2018.8474230⟩ Communication dans un congrès emse-01856000v1
	Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model Jean-Max Dutertre , Vincent Beroulle , Philippe Candelier , Stephan de Castro , Louis-Barthelemy Faber FDTC: Fault Diagnosis and Tolerance in Cryptography, Sep 2018, Amsterdam, Netherlands. pp.1-6, ⟨10.1109/FDTC.2018.00009⟩ Communication dans un congrès emse-01856008v1
	Laser-Induced Fault Effects in Security-Dedicated Circuits Vincent Beroulle , Philippe Candelier , Stephan de Castro , Giorgio Di Natale , Jean-Max Dutertre VLSI-SoC: Very Large Scale Integration and System-on-Chip, Oct 2014, Playa del Carmen, Mexico. pp.220-240, ⟨10.1007/978-3-319-25279-7_12⟩ Communication dans un congrès hal-01383737v1

Marie-Lise Flottes