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Luigi Dilillo

307
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Publications

CRaTeBo: a high-speed, radiation-tolerant and versatile testing platform for FPGA radiation qualification for high-energy particle accelerator applications

A Scialdone , P Gkountoumis , R Ferraro , M Barros Marin , Luigi Dilillo
JINST, 2024, 19 (01), pp.P01012. ⟨10.1088/1748-0221/19/01/P01012⟩
Article dans une revue hal-04412765v1
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Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs

Daniel Söderström , Lucas Matana Luza , André Martins Pio de Mattos , Thierry Gil , Heikki Kettunen
IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.1861-1869. ⟨10.1109/TNS.2023.3295435⟩
Article dans une revue hal-04192915v1
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Enhancing Fault Awareness and Reliability of a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos , André Mattos , Douglas Melo , Luigi Dilillo
Electronics, 2023, 12 (12), pp.2557. ⟨10.3390/electronics12122557⟩
Article dans une revue hal-04120525v1

Exploring Radiation-Induced Vulnerabilities in RFICs through Traditional RF Metrics

Antonio Scialdone , Rudy Ferraro , Luigi Dilillo , Frederic Saigne , Jérôme Boch
IEEE Transactions on Nuclear Science, 2023, pp.1-1. ⟨10.1109/TNS.2023.3270206⟩
Article dans une revue hal-04120913v1
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A Survey on Deep Learning Resilience Assessment Methodologies

Annachiara Ruospo , Ernesto Sanchez , Lucas Matana Luza , Luigi Dilillo , Marcello Traiola
Computer, 2023, 56, pp.57-66. ⟨10.1109/MC.2022.3217841⟩
Article dans une revue lirmm-03834128v1
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Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks

Lucas Matana Luza , Annachiara Ruospo , Daniel Soderstrom , Carlo Cazzaniga , Maria Kastriotou
IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882. ⟨10.1109/TETC.2021.3116999⟩
Article dans une revue lirmm-03382380v1
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A Survey of the RISC-V Architecture Software Support

Benjamin William Mezger , Douglas Almeida dos Santos , Luigi Dilillo , Cesar A Zeferino , Douglas Rossi de Melo
IEEE Access, 2022, 10, pp.51394-51411. ⟨10.1109/ACCESS.2022.3174125⟩
Article dans une revue lirmm-03737820v1
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Neutron-Induced Effects on a Self-Refresh DRAM

Lucas Matana Luza , Daniel Söderström , Helmut Puchner , Rubén García Alía , Manon Letiche
Microelectronics Reliability, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩
Article dans une revue lirmm-03435635v1
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Reliability analysis of a fault-tolerant RISC-V system-on-chip

Douglas Almeida dos Santos , Lucas Matana Luza , Luigi Dilillo , Cesar Albenes Zeferino , Douglas Rossi de Melo
Microelectronics Reliability, 2021, 125, pp.#114346. ⟨10.1016/j.microrel.2021.114346⟩
Article dans une revue lirmm-03358839v1
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Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

Daniel Söderström , Lucas Matana Luza , Heikki Kettunen , Arto Javanainen , Wilfrid Farabolini
IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩
Article dans une revue lirmm-03358914v1
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On the evaluation of FPGA radiation benchmarks

Gaetan Bricas , Georgios Tsiligiannis , Antoine Touboul , Jérôme Boch , Maria Kastriotou
Microelectronics Reliability, 2021, 126, pp.#114276. ⟨10.1016/j.microrel.2021.114276⟩
Article dans une revue lirmm-03382368v1

COTS Optocoupler Radiation Qualification Process for LHC Applications Based on Mixed-Field Irradiations

Rudy Ferraro , Gilles Foucard , Angelo Infantino , Luigi Dilillo , Markus Brugger
IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1395-1403. ⟨10.1109/TNS.2020.2972777⟩
Article dans une revue hal-02911961v1
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Improvement of the Tolerated Raw Bit Error Rate in NAND Flash-based SSDs with Selective Refresh

Emna Farjallah , Jean-Marc Armani , Valentin Gherman , Luigi Dilillo
Microelectronics Reliability, 2019, 96, pp.37-45. ⟨10.1016/j.microrel.2019.01.014⟩
Article dans une revue lirmm-02008002v1

Study of the impact of the LHC radiation environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components

