Marc ALLAIN
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Extended-depth of field random illumination microscopy, EDF-RIM, provides super-resolved projective imaging2023
Pré-publication, Document de travail
hal-04269066v1
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Super-resolved total internal reflection fluorescence microscopy using random illuminationsOptica, 2023, 10 (8), pp.1009. ⟨10.1364/optica.487003⟩
Article dans une revue
hal-04172900v1
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