Roberta Ruffilli, M Berkani, P Dupuy, Stéphane Lefebvre, Y Weber, et al.. In-depth investigation of metallization aging in power MOSFETs.
Microelectronics Reliability, Elsevier, 2015, Proceedings of the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, SI:Proceedings of ESREF 2015, 55 (9-10), pp.1966-1970.
⟨10.1016/j.microrel.2015.06.036⟩.
⟨hal-01700466v2⟩