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Marc Legros

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stephane-lefebvre
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Mechanisms of power module source metal degradation during electro-thermal aging

Roberta Ruffilli , Mounira Berkani , Philippe Dupuy , Stéphane Lefebvre , Yann Weber
Microelectronics Reliability, 2017, 76-77, pp.507 - 511. ⟨10.1016/j.microrel.2017.06.086⟩
Article dans une revue hal-01575130v1
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In-depth investigation of metallization aging in power MOSFETs

Roberta Ruffilli , M Berkani , P Dupuy , Stéphane Lefebvre , Y Weber
Microelectronics Reliability, 2015, Proceedings of the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, SI:Proceedings of ESREF 2015, 55 (9-10), pp.1966-1970. ⟨10.1016/j.microrel.2015.06.036⟩
Article dans une revue hal-01700466v2