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LD
Luigi Dilillo
307
Documents
Identifiants chercheurs
- luigi-dilillo
- IdRef : 18891885X
- 0000-0002-1295-2688
Présentation
Publications
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Implementation and Reliability Evaluation of a RISC-V Vector Extension UnitDFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313569⟩
Communication dans un congrès
hal-04266888v1
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Hybrid Radiation Hardening Approach: a RISC-V System-on-Chip case studyG-RADNEXT Workshop, Nov 2023, Geneva, Switzerland
Communication dans un congrès
hal-04296178v1
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Radiation-induced SEL in a COTS SRAM memory - test and flight dataTEC-QEC Final Presentation Days, Jun 2023, Noordwijk, Netherlands
Communication dans un congrès
hal-04295893v1
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CRATEBO: A High-speed, Radiation-Tolerant and Versatile Testing Platform for FPGA Radiation Qualification for High-Energy Particle Accelerator applicationsTWEPP 2023 Topical Workshop on Electronics for Particle Physics, Oct 2023, Geremeas, Italy
Communication dans un congrès
hal-04122431v1
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Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space EnvironmentsDFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313549⟩
Communication dans un congrès
hal-04266887v1
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Hardening a Real-Time Operating System for a Dependable RISC-V System-on-ChipDFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313566⟩
Communication dans un congrès
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A Low-Cost Hardware Accelerator for CCSDS 123 Lossless Hyperspectral Image CompressionDFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313567⟩
Communication dans un congrès
hal-04266881v1
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Objectives and outcomes of WP6 in the second year of RADNEXT: Methodologies for Radiation Test of SystemsRADNEXT 2nd Annual Meeting, May 2023, Seville, Spain
Communication dans un congrès
hal-04296158v1
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Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-VRADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès
hal-04266897v1
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Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-ChipRADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès
hal-04266891v1
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Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh EnvironmentsIWASI 2023 - 9th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2023, Bari, Italy. pp.227-232, ⟨10.1109/IWASI58316.2023.10164578⟩
Communication dans un congrès
hal-04266899v1
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Enhancement of System Observability During System-Level Radiation Testing through Total Current Consumption Monitoring2023 European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès
hal-04266900v1
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Objectives and outcomes of WP6 in the first year of RADNEXT Methodologies for Radiation test of SystemsRADNEXT DAYS 2022 - 1st Annual Meeting, Jun 2022, Geneva, Switzerland
Communication dans un congrès
hal-04295913v1
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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-ChipDFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩
Communication dans un congrès
lirmm-03833983v1
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Qualification methodology for Radio Frequency Integrated Circuit for wireless-based platforms in radiation environmentsRADECS 2022 - European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy
Communication dans un congrès
hal-04124165v1
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Impact of Atmospheric and Space Radiation on Sensitive Electronic DevicesETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-10, ⟨10.1109/ets54262.2022.9810454⟩
Communication dans un congrès
lirmm-03833958v1
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Effects of High-Energy Protons on a Self-Refresh DRAMSELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects, May 2022, Virtual Event, Italy
Communication dans un congrès
lirmm-03832662v1
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Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural NetworksLATS 2021 - IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩
Communication dans un congrès
lirmm-03435567v1
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Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip RouterDTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505053⟩
Communication dans un congrès
lirmm-03358975v1
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A Model-Based Framework to Assess the Reliability of Safety-Critical ApplicationsDDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩
Communication dans un congrès
hal-03266848v1
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Characterization of a RISC-V System-on-Chip under Neutron RadiationDTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩
Communication dans un congrès
lirmm-03357515v1
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Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative StudyDTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
Communication dans un congrès
lirmm-03357444v1
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Effects of Thermal Neutron Irradiation on a Self-Refresh DRAMDTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩
Communication dans un congrès
lirmm-03025721v1
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A Low-Cost Fault-Tolerant RISC-V Processor for Space SystemsDTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩
Communication dans un congrès
lirmm-03026132v1
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On-board Compressing of Hyperspectral Images using CCSDS 123Computer on the Beach, Sep 2020, Balneário Camboriú, Brazil. pp.332-336, ⟨10.14210/cotb.v11n1.p332-336⟩
Communication dans un congrès
lirmm-03025767v1
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Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian EnvironmentNSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference, Nov 2020, Santa Fe (virtual), United States
Communication dans un congrès
lirmm-03028881v1
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Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing SystemsDFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩
Communication dans un congrès
lirmm-03025736v1
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Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND FlashRADECS 2019 - 30th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France
Communication dans un congrès
lirmm-03358989v1
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Analyzing the Error Propagation in a Parameterizable Network-on-Chip RouterLATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704580⟩
Communication dans un congrès
lirmm-02008414v1
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A Fault-Tolerant Reconfigurable Platform for Communication Modules of SatellitesLATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704551⟩
Communication dans un congrès
lirmm-02008436v1
