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Marc Lacruche
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marc-lacruche
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Electromagnetic Activity vs. Logical Activity: Near Field Scans for Reverse EngineeringCARDIS 2018 - 17th International Conference on Smart Card Research and Advanced Applications, Nov 2018, Montpellier, France. pp.140-155, ⟨10.1007/978-3-030-15462-2_10⟩
Communication dans un congrès
lirmm-01943151v1
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Body Biasing Injection Attacks in PracticeCS2: Cryptography and Security in Computing Systems, Jan 2016, Prague, Czech Republic. pp.49-54, ⟨10.1145/2858930.2858940⟩
Communication dans un congrès
lirmm-01434143v1
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On the Use of Forward Body Biasing to Decrease the Repeatability of Laser-Induced Faults2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2016, Dresde, Germany
Communication dans un congrès
emse-01855866v1
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Laser Fault Injection into SRAM cells: Picosecond versus Nanosecond pulsesOn-Line Testing Symposium (IOLTS), 2015 IEEE 21st International, Jul 2015, Halkidiki, France. ⟨10.1109/IOLTS.2015.7229820⟩
Communication dans un congrès
emse-01227286v1
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Laser-Induced Faults in SRAM Memory Cells: Experimental Results and Simulation-based AnalysisTRUDEVICE - WG Meetings, 2013, Dec 2013, Freiburg, Germany
Communication dans un congrès
emse-01110358v1
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