Rudy Ferraro , Salvatore Danzeca , Chiara Cangialosi , Rubén García Alía , Francesco Cerutti
IEEE Transactions on Nuclear Science, 2019, 66 (7), pp.1548-1556. ⟨10.1109/TNS.2019.2902441⟩
Article dans une revue lirmm-02016480v1
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Maximizing the Inner Resilience of a Network-on-Chip through Router Controllers Design

Douglas Rossi de Melo , Cesar A. Zeferino , Luigi Dilillo , Eduardo Augusto Bezerra
Sensors, 2019, 19 (24), pp.5416-5439. ⟨10.3390/s19245416⟩
Article dans une revue lirmm-02547726v1
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Pre-flight qualification test procedure for nanosatellites using sounding rockets

Leonardo Kessler Slongo , João Gabriel Reis , Daniel Gaiki , Pedro von Hohendorff Seger , Sara Vega Martínez
Acta Astronautica, 2019, 159, pp.564-577. ⟨10.1016/j.actaastro.2019.01.035⟩
Article dans une revue lirmm-02415535v1
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Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere
IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩
Article dans une revue lirmm-02007922v1

A calculation method to estimate single event upset cross section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Jérôme Boch
Microelectronics Reliability, 2017, 76-77, pp.644-649. ⟨10.1016/j.microrel.2017.07.056⟩
Article dans une revue hal-01636059v1
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Design of a radiation tolerant system for total ionizing dose monitoring using floating gate and RadFET dosimeters

Rudy Ferraro , Salvatore Danzeca , Matteo Brucoli , Alessandro Masi , Markus Brugger
Journal of Instrumentation, 2017, 12 (4), pp.#C04007. ⟨10.1088/1748-0221/12/04/C04007⟩
Article dans une revue lirmm-01513884v1

Proton-Induced Single-Event Degradation in SDRAMs

Axel Rodriguez , Frédéric Wrobel , Anne Samaras , Francoise Bezerra , Benjamin Vandevelde
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2115-2121. ⟨10.1109/TNS.2016.2551733⟩
Article dans une revue lirmm-01382563v1

Soft errors in commercial off-the-shelf static random access memories

Luigi Dilillo , Georgios Tsiligiannis , Viyas Gupta , Alexandre Louis Bosser , Frédéric Saigné
Semiconductor Science and Technology, 2016, Special Issue on Radiation Effects in Semiconductor Devices, 32 (1), ⟨10.1088/1361-6641/32/1/013006⟩
Article dans une revue lirmm-01434747v1

Methodologies for the Statistical Analysis of Memory Response to Radiation

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Christopher Frost , Ali Mohammad Zadeh
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2122-2128. ⟨10.1109/TNS.2016.2527781⟩
Article dans une revue lirmm-01382508v1

The Power Law Shape of Heavy Ions Experimental Cross Section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Eric Lorfèvre
IEEE Transactions on Nuclear Science, 2016, 64 (1), pp.427-433. ⟨10.1109/TNS.2016.2608004⟩
Article dans une revue lirmm-01382480v1

Design for Test and Diagnosis of Power Switches

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
Journal of Circuits, Systems, and Computers, 2016, 25 (3), pp.1640013. ⟨10.1142/S0218126616400132⟩
Article dans une revue lirmm-01272986v1

Heavy-Ion Radiation Impact on a 4 Mb FRAM Under Different Test Modes and Conditions

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammad Zadeh , Arto Javanainen
IEEE Transactions on Nuclear Science, 2016, 63 (4), pp.2010-2015. ⟨10.1109/TNS.2016.2559943⟩
Article dans une revue lirmm-01382552v1

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen
IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2620-2626. ⟨10.1109/TNS.2015.2496874⟩
Article dans une revue lirmm-01254157v1

SEE on Different Layers of Stacked-SRAMs

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Mathias Rousselet , Ali Mohammad Zadeh
IEEE Transactions on Nuclear Science, 2015, 62 (6), pp.2673-2678. ⟨10.1109/TNS.2015.2496725⟩
Article dans une revue lirmm-01254148v1
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Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
Journal of Instrumentation, 2014, 9 (5), pp.#C05052. ⟨10.1088/1748-0221/9/05/C05052⟩
Article dans une revue lirmm-01234448v1

An SRAM Based Monitor for Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1663-1670. ⟨10.1109/TNS.2014.2299733⟩
Article dans une revue lirmm-01234441v1

Multiple Cell Upset Classification in Commercial SRAMs

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1747-1754. ⟨10.1109/TNS.2014.2313742⟩
Article dans une revue lirmm-01234446v1
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Globally Constrained Locally Optimized 3-D Power Delivery Networks

