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	Pour les 96 documents Envoyer sur ORCID RSS ATOM Exporter BibTeX XML-TEI CSV RTF EndNote PDF HTML Export avancé	Page : Page précédente 1 2 3 4 Page suivante	triés par Pertinence Auteur A→Z Auteur Z→A Titre A→Z Titre Z→A Date de publication croissante Date de publication décroissante Date de dépôt croissante Date de dépôt décroissante

		28 nm UTBB FD-SOI technology for Silicon-based quantum dots and Cryo-CMOS electronics I. Kriekouki , Sophie Rochette , Claude Rohrbacher , J. Camirand Lemyre , Michel Pioro-Ladriere , et al. Silicon Quantum Electronics Workshop (SiQEW 2019), Oct 2019, San Sabastian, Spain Communication dans un congrès hal-03178723v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		On the use of causal feature selection in the context of machine-learning indirect test Manuel J. Barragan , G. Leger , F. Cilici , Estelle Lauga-Larroze , Sylvain Bourdel , et al. 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2019, Florence, France. pp.276-279 Communication dans un congrès hal-02231655v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times Haralampos-G. Stratigopoulos , Manuel J. Barragan , Salvador Mir , Hervé Le-Gall , Neha Bhargava , et al. IEEE International Test Conference (ITC 2015), Oct 2015, Anaheim, CA, United States. ⟨10.1109/TEST.2015.7342385⟩ Communication dans un congrès hal-01259637v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Filtre ultra compact à lignes à ondes lentes 3D en technologie BiCMOS à 29 GHz Olivier Occello , Marc Margalef-Rovira , Manuel J. Barragan , Cédric Durand , Philippe Ferrari 22èmes Journées Nationales Microondes, Jun 2022, Limoges, France Communication dans un congrès hal-03702506v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology H. Malloug , Manuel J. Barragan , Salvador Mir , L. Basteres , H. Le Gall European Test Symposium (ETS 2017), May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968214⟩ Communication dans un congrès hal-01702765v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Design of an on-chip stepwise ramp generator for ADC static BIST applications G. Renaud , Manuel J. Barragan , Salvador Mir IEEE International Mixed-Signal Testing Workshop (IMS3TW'15), Jun 2015, Paris, France. pp.1-6 Communication dans un congrès hal-01393841v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Evaluation of harmonic cancellation techniques for sinusoidal signal generation in mixed-signal BIST H. Malloug , Manuel J. Barragan , Salvador Mir IEEE International Mixed-Signal Testing Workshop (IMS3TW'15), Jun 2015, Paris, France Communication dans un congrès hal-01393842v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Analysis of an efficient on-chip servo-loop technique for reduced-code static linearity test of pipeline ADCs G. Renaud , Marc Margalef-Rovira , Manuel J. Barragan , Salvador Mir VLSI Test Symposium (VTS 2017), Apr 2017, Las Vegas, United States Communication dans un congrès hal-01702764v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Evaluation of digital ternary stimuli for dynamic test of ΣΔ ADCs M. Dubois , Haralampos-G Stratigopoulos , Salvador Mir , Manuel J. Barragan IFIP/IEEE 22nd International Conference on Very Large Scale Integration (VLSI-SoC'14), Oct 2014, Playa del Carmen, Mexico, Mexico. pp.1-6, ⟨10.1109/VLSI-SoC.2014.7004153⟩ Communication dans un congrès hal-01118108v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Analysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellation Ankush Mamgain , Manuel J. Barragan , Salvador Mir IEEE European Test Symposium (ETS 2021), May 2021, Bruges, Belgium. pp.1-6, ⟨10.1109/ETS50041.2021.9465424⟩ Communication dans un congrès hal-03371398v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Practical Simulation Flow for Evaluating Analog and Mixed-Signal Test Techniques Manuel J. Barragan , Haralampos-G. Stratigopoulos , Salvador Mir , Hervé Le-Gall , Neha Bhargava , et al. IEEE Design & Test, 2016, ⟨10.1109/MDAT.2016.2590985⟩ Article dans une revue hal-01359611v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Nonintrusive Machine Learning-Based Yield Recovery and Performance Recentering for mm-Wave Power Amplifiers: A Two-Stage Class-A Power Amplifier Case Study Florent Cilici , Marc Margalef-Rovira , Estelle Lauga-Larroze , Sylvain Bourdel , Gildas Leger , et al. IEEE Transactions on Microwave Theory and Techniques, 2023, pp.1-19. ⟨10.1109/TMTT.2023.3322750⟩ Article dans une revue hal-04253273v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Performance benchmark of State-of-the-art Sub-6-GHz wideband LNAs Based on an Extensive Survey Mohamed Khalil Bouchoucha , Mathieu Coustans , Manuel Barragan , Andreia Cathelin , Sylvain Bourdel IEEE International Symposium on Circuits and Systems (ISCAS 2023), May 2023, Monterey (CA), United States. ⟨10.1109/ISCAS46773.2023.10181964⟩ Communication dans un congrès hal-04171210v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Journal of Electronic Testing: Special Issue on Analog, Mixed-Signal, and RF Testing K. Huang , Manuel J. Barragan springer, 34, pp.213-370, 2018, ISSN: 0923-8174. ⟨10.1007/s10836-018-5731-z⟩ Ouvrages hal-01989750v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		A Procedure for Alternate Test Feature Design and Selection Manuel J. Barragan , G. Leger