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	An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects Nicolas Houarche , Mariane Comte , Michel Renovell , Alejandro Czutro , Piet Engelke VTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. pp.21-26, ⟨10.1109/VTS.2009.57⟩ Communication dans un congrès lirmm-00374941v1
	A Model for Resistive Open Recursivity in CMOS Random Logic Michel Renovell , Mariane Comte , Nicolas Houarche , Ilia Polian , Piet Engelke EWDTS: East-West Design & Test Symposium, Oct 2008, Lviv, Ukraine. pp.21-24 Communication dans un congrès lirmm-00381465v1
	Analysing the Memory Effect of Resistive Open in CMOS Random Logic Michel Renovell , Mariane Comte , Ilia Polian , Piet Engelke , Bernd Becker DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2006, Tunis, Tunisia. pp.251-256 Communication dans un congrès lirmm-00093383v1
	A Specific ATPG Technique for Resistive Open with Sequence Recursive Dependency Michel Renovell , Mariane Comte , Ilia Polian , Piet Engelke , Bernd Becker ATS: Asian Test Symposium, Nov 2006, Fukuoka, Japan. pp.273-278, ⟨10.1109/ATS.2006.261031⟩ Communication dans un congrès lirmm-00117022v1

Mariane Comte