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Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash MemoryDFT 2019 - 32th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2019, Noordwijk, Netherlands. pp.1-6, ⟨10.1109/DFT.2019.8875475⟩
Communication dans un congrès
lirmm-03025660v1
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COTS Optocoupler radiation qualification process for LHC applications based on mixed-energy neutron irradiationsRADECS 2019 - 30th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France
Communication dans un congrès
hal-03363644v1
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Characterization of a RISC-V Microcontroller Through Fault InjectionAPPLEPIES 2019 - International Conference on Applications in Electronics Pervading Industry, Environment and Society, Sep 2019, Pisa, Italy. pp.91-101, ⟨10.1007/978-3-030-37277-4_11⟩
Communication dans un congrès
lirmm-03025657v1
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Stuck and Weakened Bits in SDRAM from a Heavy-Ion MicrobeamRADECS 2019 - 30th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France
Communication dans un congrès
lirmm-03359010v1
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Design and Implementation of a Flexible Interface for TID DetectorIWASI 2019 - 8th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2019, Otranto, Italy. pp.158-162, ⟨10.1109/IWASI.2019.8791299⟩
Communication dans un congrès
lirmm-02415559v1
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Study of the Impact of the LHC Radiation Environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic ComponentsRADECS: Radiation Effects on Components and Systems, Sep 2018, Göteborg, Sweden
Communication dans un congrès
lirmm-02008384v1
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Enabling deep-space CubeSat missions through state-of-the-art radiation-hardened technologies3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil
Communication dans un congrès
lirmm-02008460v1
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Implementation of fault tolerance techniques for integrated network interfaces3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil
Communication dans un congrès
lirmm-02008453v1
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Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cellsDTIS 2018 - 13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, LIRMM, Apr 2018, Taormina, Italy. ⟨10.1109/DTIS.2018.8368578⟩
Communication dans un congrès
lirmm-02008214v1
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Refresh frequency reduction of data stored in SSDs based on A-timer and timestampsETS 2017 - 22nd IEEE European Test Symposium, May 2017, Limassol, Cyprus. pp.7968233, ⟨10.1109/ETS.2017.7968233⟩
Communication dans un congrès
lirmm-01687675v1
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Improvement of the tolerated raw bit-error rate in NAND Flash-based SSDs with the help of embedded statisticsITC 2017 - 48th International Test Conference, Oct 2017, Fort Worth, United States. ⟨10.1109/TEST.2017.8242066⟩
Communication dans un congrès
lirmm-01582185v1
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A calculation method to estimate single event upset cross sectionESREF 2017 - 28th European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France. pp.644-649, ⟨10.1016/j.microrel.2017.07.056⟩
Communication dans un congrès
hal-01929212v1
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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access MemoryRADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland
Communication dans un congrès
hal-01929267v1
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Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAMRADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany
Communication dans un congrès
lirmm-01337405v1
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The Power Law Shape of Heavy Ions Experimental Cross SectionNSREC: Nuclear and Space Radiation Effects Conference, IEEE NPSS (Nuclear & Plasma Sciences Society ), Jul 2016, Portland, United States
Communication dans un congrès
lirmm-01298421v1
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Design of a Radiation Tolerant System for Total Ionizing Dose Monitoring Using Floating Gate and RadFET DosimetersTWEPP: Topical Workshop on Electronics for Particle Physics, Sep 2016, Karlsruhe, Germany
Communication dans un congrès
lirmm-01382578v1
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An effective BIST architecture for power-gating mechanisms in low-power SRAMsISQED 2016 - 17th International Symposium on Quality Electronic Design, Mar 2016, Santa Clara, CA, United States. pp.185-191, ⟨10.1109/ISQED.2016.7479198⟩
Communication dans un congrès
lirmm-01457424v1
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Muon effects on SRAMsRADSOL: Electronique et rayonnements naturels au niveau du sol, CNRS - GDR ERRATA, Jun 2016, Paris, France
Communication dans un congrès
lirmm-01382532v1
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MTCube project: COTS memory SEE ground-test results and in-orbit error rate prediction4S: Small Satellites Systems and Services Symposium, Centre national d'études spatiales (CNES); European Space Agency (ESA), May 2016, La Valletta, Malta
Communication dans un congrès
lirmm-01298423v1
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Real-Time SRAM Based Particle DetectorIWASI: International Workshop on Advances in Sensors and Interfaces, Politecnico di Bari, Jun 2015, Gallipoli, Italy. pp.58-62, ⟨10.1109/IWASI.2015.7184968⟩
Communication dans un congrès
lirmm-01238435v1
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Exploring the impact of functional test programs re-used for power-aware testingDATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.1277-1280, ⟨10.7873/DATE.2015.1031⟩
Communication dans un congrès
lirmm-01272937v1
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Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMsNSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩
Communication dans un congrès
hal-01932433v1
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Heavy-ion radiation impact on a 4Mb FRAM under Different Test ConditionsRADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365617⟩
Communication dans un congrès
lirmm-01238392v1
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Impact of Stacked-Layer Structure on SEE Rate of SRAMsNSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States
Communication dans un congrès
lirmm-01238384v1
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Generic Analytic Expression of Heavy Ion SEU Cross Section Derived from Monte-Carlo Diffusion-Based Prediction CodeNSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States
Communication dans un congrès
lirmm-01238388v1
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Design-for-Diagnosis Architecture for Power SwitchesDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.43-48, ⟨10.1109/DDECS.2015.18⟩
Communication dans un congrès
lirmm-01272684v1
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A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and SlicingRADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩
Communication dans un congrès
lirmm-01238397v1
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An effective hybrid fault-tolerant architecture for pipelined coresETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138733⟩