IEEE Design & Test, 2015, 32 (1), pp.18-25. ⟨10.1109/MDAT.2014.2361722⟩ Article dans une revue hal-01142581v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		On-Chip Implementation of an Integrator-Based Servo-Loop for ADC Static Linearity Test G. Renaud , Manuel J. Barragan , Salvador Mir 23rd IEEE Asian Test Symposium (ATS'14), Nov 2014, Hangzhou, China. pp.212-217, ⟨10.1109/ATS.2014.47⟩ Communication dans un congrès hal-01118116v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		ESD mm-wave-circuit protection: 3-dB couplers Marc Margalef-Rovira , Géraldine Pelletier , Vanessa Avramovic , Sylvie Lepilliet , Johan Bourgeat , et al. IEEE Transactions on Electron Devices, 2021, 68 (12), pp.5989-5994. ⟨10.1109/TED.2021.3115990⟩ Article dans une revue hal-03371300v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC Manuel J. Barragan , Rshdee Alhakim , Haralampos-G. Stratigopoulos , Matthieu Dubois , Salvador Mir , et al. IEEE Transactions on Circuits and Systems I: Regular Papers, 2016, ⟨10.1109/TCSI.2016.2602387⟩ Article dans une revue hal-01447789v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Interpretation of 28 nm FD-SOI quantum dot transport data taken at 1.4 K using 3D Quantum TCAD simulations Ioanna Kriekouki , Félix Beaudoin , Pericles Philippopoulos , Chenyi Zhou , Julien Camirand-Lemyre , et al. 8th Joint International EuroSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS 2022), May 2022, Udine, Italy. ⟨10.1016/j.sse.2022.108355⟩ Communication dans un congrès hal-03765899v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Why is systematic AMS-RF test not there yet ? G. Leger , Manuel J. Barragan CEDA 2017, Nov 2017, Barcelona, Spain Communication dans un congrès hal-01704467v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Feature selection and feature design for machine learning indirect test: a tutorial review Manuel J. Barragan , G. Leger International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019), Jul 2019, Lausanne, Switzerland. ⟨10.1109/SMACD.2019.8795292⟩ Communication dans un congrès hal-02165859v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Static linearity BIST for Vcm-based switching SAR ADCs using a reduced-code measurement technique R. Silveira Feitoza , Manuel J. Barragan , A. Gines , Salvador Mir 18th IEEE International NEWCAS Conference (NEWCAS 2020), Jun 2020, Montreal, Canada. ⟨10.1109/NEWCAS49341.2020.9159839⟩ Communication dans un congrès hal-02958196v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits F. Cilici , G. Leger , Manuel J. Barragan , Salvador Mir , Estelle Lauga-Larroze , et al. International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019), Jul 2019, Lausanne, Switzerland. pp.17-20, ⟨10.1109/SMACD.2019.8795238⟩ Communication dans un congrès hal-02166246v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		On-chip reduced-code static linearity test of Vcm -based switching SAR ADCs using an incremental analog-to-digital converter R. Silveira Feitoza , Manuel J. Barragan , A. Gines , Salvador Mir IEEE European Test Symposium (ETS 2020), May 2020, Tallinn, Estonia. ⟨10.1109/ETS48528.2020.9131588⟩ Communication dans un congrès hal-02899891v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times H. Stratigopoulos , Manuel J. Barragan , Salvador Mir , H. Le-Gall , N. Bhargava , et al. IEEE International Test Conference (ITC'15), Oct 2015, Anaheim, CA, United States Communication dans un congrès hal-01393838v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Efficient strategies for feature selection and discovery in machine-learning test applications Manuel J. Barragan , G. Leger Conference on Design of Circuits and Integrated Systems (DCIS'15), Nov 2015, Estoril, Portugal Communication dans un congrès hal-01445069v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Questioning the reliability of Monte Carlo simulation for machine learning test validation Gildas Leger , Manuel J. Barragan IEEE European Test Symposium, May 2016, Amsterdam, Netherlands Communication dans un congrès hal-01325116v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		An Oscillation-Based Test technique for on-chip testing of mm-wave phase shifters Marc Margalef-Rovira , Manuel J. Barragan , E. Sharma , Philippe Ferrari , Emmanuel Pistono , et al. IEEE 36th VLSI Test Symposium (VTS'2018), Apr 2018, San Francisco, United States. pp.1-6 Communication dans un congrès hal-01989149v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		Conception de déphaseurs RTPS faible consommation en bande millimétrique Marc Margalef-Rovira , Manuel J. Barragan , Emmanuel Pistono , Sylvain Bourdel , Philippe Ferrari 21èmes Journées Nationales Micro-ondes (JNM 2019), May 2019, Caen, France Communication dans un congrès hal-02129061v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More
		A sub-picosecond resolution jitter instrument for GHz frequencies based on a sub-sampling TDA Ankush Mamgain , Manasa Madhvaraj , Salvador Mir , Manuel Barragan , Jai Narayan Tripathi 21st IEEE Interregional NEWCAS Conference (NEWCAS 2023), Jun 2023, Edinburgh, United Kingdom. ⟨10.1109/NEWCAS57931.2023.10198132⟩ Communication dans un congrès hal-04188302v1	Envoyer sur ORCID Exporter BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite Export avancé Partager Gmail Facebook X LinkedIn More

