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A Procedure for Alternate Test Feature Design and Selection

 Manuel J. Barragan , G. Leger
IEEE Design & Test, 2015, 32 (1), pp.18-25. ⟨10.1109/MDAT.2014.2361722⟩
Article dans une revue hal-01142581v1
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Performance benchmark of State-of-the-art Sub-6-GHz wideband LNAs Based on an Extensive Survey

 Mohamed Khalil Bouchoucha , Mathieu Coustans , Manuel Barragan , Andreia Cathelin , Sylvain Bourdel
IEEE International Symposium on Circuits and Systems (ISCAS 2023), May 2023, Monterey (CA), United States. ⟨10.1109/ISCAS46773.2023.10181964⟩
Communication dans un congrès hal-04171210v1
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Practical Simulation Flow for Evaluating Analog and Mixed-Signal Test Techniques

 Manuel J. Barragan , Haralampos-G. Stratigopoulos , Salvador Mir , Hervé Le-Gall , Neha Bhargava , et al.
IEEE Design & Test, 2016, ⟨10.1109/MDAT.2016.2590985⟩
Article dans une revue hal-01359611v1

On-Chip Implementation of an Integrator-Based Servo-Loop for ADC Static Linearity Test

 G. Renaud , Manuel J. Barragan , Salvador Mir
23rd IEEE Asian Test Symposium (ATS'14), Nov 2014, Hangzhou, China. pp.212-217, ⟨10.1109/ATS.2014.47⟩
Communication dans un congrès hal-01118116v1
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Nonintrusive Machine Learning-Based Yield Recovery and Performance Recentering for mm-Wave Power Amplifiers: A Two-Stage Class-A Power Amplifier Case Study

 Florent Cilici , Marc Margalef-Rovira , Estelle Lauga-Larroze , Sylvain Bourdel , Gildas Leger , et al.
IEEE Transactions on Microwave Theory and Techniques, 2023, pp.1-19. ⟨10.1109/TMTT.2023.3322750⟩
Article dans une revue hal-04253273v1
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Analysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellation

 Ankush Mamgain , Manuel J. Barragan , Salvador Mir
IEEE European Test Symposium (ETS 2021), May 2021, Bruges, Belgium. pp.1-6, ⟨10.1109/ETS50041.2021.9465424⟩
Communication dans un congrès hal-03371398v1

Journal of Electronic Testing: Special Issue on Analog, Mixed-Signal, and RF Testing

 K. Huang , Manuel J. Barragan
springer, 34, pp.213-370, 2018, ISSN: 0923-8174. ⟨10.1007/s10836-018-5731-z⟩
Ouvrages hal-01989750v1

28 nm UTBB FD-SOI technology for Silicon-based quantum dots and Cryo-CMOS electronics

 I. Kriekouki , Sophie Rochette , Claude Rohrbacher , J. Camirand Lemyre , Michel Pioro-Ladriere , et al.
Silicon Quantum Electronics Workshop (SiQEW 2019), Oct 2019, San Sabastian, Spain
Communication dans un congrès hal-03178723v1

On the use of causal feature selection in the context of machine-learning indirect test

 Manuel J. Barragan , G. Leger , F. Cilici , Estelle Lauga-Larroze , Sylvain Bourdel , et al.
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), Mar 2019, Florence, France. pp.276-279
Communication dans un congrès hal-02231655v1
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Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times

 Haralampos-G. Stratigopoulos , Manuel J. Barragan , Salvador Mir , Hervé Le-Gall , Neha Bhargava , et al.
IEEE International Test Conference (ITC 2015), Oct 2015, Anaheim, CA, United States. ⟨10.1109/TEST.2015.7342385⟩
Communication dans un congrès hal-01259637v1

Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology

 H. Malloug , Manuel J. Barragan , Salvador Mir , L. Basteres , H. Le Gall
European Test Symposium (ETS 2017), May 2017, Limassol, Cyprus. ⟨10.1109/ETS.2017.7968214⟩
Communication dans un congrès hal-01702765v1

Design of an on-chip stepwise ramp generator for ADC static BIST applications

 G. Renaud , Manuel J. Barragan , Salvador Mir
IEEE International Mixed-Signal Testing Workshop (IMS3TW'15), Jun 2015, Paris, France. pp.1-6
Communication dans un congrès hal-01393841v1

Evaluation of harmonic cancellation techniques for sinusoidal signal generation in mixed-signal BIST

 H. Malloug , Manuel J. Barragan , Salvador Mir
IEEE International Mixed-Signal Testing Workshop (IMS3TW'15), Jun 2015, Paris, France
Communication dans un congrès hal-01393842v1

Analysis of an efficient on-chip servo-loop technique for reduced-code static linearity test of pipeline ADCs

 G. Renaud , Marc Margalef-Rovira , Manuel J. Barragan , Salvador Mir
VLSI Test Symposium (VTS 2017), Apr 2017, Las Vegas, United States
Communication dans un congrès hal-01702764v1

Evaluation of digital ternary stimuli for dynamic test of ΣΔ ADCs

 M. Dubois , Haralampos-G Stratigopoulos , Salvador Mir , Manuel J. Barragan
IFIP/IEEE 22nd International Conference on Very Large Scale Integration (VLSI-SoC'14), Oct 2014, Playa del Carmen, Mexico, Mexico. pp.1-6, ⟨10.1109/VLSI-SoC.2014.7004153⟩
Communication dans un congrès hal-01118108v1

