Nombre de documents

6

Publications of Marc Lacruche


Communication dans un congrès6 documents

  • Marc Lacruche, Philippe Maurine. Electromagnetic Activity vs. Logical Activity: Near Field Scans for Reverse Engineering. CARDIS: Smart Card Research and Advanced Applications, Nov 2018, Montpellier, France. 17th Smart Card Research and Advanced Application Conference, 2018, 〈https://cardis2018.sciencesconf.org〉. 〈lirmm-01943151〉
  • Marc Lacruche, Noemie Beringuier-Boher, Jean-Max Dutertre, Jean-Baptiste Rigaud, Edith Kussener. On the Use of Forward Body Biasing to Decrease the Repeatability of Laser-Induced Faults. PROCEEDINGS OF THE 2016 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2016, Unknown, Unknown Region. pp.547-550, 2016, Design, Automation, and Test in Europe Conference and Exhibition. 〈hal-01435098〉
  • Noemie Beringuier-Boher, Marc Lacruche, David El-Baze, Jean-Max Dutertre, Jean-Baptiste Rigaud, et al.. Body Biasing Injection Attacks in Practice . CS2: Cryptography and Security in Computing Systems, Jan 2016, Prague, Czech Republic. ACM, 3rd Workshop on Cryptography and Security in Computing Systems (CS2) in conjonction with 11th High Performance and Embedded Architecture and Compilation (HiPEAC) Conference., pp.49-54, 2016, 〈http://www.cs2.deib.polimi.it/main2016.html〉. 〈10.1145/2858930.2858940〉. 〈lirmm-01434143〉
  • Marc Lacruche, Noemie Beringuier-Boher, Jean-Max Dutertre, Jean-Baptiste Rigaud, Edith Kussener. On the Use of Forward Body Biasing to Decrease the Repeatability of Laser-Induced Faults. 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2016, Dresde, Germany. 〈emse-01855866〉
  • Marc Lacruche, Nicolas Borrel, Clément Champeix, C. Roscian, A. Sarafianos, et al.. Laser Fault Injection into SRAM cells: Picosecond versus Nanosecond pulses. On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International, Jul 2015, Halkidiki, France. 〈10.1109/IOLTS.2015.7229820〉. 〈emse-01227286〉
  • Jean-Max Dutertre, Cyril Roscian, Alexandre Sarafianos, Marc Lacruche. Laser-Induced Faults in SRAM Memory Cells: Experimental Results and Simulation-based Analysis. TRUDEVICE - WG Meetings, 2013, Dec 2013, Freiburg, Germany. 〈emse-01110358〉