Communication dans un congrès
lirmm-01272730v1
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An effective ATPG flow for Gate Delay FaultsDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127350⟩
Communication dans un congrès
lirmm-01272719v1
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Proton-Induced SDRAM Cell DegradationRADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365650⟩
Communication dans un congrès
lirmm-01238408v1
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An ATPG Flow to Generate Crosstalk-Aware Path Delay PatternISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.515-520, ⟨10.1109/ISVLSI.2015.99⟩
Communication dans un congrès
lirmm-01272933v1
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Scan-chain intra-cell defects gradingDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127349⟩
Communication dans un congrès
lirmm-01272696v1
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Methods for radiation test of memoriesRADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS), Jun 2015, Paris, France
Communication dans un congrès
lirmm-01238437v1
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Single Event Upset Prediction from Heavy Ions Cross Sections with No ParametersNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
lirmm-01237668v1
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Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounceDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.207-212, ⟨10.1109/DDECS.2014.6868791⟩
Communication dans un congrès
lirmm-01248599v1
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Protecting combinational logic in pipelined microprocessor cores against transient and permanent faultsDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.223-225, ⟨10.1109/DDECS.2014.6868794⟩
Communication dans un congrès
lirmm-01248598v1
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SEU Cross Section Calculation Based on Experimental Data of Another kind of ParticleNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
hal-01934616v1
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Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal considerationASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549, ⟨10.1109/ASPDAC.2014.6742948⟩
Communication dans un congrès
lirmm-01248596v1
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Test of 90nm SRAMs at Concordia Station in AntarcticaRADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS); Institut Carnot STAR (Marseille), Jun 2014, Paris, France
Communication dans un congrès
lirmm-01238438v1
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A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply NoiseISVLSI: International Symposium on Very Large Scale Integration, Jul 2014, Tampa, FL, United States. pp.226-231, ⟨10.1109/ISVLSI.2014.42⟩
Communication dans un congrès
lirmm-01248592v1
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Test and diagnosis of power switchesDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.213-218, ⟨10.1109/DDECS.2014.6868792⟩
Communication dans un congrès
lirmm-01248590v1
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Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo SimulationNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
lirmm-01237717v1
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On the Generation of Diagnostic Test Set for Intra-cell DefectsATS: Asian Test Symposium, Nov 2014, Hangzhou, China. pp.312-317, ⟨10.1109/ATS.2014.57⟩
Communication dans un congrès
lirmm-01272539v1
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Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory ComponentsPhysics Days, Finnish Physical Society, Tampere University of Technology (TUT), and Tavicon Ltd., Mar 2014, Tampere, Finland
Communication dans un congrès
lirmm-01238439v1
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An intra-cell defect grading toolDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.298-301, ⟨10.1109/DDECS.2014.6868814⟩
Communication dans un congrès
lirmm-01248591v1
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Timing-aware ATPG for critical paths with multiple TSVsDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.116-121, ⟨10.1109/DDECS.2014.6868774⟩
Communication dans un congrès
lirmm-01248600v1
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Radiation Study of a 4Mbit Ferroelectric RAM for Space ApplicationsSEE: Single Event Effects, Aeroflex Corporation, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University, May 2014, San Diego, United States
Communication dans un congrès
lirmm-01297441v1
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Real-Time Testing of 90nm COTS SRAMs at Concordia Station in AntarcticaNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
lirmm-01237709v1
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iBoX — Jitter based Power Supply Noise sensorETS: European Test Symposium, May 2014, Paderborn, United States. ⟨10.1109/ETS.2014.6847830⟩
Communication dans un congrès
lirmm-01248601v1
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Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion IrradiationNSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès
lirmm-01237660v1
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A Comprehensive Evaluation of Functional Programs for Power-Aware TestNATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, ⟨10.1109/NATW.2014.23⟩
Communication dans un congrès
lirmm-01248597v1
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TSV aware timing analysis and diagnosis in paths with multiple TSVsVTS: VLSI Test Symposium, Apr 2014, Napa, CA, United States. ⟨10.1109/VTS.2014.6818772⟩
Communication dans un congrès
lirmm-01248594v1
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Presentation of the MTCube CubeSat Project4S Symposium 2014 - Small Satellites Systems and Services, European Space Agency (ESA); Centre National d'Etudes Spatiales (CNES), May 2014, Majorca, Spain
Communication dans un congrès
lirmm-01272951v1
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Performance Characterization of TAS-MRAM Architectures in Presence of Capacitive DefectsVALID: Advances in System Testing and Validation Lifecycle, Oct 2013, Venice, Italy. pp.39-44
Communication dans un congrès
lirmm-01433308v1
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Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation EnvironmentsIWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2013, Bari, Italy. pp.75-80, ⟨10.1109/IWASI.2013.6576070⟩
Communication dans un congrès
lirmm-00839046v1
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Analyzing resistive-open defects in SRAM core-cell under the effect of process variabilityETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569373⟩
Communication dans un congrès
lirmm-01921630v1
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Improving Defect Localization Accuracy by means of Effect-Cause Intra-Cell Diagnosis at Transistor LevelSDD: Silicon Debug and Diagnosis, Sep 2013, Anaheim, CA, United States
Communication dans un congrès
lirmm-00806872v1
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Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failuresDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2013, Abu Dhabi, United Arab Emirates. pp.39-44, ⟨10.1109/DTIS.2013.6527775⟩
