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MC

Mariane Comte

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An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects

 Nicolas Houarche , Mariane Comte , Michel Renovell , Alejandro Czutro , Piet Engelke
VTS'09: 27th VLSI Test Symposium, May 2009, Santa Cruz, Californie, United States. pp.21-26, ⟨10.1109/VTS.2009.57⟩
Communication dans un congrès lirmm-00374941v1

A Model for Resistive Open Recursivity in CMOS Random Logic

 Michel Renovell , Mariane Comte , Nicolas Houarche , Ilia Polian , Piet Engelke
EWDTS: East-West Design & Test Symposium, Oct 2008, Lviv, Ukraine. pp.21-24
Communication dans un congrès lirmm-00381465v1

A Specific ATPG Technique for Resistive Open with Sequence Recursive Dependency

 Michel Renovell , Mariane Comte , Ilia Polian , Piet Engelke , Bernd Becker
ATS: Asian Test Symposium, Nov 2006, Fukuoka, Japan. pp.273-278, ⟨10.1109/ATS.2006.261031⟩
Communication dans un congrès lirmm-00117022v1