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28 nm UTBB FD-SOI technology for Silicon-based quantum dots and Cryo-CMOS electronics

On the use of causal feature selection in the context of machine-learning indirect test

Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times

Filtre ultra compact à lignes à ondes lentes 3D en technologie BiCMOS à 29 GHz

Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology

Design of an on-chip stepwise ramp generator for ADC static BIST applications

Evaluation of harmonic cancellation techniques for sinusoidal signal generation in mixed-signal BIST

Analysis of an efficient on-chip servo-loop technique for reduced-code static linearity test of pipeline ADCs

Evaluation of digital ternary stimuli for dynamic test of ΣΔ ADCs

Analysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellation

Practical Simulation Flow for Evaluating Analog and Mixed-Signal Test Techniques

Nonintrusive Machine Learning-Based Yield Recovery and Performance Recentering for mm-Wave Power Amplifiers: A Two-Stage Class-A Power Amplifier Case Study

Performance benchmark of State-of-the-art Sub-6-GHz wideband LNAs Based on an Extensive Survey

Journal of Electronic Testing: Special Issue on Analog, Mixed-Signal, and RF Testing

A Procedure for Alternate Test Feature Design and Selection

On-Chip Implementation of an Integrator-Based Servo-Loop for ADC Static Linearity Test

ESD mm-wave-circuit protection: 3-dB couplers

A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC

Interpretation of 28 nm FD-SOI quantum dot transport data taken at 1.4 K using 3D Quantum TCAD simulations

Why is systematic AMS-RF test not there yet ?

Feature selection and feature design for machine learning indirect test: a tutorial review

Static linearity BIST for Vcm-based switching SAR ADCs using a reduced-code measurement technique

Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits

On-chip reduced-code static linearity test of Vcm -based switching SAR ADCs using an incremental analog-to-digital converter

Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times

Efficient strategies for feature selection and discovery in machine-learning test applications

Questioning the reliability of Monte Carlo simulation for machine learning test validation

An Oscillation-Based Test technique for on-chip testing of mm-wave phase shifters

Conception de déphaseurs RTPS faible consommation en bande millimétrique

A sub-picosecond resolution jitter instrument for GHz frequencies based on a sub-sampling TDA