Communication dans un congrès
lirmm-01248603v1
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SEU Monitoring in Mixed-Field Radiation Environments of Particle AcceleratorsRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937419⟩
Communication dans un congrès
lirmm-00839085v1
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Worst-Case Power Supply Noise and Temperature Distribution Analysis for 3D PDNs with Multiple Clock DomainsNEWCAS: New Circuits and Systems, Jun 2013, Paris, France. ⟨10.1109/NEWCAS.2013.6573628⟩
Communication dans un congrès
lirmm-00839042v1
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Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic ModeRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937429⟩
Communication dans un congrès
lirmm-00839062v1
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Effect-Cause Intra-Cell Diagnosis at Transistor LevelISQED 2013 - 14th International Symposium on Quality Electronic Design, Mar 2013, Santa Clara, CA, United States. pp.460-467, ⟨10.1109/ISQED.2013.6523652⟩
Communication dans un congrès
lirmm-00817224v1
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Fast and Accurate Electro-Thermal Analysis of Three-Dimensional Power Delivery NetworksEuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2013, Wroclaw, Poland. pp.1-4, ⟨10.1109/EuroSimE.2013.6529956⟩
Communication dans un congrès
lirmm-00839043v1
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Temperature Impact on the Neutron SER of a Commercial 90nm SRAMNSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4
Communication dans un congrès
lirmm-00805291v1
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Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBTRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937428⟩
Communication dans un congrès
lirmm-01237617v1
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On the Reuse of Read and Write Assist Circuits to Improve Test Efficiency in Low-Power SRAMsITC: International Test conference, Sep 2013, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2013.6651927⟩
Communication dans un congrès
lirmm-00818977v1
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A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMsVTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, ⟨10.1109/VTS.2013.6548894⟩
Communication dans un congrès
lirmm-00805366v1
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Computing Detection Probability of Delay Defects in Signal Line TSVsETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569349⟩
Communication dans un congrès
lirmm-00839044v1
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An Integrated Solid Detector For Onboard Detection Of Natural Radiations In AtmosphereiWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL synchrotron, Jun 2013, Paris, France
Communication dans un congrès
lirmm-01238432v1
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Test Solution for Data Retention Faults in Low-Power SRAMsDATE 2013 - 16th Design, Automation and Test in Europe Conference, Mar 2013, Grenoble, France. pp.442-447, ⟨10.7873/DATE.2013.099⟩
Communication dans un congrès
lirmm-00805140v1
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Comparison of the transient current shapes obtained with the diffusion model and the double exponential law — Impact on the SERRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937441⟩
Communication dans un congrès
lirmm-01237599v1
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A novel method to mitigate TSV electromigration for 3D ICsISVLSI: IEEE Computer Society Annual Symposium on VLSI, Aug 2013, Natal, Brazil. pp.121-126, ⟨10.1109/ISVLSI.2013.6654633⟩
Communication dans un congrès
lirmm-01248617v1
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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cellDFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩
Communication dans un congrès
lirmm-01238413v1
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Evaluating An SEU Monitor For Mixed-Field Radiation EnvironmentsiWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL Synchrotron, Jun 2013, Paris, France
Communication dans un congrès
lirmm-01238433v1
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Mitigate TSV Electromigration for 3D ICs - From the Architecture PerspectiveInternational Symposium on VLSI, Natale, Brazil. pp.6
Communication dans un congrès
lirmm-00839052v1
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SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variationsIOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩
Communication dans un congrès
lirmm-00818955v1
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A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to NeutronsRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès
lirmm-00805163v1
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Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM ArchitecturesJNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France
Communication dans un congrès
lirmm-00806827v1
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Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS TransistorNSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4
Communication dans un congrès
lirmm-00805275v1
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Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty MeasurementsColloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès
lirmm-00806859v1
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Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron RadiationIOLTS: International On-Line Testing Symposium, Jun 2012, Sitges, Spain. pp.212-222, ⟨10.1109/IOLTS.2012.6313853⟩
Communication dans un congrès
lirmm-00805373v1
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Test and Reliability of Magnetic Random Access MemoriesGDR SOC-SIP'11: Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès
lirmm-00679516v1
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Resistive-Open Defect Analysis for Through-Silicon-ViasDCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France
Communication dans un congrès
lirmm-00806803v1
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Defect Analysis in Power Mode Control Logic of Low-Power SRAMsETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233033⟩
Communication dans un congrès
lirmm-00805374v1
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Dynamic Mode Testing of SRAMS under Neutron RadiationSixième colloque du GDR SOC-SIP du CNRS, Jun 2012, Paris, France
Communication dans un congrès
lirmm-00807053v1
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Power Supply Noise Sensor Based on Timing Uncertainty MeasurementsATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.161-166, ⟨10.1109/ATS.2012.46⟩
Communication dans un congrès
lirmm-00806890v1
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Dynamic-Stress Neutrons Test of Commercial SRAMsIEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4
Communication dans un congrès
lirmm-00805349v1
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Peak Power Estimation: A Case Study on CPU CoresIEEE Asian Test Symposium, Nov 2012, Niigata, Japan. pp.167-172, ⟨10.1109/ATS.2012.58⟩
Communication dans un congrès
lirmm-00805389v1