Filtre ultra compact à lignes à ondes lentes 3D en technologie BiCMOS à 29 GHz

 Olivier Occello , Marc Margalef-Rovira , Manuel J. Barragan , Cédric Durand , Philippe Ferrari
22èmes Journées Nationales Microondes, Jun 2022, Limoges, France
Communication dans un congrès hal-03702506v1
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Assisted test generation strategy for non-intrusive machine learning indirect test of millimeter-wave circuits

 F. Cilici , Manuel J. Barragan , Salvador Mir , Estelle Lauga-Larroze , Sylvain Bourdel
23rd IEEE European Test Symposium (ETS'2018), May 2018, Bremen, Germany. pp.1-6, ⟨10.1109/ETS.2018.8400689⟩
Communication dans un congrès hal-01922313v1
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Feature selection techniques for indirect test and statistical calibration of mm-wave integrated circuits

 Manuel Barragan , Gildas Leger , Florent Cilici , Estelle Lauga-Larroze , Salvador Mir , et al.
27th European Test Symposium (ETS 2022), May 2022, Barcelona, Spain
Communication dans un congrès hal-03759492v1
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A Non-Closed-Form Mathematical Model for Uniform and Non-Uniform Distributed Amplifiers

 Mohamad El Chaar , Antonio Augusto Lisboa de Souza , Manuel J. Barragan , Florence Podevin , Sylvain Bourdel
IEEE MTT-S International Conference on Microwaves for Intelligent Mobility (ICMIM 2020), Nov 2020, Linz, Austria
Communication dans un congrès hal-03166967v1

On the limits of machine learning-based test: a calibrated mixed-signal system case study

 Manuel J. Barragan , Gildas Leger , Gines Antonio , Peralias Eduardo , Rueda Adoracion
Proceedings of DATE 2017, Mar 2017, Lausanne, Switzerland
Communication dans un congrès hal-01432807v1

Reduced-code static linearity test of SAR ADCs using a built-in incremental Sigma-Delta converter

 R. Silveira Feitoza , Manuel J. Barragan , Salvador Mir , Daniel Dzahini
24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS'2018), Jul 2018, Platja d'Aro, Spain. pp.29-34
Communication dans un congrès hal-01922304v1
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Special session: Hot topics: Statistical test methods

 Manuel J. Barragan , Gildas Leger , Florence Azaïs , R. D. Blanton , Adit D. Singh , et al.
VTS: VLSI Test Symposium, Apr 2015, Napa, CA, United States. ⟨10.1109/VTS.2015.7116265⟩
Communication dans un congrès hal-01177043v1
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On-chip calibration for high-speed harmonic cancellation-based sinusoidal signal generators

 Ankush Mamgain , Salvador Mir , Jai Narayan Tripathi , Manuel Barragan
IEEE 31st Asian Test Symposium (ATS 2022), Nov 2022, Taichung City, Taiwan. ⟨10.1109/ATS56056.2022.00020⟩
Communication dans un congrès hal-04023652v1

Conception en vue du test d’un amplificateur de puissance à 60 GHz

 F. Cilici , Manuel J. Barragan , Estelle Lauga-Larroze , Sylvain Bourdel , Salvador Mir
Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM'17), Nov 2017, Strasbourg, France
Communication dans un congrès hal-01649564v1
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Mm-wave single-pole double-throw switches: HBT-vs MOSFET-based designs

 Marc Margalef-Rovira , Christophe Gaquière , Antonio Augusto Lisboa de Souza , L. Vincent , Manuel J. Barragan , et al.
19th IEEE International New Circuits and Systems Conference, NEWCAS 2021, Jun 2021, Toulon, France. ⟨10.1109/NEWCAS50681.2021.9462753⟩
Communication dans un congrès hal-03362262v1
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A wideband sub-6GHz continuously tunable gm-boosted CG Low Noise Amplifier in 28 nm FD-SOI CMOS technology

 Mohamed Khalil Bouchoucha , Manuel Barragan , Andreia Cathelin , Sylvain Bourdel
IEEE 49th European Solid State Circuits Conference (ESSCIRC 2023), Sep 2023, Lisbon, Portugal. ⟨10.1109/ESSCIRC59616.2023.10268734⟩
Communication dans un congrès hal-04241250v1
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A 5-DC-parameter MOSFET model for circuit simulation in QucsStudio and SPECTRE

 Deni Germano Alves Neto , Cristina Missel Adotnes , Gabriel Maranhão , Mohamed Khalil Bouchoucha , Manuel Barragan , et al.
21st IEEE Interregional NEWCAS Conference (NEWCAS 2023), Jun 2023, Edinburgh, United Kingdom. ⟨10.1109/NEWCAS57931.2023.10198173⟩
Communication dans un congrès hal-04188231v1
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Simulation process flow for the implementation of industry-standard FD-SOI quantum dot devices

 Ioanna Kriekouki , Pericles Philippopoulos , Félix Beaudoin , Salvador Mir , Manuel Barragan , et al.
Solid-State Electronics, 2023, 209, pp.Article 108777. ⟨10.1016/j.sse.2023.108777⟩
Article dans une revue hal-04221597v1

Static linearity test of SAR ADCs using an embedded incremental Σ∆ converter

 R. Silveira Feitoza , Manuel J. Barragan , Daniel Dzahini , Salvador Mir
Journées Nationales du Réseau Doctoral en Micro-nanoélectronique (JNRDM 2019), Jun 2019, Montpellier, France
Communication dans un congrès hal-02193107v1

Mostly-digital design of sinusoidal signal generators for mixed-signal BIST applications using harmonic cancellation

 H. Malloug , Manuel J. Barragan , Salvador Mir , H. Le-Gall
IEEE 21st International Mixed-Signal Testing Workshop (IMSTW'16), Jul 2016, Sant Feliu de Guixols, Spain
Communication dans un congrès hal-01445084v1
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