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Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test SolutionsITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2012.6401578⟩
Communication dans un congrès
lirmm-00805143v1
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SRAM testing under Neutron Radiation for the evaluation of different algorithms stress15ème Journées Nationales du Réseau Doctoral en Microélectronique, Jun 2012, Marseille, France
Communication dans un congrès
lirmm-00807054v1
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A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in AltitudeIEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩
Communication dans un congrès
lirmm-00805169v1
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Complete Framework for the Estimation of the SRAM Core-Cell Resilience to RadiationRADECS: Radiation and its Effects on Components and Systems, Sep 2012, Biarritz, France
Communication dans un congrès
hal-01935785v1
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Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant ArchitectureJNRDM'11: Journées Nationales du Réseau Doctoral de Microélectronique, Paris, France
Communication dans un congrès
lirmm-00679509v1
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Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMsColloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès
lirmm-00806842v1
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Through-Silicon-Via Resistive-Open Defect AnalysisETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233037⟩
Communication dans un congrès
lirmm-00806848v1
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An Error Resilient Platform for Data Transfer and Power Management for a Distributed SRAM-based Neutron Detection Test BenchRADSOL: Electronique et rayonnements naturels au niveau du sol, Jun 2012, Paris, France
Communication dans un congrès
lirmm-00805398v1
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Why and How Controlling Power Consumption During Test: A SurveyATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp. 221-226, ⟨10.1109/ATS.2012.30⟩
Communication dans un congrès
lirmm-00818984v1
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A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital CircuitsGDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès
lirmm-00679513v1
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Defect Localization Through an Effect-Cause based Intra-Cell DiagnosisColloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès
lirmm-00806841v1
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Fault Localization Improvement through an Intra-Cell Diagnosis ApproachISTFA 2012 - 38th International Symposium for Testing and Failure Analysis, Nov 2012, Phoenix, AZ, United States. pp.509-519
Communication dans un congrès
lirmm-00806863v1
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Alpha particle-induced transient currents in 65 nm and 40 nm technologiesSEE'2012: Single Event Effects Symposium, Apr 2012, San Diego, CA, United States. pp.1
Communication dans un congrès
lirmm-00805378v1
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Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron RadiationRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès
lirmm-00805165v1
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Radiation Induced Effects on Electronic Systems and ICsSETS: South European Test Seminar, Mar 2012, Sauze d'Oulx, Italy
Communication dans un congrès
lirmm-00807055v1
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Impact of Resistive-Open Defects on the Heat Current of TAS-MRAM ArchitecturesDATE 2012 - 15th Design, Automation and Test in Europe Conference and Exhibition, Mar 2012, Dresden, Germany. pp.532-537, ⟨10.1109/DATE.2012.6176526⟩
Communication dans un congrès
lirmm-00689024v1
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Advanced Test Methods for SRAMsVTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.300-301, ⟨10.1109/VTS.2012.6231070⟩
Communication dans un congrès
lirmm-00805049v1
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A Pseudo-Dynamic Comparator for Error Detection in Fault Tolerant ArchitecturesVTS: VLSI Test Symposium, Apr 2012, Hawaii, United States. pp.50-55, ⟨10.1109/VTS.2012.6231079⟩
Communication dans un congrès
lirmm-00806778v1
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Impact of Resistive-Bridge Defects in TAS-MRAM ArchitecturesATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.125-130, ⟨10.1109/ATS.2012.37⟩
Communication dans un congrès
lirmm-00806809v1
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Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line CouplingGDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès
lirmm-00679522v1
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Electro-Thermal Analysis of 3D Power Delivery NetworksDAC: Design Automation Conference, 2012, San Francisco, United States
Communication dans un congrès
lirmm-00806836v1
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Proton Flux Anisotropy in the Atmosphere: Experiment and ModelingRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès
lirmm-00805150v1
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A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital CircuitsATS 2011 - 20th IEEE Asian Test Symposium, Nov 2011, New Delhi, India. pp.136-141, ⟨10.1109/ATS.2011.89⟩
Communication dans un congrès
lirmm-00651238v1
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On Using Address Scrambling for Defect Tolerance in SRAMsInternational test Conference, Sep 2011, Anaheim, CA, United States. pp.1-8, ⟨10.1109/TEST.2011.6139149⟩
Communication dans un congrès
lirmm-00805334v1
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Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-FillingATS: Asian Test Symposium, 2011, New Delhi, India. pp.21-23
Communication dans un congrès
lirmm-00651247v1
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Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line CouplingDDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Netherlands. pp.353-358
Communication dans un congrès
lirmm-00592182v1
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Power-Aware Test Pattern Generation for At-Speed LOS TestingATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.506-510
Communication dans un congrès
lirmm-00651917v1
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Power Supply Noise and Ground Bounce Aware Pattern Generation for Delay TestingNEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.73-76, ⟨10.1109/NEWCAS.2011.5981222⟩
Communication dans un congrès
lirmm-00647815v1
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A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply NoiseDDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2011, Cottbus, Germany. pp.189-194, ⟨10.1109/DDECS.2011.5783078⟩
Communication dans un congrès
lirmm-00592000v1
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On Using Address Scrambling to Implement Defect Tolerance in SRAMsITC'2011: International Test Conference, Sep 2011, Anaheim, CA, United States. pp.N/A
Communication dans un congrès
lirmm-00647773v1
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Impact of Resistive-Bridging Defects in SRAM Core-CellDELTA'10: International Symposium on Electronic Design, Test & Applications, Ho Chi Minh, Vietnam. pp.265-270
Communication dans un congrès
lirmm-00553592v1
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Impact of Atmospheric Neutrons on SRAMs through a Modular Test BenchRADSOL - Electronique et rayonnements naturels au niveau du sol, Jun 2011, Paris, France
Communication dans un congrès
lirmm-00805407v1
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Mapping Test Power to Functional Power through Smart X-Filling for LOS SchemeLPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway
Communication dans un congrès
lirmm-00651905v1
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Error Resilient Infrastructure for Data Transfer in a Distributed Neutron DetectorDFT 2011 - International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.294-301, ⟨10.1109/DFT.2011.41⟩
Communication dans un congrès
lirmm-00651226v1
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Test Relaxation and X-filling to Reduce Peak Power During At-Speed LOS TestingGDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès
lirmm-00553989v1
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Detecting NBTI Induced Failures in SRAM Core-CellsVTS'10: VLSI Test Symposium, Santa Cruz, CA, United States. pp.75-80
Communication dans un congrès
lirmm-00553612v1
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Failure Analysis and Test Solutions for Low-Power SRAMsATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.459-460, ⟨10.1109/ATS.2011.97⟩
Communication dans un congrès
lirmm-00805123v1
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Analysis of Resistive-Open Defects in TAS-MRAM ArrayITC: International Test Conference, Sep 2011, Anaheim, CA, United States
Communication dans un congrès
lirmm-00679524v1
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Robust Structure for Data Collection and Transfer in a Distributed SRAM Based Neutron Test BenchWorkshop on Dependability Issues in Deep-Submicron Technologies, Trondheim, Norway
Communication dans un congrès
lirmm-00651796v1
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Simultaneous Power and Thermal Integrity Analysis for 3D Integrated SystemsLPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway
Communication dans un congrès
lirmm-00651802v1
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A DfT Solution for Oxide Thickness Varitions in ATMEL eFlash TechnologyDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece
Communication dans un congrès
lirmm-00647750v1
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Variability Analysis of an SRAM Test ChipETS: European Test Symposium, May 2011, Trondheim, Norway
Communication dans un congrès
lirmm-00651791v1
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On using a SPICE-like TSTAC™ eFlash model for design and testDDECS: Design and Diagnostics of Electronic Circuits ans Systems, Apr 2011, Cottbus, Germany. pp.359-370, ⟨10.1109/DDECS.2011.5783111⟩
Communication dans un congrès
lirmm-00592203v1
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Power Reduction Through X-filling of Transition Fault Test Vectors for LOS TestingDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece. ⟨10.1109/DTIS.2011.5941434⟩
Communication dans un congrès
lirmm-00647760v1
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Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM ArraysRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩
Communication dans un congrès
lirmm-00805314v1
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A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay TestingETS 2011 - 16th IEEE European Test Symposium, May 2011, Trondheim, Norway. pp.153-158, ⟨10.1109/ETS.2011.21⟩
Communication dans un congrès
lirmm-00647822v1
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Analyse et modélisation des défauts résistifs affectant les mémoires FlashGDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès
lirmm-00553947v1
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Versatile March Test Generator for Hands-on Memory Testing LaboratoryMSE: Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. pp.41-42, ⟨10.1109/MSE.2011.5937088⟩
Communication dans un congrès
lirmm-00805300v1
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Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test BenchIEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6
Communication dans un congrès
lirmm-00805120v1
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Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron SensorIEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. pp.176-180, ⟨10.1109/IWASI.2011.6004712⟩
Communication dans un congrès
lirmm-00805394v1
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Analysis and Fault Modeling of Actual Resistive Defects in Flash MemoriesJNRDM'10 : Journées Nationales du Réseau Doctoral de Microélectronique, Montpellier, France
Communication dans un congrès
lirmm-00553935v1
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Tolérance aux fautes et rendement de fabricationGDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès
lirmm-00553995v1
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X-Identification of Transition Delay Fault Tests for Launch-off Shift SchemeWRTLT'10: 11th IEEE Workshop On RTL and High Level Testing, Shanghai, China. pp.N/A
Communication dans un congrès
lirmm-00566869v1
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Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power DevicesRADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.226-231, ⟨10.1109/RADECS.2011.6131395⟩
Communication dans un congrès
lirmm-00805339v1
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Setting Test Conditions for Improving SRAM ReliabilityETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.257-262
Communication dans un congrès
lirmm-00492741v1
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Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-CellsVARI: Workshop on CMOS Variability, 2010, Montpellier, France
Communication dans un congrès
lirmm-00553626v1
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Power Reduction Through X-filling of Transition Fault Test Vectors for LOS TestingLPonTR:
Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic
Communication dans un congrès
lirmm-00553930v1
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A Comprehensive System-on-Chip Logic DiagnosisATS: Asian Test Symposium, 2010, Shanghai, China. pp.237-242
Communication dans un congrès
lirmm-00545131v1
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A Statistical Simulation Method for Reliability Analysis of SRAM Core-CellsDAC: Design Automation Conference, Jun 2010, Anaheim, United States. pp.853-856
Communication dans un congrès
lirmm-00553619v1
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Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing SchemesDDECS'10: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2010, Vienna, Austria. pp.376-381
Communication dans un congrès
lirmm-00475734v1
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A Memory Fault Simulator for Radiation-Induced Effects in SRAMsATS: Asian Test Symposium, 2010, Shanghai, China. pp.100-105
Communication dans un congrès
lirmm-00545102v1
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Impact of Resistive-Open Defects on SRAM sensitivity to Soft ErrorsRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria
Communication dans un congrès
lirmm-00566847v1
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Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell LayoutsIOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. pp.29-34, ⟨10.1109/IOLTS.2010.5560236⟩
Communication dans un congrès
lirmm-00559034v1
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Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study from 90nm down to 40nm Technology NodesETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.132-137
Communication dans un congrès
lirmm-00493236v1
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A Two-Layer SPICE Model of the ATMEL TSTAC eFlash Memory Technology for Defect Injection and Faulty Behavior PredictionETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.81-86
Communication dans un congrès
lirmm-00493204v1
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Delay Fault Diagnosis in Sequential CircuitsATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. pp.355-360
Communication dans un congrès
lirmm-00406968v1
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Using TMR Architectures for SoC Yield ImprovementVALID'09: The First International Conference on Advances in System Testing and Validation Lifecycle, 2009, Porto, Portugal. pp.155-160
Communication dans un congrès
lirmm-00406967v1
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A Fault-Simulation-Based Approach for Logic DiagnosisDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2009, Cairo, Egypt. pp.216-221
Communication dans un congrès
lirmm-00371377v1
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Neutron Detection through an SRAM-Based Test BenchIWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩
Communication dans un congrès
lirmm-00438842v1
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Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split ModelsDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229
Communication dans un congrès
lirmm-00370798v1
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Comprehensive Bridging Fault Diagnosis based on the SLAT ParadigmDDECS'09: 12th IEEE Symposium on Design and Diagnostics of Electronic Systems, pp.264-269
Communication dans un congrès
lirmm-00371198v1
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Trade-off Between Power Dissipation and Delay Fault Coverage For LOS and LOC Testing SchemesImpact of Low-Power Design on Test and Reliability, Spain
Communication dans un congrès
lirmm-00435005v1
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A New Design-for-Test Technique for SRAM Core-Cell Stability FaultsDATE: Design, Automation and Test in Europe, Apr 2009, Nice, France. pp.1344-1348, ⟨10.1109/DATE.2009.5090873⟩
Communication dans un congrès
lirmm-00371374v1
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Use of BOBST for the Detection of Neutrons Induced Errors in SRAMIWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy
Communication dans un congrès
hal-01957246v1
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A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMsITC'2008: International Test Conference, Oct 2008, Santa Clara, CA, United States. pp.1-10, ⟨10.1109/TEST.2008.4700555⟩
Communication dans un congrès
lirmm-00341798v1
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Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMsVLSI Test Symposium, Apr 2008, San Diego, California, United States. pp.336
Communication dans un congrès
lirmm-00324151v1
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A Signature-based Approach for Diagnosis of Dynamic Faults in SRAMsDTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2008, Tunis, Tunisia. pp.001-006, ⟨10.1109/DTIS.2008.4540243⟩
Communication dans un congrès
lirmm-00324143v1
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A History-Based Technique for Faults Diagnosis in SRAMsColloque GDR SoC-SiP, France
Communication dans un congrès
lirmm-00341821v1
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March CRF: an Efficient Test for Complex Read Faults in SRAM MemoriesDDECS: Design and Diagnostics of Electronic Circuits and Systems, IEEE, Apr 2007, Cracovie, Poland. ⟨10.1109/DDECS.2007.4295276⟩
Communication dans un congrès
lirmm-01239052v1
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March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge CircuitDDECS'06: Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, République Tchèque, pp.256-261
Communication dans un congrès
lirmm-00134776v1
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Minimizing Test Power in SRAM through Pre-charge Activity ReductionDATE: Design, Automation and Test in Europe, Mar 2006, Munich, Germany. pp.1159-1165, ⟨10.1109/DATE.2006.244016⟩
Communication dans un congrès
lirmm-00137598v1
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Leakage Read Fault in Nanoscale SRAM: Analysis, Test and DiagnosisIDT'06: IEEE International Design and Test Workshop, Nov 2006, Dubai, United Arab Emirates. pp.110-115
Communication dans un congrès
lirmm-00137603v1
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Data Retention Fault in SRAM Memories: Analysis and Detection ProceduresVTS 2005 - 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA, United States. pp.183-188, ⟨10.1109/VTS.2005.37⟩
Communication dans un congrès
lirmm-00105995v1
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Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison between 0.13μm and 90nm TechnologiesDAC: Design Automation Conference, May 2005, Anaheim, CA, United States. pp.857-862, ⟨10.1145/1065579.1065804⟩
Communication dans un congrès
lirmm-00106558v1
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Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm TechnologiesDAC: Design Automation Conference, Jun 2005, Anaheim, CA, United States. pp.857-862
Communication dans un congrès
lirmm-00136906v1
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Incidence des Défauts Résistifs dans les Circuits de Précharge des Mémoires SRAMJNRDM 2005 - 8e Journées Nationales du Réseau Doctoral de Microélectronique, May 2005, Paris, France
Communication dans un congrès
lirmm-00106529v1
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Resistive-Open Defect Influence in SRAM Pre-Charge Circuits: Analysis and CharacterizationETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.116-121, ⟨10.1109/ETS.2005.33⟩
Communication dans un congrès
lirmm-00106010v1
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Efficient Test of Dynamic Read Destructive Faults in SRAM MemoriesLATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.40-45
Communication dans un congrès
lirmm-00106515v1
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An A/D Interface for Resonant Piezoresistive MEMS SensorISIE 2004 - IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio, France. pp.83-88, ⟨10.1109/ISIE.2004.1571786⟩
Communication dans un congrès
lirmm-00108896v1
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March iC-: An Improved Version of March C- for ADOFs DetectionVTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.129-134, ⟨10.1109/VTEST.2004.1299236⟩
Communication dans un congrès
lirmm-00108772v1
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Test March pour la Détection des Fautes Dynamiques dans les Décodeurs de Mémoires SRAMJNRDM'04 : 7ièmes Journées Nationales du Réseau Doctoral de Microélectronique, May 2004, Marseille, France. pp.495-497
Communication dans un congrès
lirmm-00108644v1
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Dynamic Read Destructive Faults in Embedded-SRAMs: Analysis and March Test SolutionETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.140-145
Communication dans un congrès
lirmm-00108795v1
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Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test SolutionATS: Asian Test Symposium, Nov 2004, Kenting, Taiwan. pp.266-271
Communication dans un congrès
lirmm-00108800v1
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March Tests Improvements for Address Decoder Open and Resistive Open Fault DetectionLATW: Latin American Test Workshop, Mar 2004, Cartagena, Colombia. pp.31-36
Communication dans un congrès
lirmm-00108642v1
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Comparison of open and resistive-open defect test conditions in SRAM address decodersATS: Asian Test Symposium, Nov 2003, Xian, China. pp.250-255, ⟨10.1109/ATS.2003.1250818⟩
Communication dans un congrès
lirmm-01238821v1
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Machine learning application to space particle discrimination from multiple-cell upsets in a memory deviceRADECS 2022 - European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy. , 2022
Poster de conférence
lirmm-03837246v1
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A Performance Evaluation of a Fault-tolerant RISC-V with Vector Instruction Support to Space ApplicationsLASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022
Poster de conférence
lirmm-03834121v1
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Assessing the Reliability of a Network-on-Chip through Physical ValidationLASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022
Poster de conférence
lirmm-03834119v1
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Technology Dependence of Stuck Bits and Single Event Upsets in 110, 72, and 63-nm SDRAMsPoster de conférence lirmm-03834026v1 |
Interconnection Architecture for Dependable Multicore SystemsPhD Forum - 26th IFIP/IEEE International Conference on Very Large Scale Integration, Oct 2018, Torino, Italy. 2018
Poster de conférence
lirmm-02008476v1
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Fault-Effect Propagation Based Intra-cell Scan Chain DiagnosisColloque GDR SoC-SiP, Jun 2013, Lyon, France. 2013
Poster de conférence
lirmm-00839113v1
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Performance Evaluation of Capacitive defects on TAS-MRAMsColloque GDR SoC-SiP, 2013, Lyon, France. 2013
Poster de conférence
lirmm-00839093v1
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Investigating Multiple-Cell-Upsets on a 90mn SRAMColloque GDR SoC-SiP, 2013, Lyon, France. 2013
Poster de conférence
lirmm-00839108v1
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Resistive Open Defect Analysis for Through-Silicon-ViasETS: European Test Symposium, May 2012, Annecy, France. 17th IEEE European Test Symposium, pp.183, 2012
Poster de conférence
lirmm-00806795v1
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Coupling-Based Resistive-Open Defects in TAS-MRAM ArchitecturesETS: European Test Symposium, May 2012, Annecy, France. Test Symposium (ETS), 2012 17th IEEE European, 2012, ⟨10.1109/ETS.2012.6233034⟩
Poster de conférence
lirmm-00806793v1
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A Roaming Memory Test Bench for Detecting Particle Induced SEUsITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩
Poster de conférence
lirmm-00537879v1
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Is Test Power Reduction Through X-Filling Good Enough?ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. 2010
Poster de conférence
lirmm-00537926v1
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Parity Prediction Synthesis for Nano-Electronic Gate DesignsITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. pp.N/A, 2010
Poster de conférence
lirmm-00537938v1
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Test des Mémoires FLASH NANDColloque GDR SoC-SiP, France. 2009
Poster de conférence
lirmm-00433770v1
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Analysis of Resistive-Bridging Defects in SRAM Core-Cell: Impact within the Core-Cell and in the Memory ArrayETS: European Test Symposium, May 2009, Sevilla, Spain. 14th IEEE European Test Symposium, 2009
Poster de conférence
lirmm-00433796v1
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SoC Yield Improvement for Future Nanoscale TechnologiesETS 2009 - 14th IEEE European Test Symposium | PhD Forum, May 2009, Sevilla, Spain. 2009
Poster de conférence
lirmm-00433798v1
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A Logic Diagnosis Approach for Sequential CircuitsPoster de conférence lirmm-00433792v1 |
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SRAM Core-cell Quality MetricsGDR SOC SIP, France. 2009
Poster de conférence
lirmm-00434962v1
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Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing SchemesGDR SOC SIP, France. 2009
Poster de conférence
lirmm-00434959v1
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NAND Flash Testing: A Preliminary Study on Actual DefectsITC: International Test Conference, Nov 2009, Austin, TX, United States. 2009, ⟨10.1109/TEST.2009.5355898⟩
Poster de conférence
lirmm-00433765v1
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Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled TechnologiesSpringer, 171 p., 2009, 978-1-4419-0937-4
Ouvrages
lirmm-00371359v1
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Space Radiation Effects in ElectronicsRad-hard Semiconductor Memories, Series in Electronic Materials and Devices, River Publishers, pp.1-56, 2018, 9788770220200
Chapitre d'ouvrage
lirmm-02007913v1
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Electromigration Alleviation Techniques for 3D Integrated CircuitsChao Wang. High Performance Computing for Big Data: Methodologies and Applications, CRC Press, pp.37-58, 2017, 9781498783996
Chapitre d'ouvrage
lirmm-01800220v1
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Effect of space radiation on COTS memories: the MTCUBE project2019
Autre publication scientifique
lirmm-02008210v1
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Rapport Technique de fin d'année, Contrat TOETS CT 302, Programme CEE CATRENE2011
Autre publication scientifique
lirmm-00679022v1
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Rapport Technique intermédiaire, Contrat TOETS CT 302, Programme CEE CATRENE2011
Autre publication scientifique
lirmm-00679018v1
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Contrat TOETS CT 302 - Programme CEE CATRENE (Rapport Intermédiaire)2010
Autre publication scientifique
lirmm-00504873v1
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TOETS CT302 - Programme CEE CATRENE - Summary Technical Report 2S-2009 - Rapport Technique de Fin d'année2010
Autre publication scientifique
lirmm-00461745v1
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Rapport Technique de fin de Contrat NanoTEST 2A702, Programme CEE MEDEA+2009
Autre publication scientifique
lirmm-00406974v1
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Test and Reliability of Electronic Circuits in Natural and Radiative EnvironmentElectronics. Université de Montpellier, 2015
HDR
tel-01259002v1
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