Aida Todri-Sanial , Sandip Kundu , Patrick Girard , Alberto Bosio , Luigi Dilillo
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22 (10), pp.2131-2144. ⟨10.1109/TVLSI.2013.2283800⟩
Article dans une revue lirmm-01255754v1

Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Robert Ecoffet
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3564-3571. ⟨10.1109/TNS.2014.2368613⟩
Article dans une revue lirmm-01234461v1

A New Hybrid Fault-Tolerant Architecture for Digital CMOS Circuits and Systems

Ahn Duc Tran , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
Journal of Electronic Testing: : Theory and Applications, 2014, 30 (4), pp.401-413. ⟨10.1007/s10836-014-5459-3⟩
Article dans une revue lirmm-01272958v1

Determining Realistic Parameters for the Double Exponential Law that Models Transient Current Pulses

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Vincent Pouget , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1813-1818. ⟨10.1109/TNS.2014.2299762⟩
Article dans une revue lirmm-01234429v1

Dynamic Test Methods for COTS SRAMs

Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3095-3102. ⟨10.1109/TNS.2014.2363123⟩
Article dans une revue lirmm-01234463v1

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2014, 22 (11), pp.2326-2335. ⟨10.1109/TVLSI.2013.2294080⟩
Article dans une revue lirmm-01248578v1

Dynamic Compact Model of Self-Referenced Magnetic Tunnel Junction

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
IEEE Transactions on Electron Devices, 2014, 61 (11), pp.3877-3882. ⟨10.1109/TED.2014.2355418⟩
Article dans une revue lirmm-01272978v1
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90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3389-3394. ⟨10.1109/TNS.2014.2363120⟩
Article dans une revue hal-04056468v1
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Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Tarek Saad Saoud , Soilihi Moindjie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel
IEEE Transactions on Nuclear Science, 2014, 61 (6), pp.3380-3388. ⟨10.1109/TNS.2014.2365038⟩
Article dans une revue lirmm-01234455v1

On the Test and Mitigation of Malfunctions in Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
Journal of Electronic Testing: : Theory and Applications, 2014, 30 (5), pp.611-627. ⟨10.1007/s10836-014-5479-z⟩
Article dans une revue lirmm-01238443v1
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Intra-Cell Defects Diagnosis

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
Journal of Electronic Testing: : Theory and Applications, 2014, 30 (5), pp.541-555. ⟨10.1007/s10836-014-5481-5⟩
Article dans une revue lirmm-01272964v1

Gate Voltage Contribution to Neutron-Induced SEB of Trench Gate Fieldstop IGBT

Lionel Foro , Antoine Touboul , Alain Michez , Frédéric Wrobel , Paolo Rech
IEEE Transactions on Nuclear Science, 2014, 61 (4), pp.1739-1746. ⟨10.1109/TNS.2014.2332813⟩
Article dans une revue lirmm-01237646v1

A Silicon Diode-Based Detector for Investigations of Atmospheric Radiation

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere
IEEE Transactions on Nuclear Science, 2013, 60 (5), pp.3603-3608. ⟨10.1109/TNS.2013.2264957⟩
Article dans une revue lirmm-01234419v1

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2386-2391. ⟨10.1109/TNS.2013.2257847⟩
Article dans une revue lirmm-01234425v1
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Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21 (5), pp.958-970. ⟨10.1109/TVLSI.2012.2197427⟩
Article dans une revue lirmm-00806774v1

Soft Error Triggering Criterion Based on Simplified Electrical Model of the SRAM cell

Frédéric Wrobel , Antoine Touboul , Luigi Dilillo , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2537-2541. ⟨10.1109/TNS.2012.2235148⟩
Article dans une revue lirmm-00805001v1
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A Study of Tapered 3-D TSVs for Power and Thermal Integrity

Aida Todri-Sanial , Sandip Kundu , Patrick Girard , Alberto Bosio , Luigi Dilillo
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2013, 21 (2), pp.306-319. ⟨10.1109/TVLSI.2012.2187081⟩
Article dans une revue lirmm-00806776v1

Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption

Paolo Bernardi , Mauricio de Carvalho , Ernesto Sanchez , Matteo Sonza Reorda , Alberto Bosio
Journal of Low Power Electronics, 2013, 9 (2), pp.253-263. ⟨10.1166/jolpe.2013.1259⟩
Article dans une revue lirmm-00934937v1

Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
IEEE Transactions on Nuclear Science, 2013, 60 (4), pp.2617-2622. ⟨10.1109/TNS.2013.2239311⟩
Article dans une revue lirmm-00805005v1

Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
Journal of Electronic Testing: : Theory and Applications, 2012, 28 (3), pp.317-329. ⟨10.1007/s10836-012-5291-6⟩
Article dans une revue lirmm-00805017v1

Analysis and Fault Modeling of Actual Resistive Defects in ATMELtm eFlash Memories

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
Journal of Electronic Testing: : Theory and Applications, 2012, 28 (2), pp.215-228. ⟨10.1007/s10836-012-5277-4⟩
Article dans une revue lirmm-00806773v1

Embedded silicon detector to investigate the natural radiative environment

Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere
Journal of Instrumentation, 2012, 7 (5), pp.1-11. ⟨10.1088/1748-0221/7/05/P05007⟩
Article dans une revue lirmm-00805011v1

Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Jérôme Boch
IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.893-899. ⟨10.1109/TNS.2012.2187218⟩
Article dans une revue lirmm-00805031v1

Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs

Alessio Griffoni , Jeroen van Duivenbode , Dimitri Linten , Eddy Simoen , Paolo Rech
IEEE Transactions on Nuclear Science, 2012, 59 (4), pp.866-871. ⟨10.1109/TNS.2011.2180924⟩
Article dans une revue lirmm-00805039v1

Experimental Characterization of Atmospheric Radiation Environment with Stratospheric Balloon

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Paolo Rech
IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.945-951. ⟨10.1109/TNS.2011.2136359⟩
Article dans une revue lirmm-00805045v1

Impact of Resistive-Open Defects on SRAM Error Rate Induced by Alpha Particles and Neutrons

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné
IEEE Transactions on Nuclear Science, 2011, 58 (3), pp.855-861. ⟨10.1109/TNS.2011.2123114⟩
Article dans une revue lirmm-00805046v1

A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for LOS and LOC Schemes

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
Journal of Low Power Electronics, 2010, 6 (2), pp.359-374. ⟨10.1166/jolpe.2010.1086⟩
Article dans une revue lirmm-00553548v1

SoC Yield Improvement - Using TMR Architectures for Manufacturing Defect Tolerance in Logic Cores

Julien Vial , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
International Journal On Advances in Systems and Measurements, 2010, 3 (1/2), pp.1-10
Article dans une revue lirmm-00553567v1

New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAM Memories

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri
Journal of Integrated Circuits and Systems, 2008, 3 (1), pp.7-12. ⟨10.29292/jics.v3i1.276⟩
Article dans une revue lirmm-00341793v1
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Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
Journal of Electronic Testing: : Theory and Applications, 2007, 23 (3), pp.435-444. ⟨10.1007/s10836-007-5003-9⟩
Article dans une revue lirmm-00194254v1

ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions

Patrick Girard , Luigi Dilillo , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
Journal of Electronic Testing: : Theory and Applications, 2006, 22 (3), pp.287-296. ⟨10.1007/s10836-006-7761-1⟩
Article dans une revue lirmm-00134769v1

Reducing Power Dissipation in SRAM During Test

Luigi Dilillo , Paul Rosinger , Bashir Al-Hashimi , Patrick Girard
Journal of Low Power Electronics, 2006, 2 (2), pp.271-280. ⟨10.1166/jolpe.2006.062⟩
Article dans une revue lirmm-00137590v1
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Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri
Journal of Electronic Testing: : Theory and Applications, 2005, 21 (5), pp.551-561. ⟨10.1007/s10836-005-1169-1⟩
Article dans une revue lirmm-00105314v1
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Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test

Simone Borri , Magali Bastian Hage-Hassan , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
Journal of Electronic Testing: : Theory and Applications, 2005, 21 (2), pp.169-179. ⟨10.1007/s10836-005-6146-1⟩
Article dans une revue lirmm-00105313v1
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Implementation and Reliability Evaluation of a RISC-V Vector Extension Unit

Carolina Imianosky , Douglas Santos , Douglas Melo , Felipe Viel , Luigi Dilillo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313569⟩
Communication dans un congrès hal-04266888v1

Hybrid Radiation Hardening Approach: a RISC-V System-on-Chip case study

Luigi Dilillo , Douglas Almeida dos Santos , Lucas Matana Luza , André Martins Pio de Mattos , Douglas Rossi de Melo
G-RADNEXT Workshop, Nov 2023, Geneva, Switzerland
Communication dans un congrès hal-04296178v1

Radiation-induced SEL in a COTS SRAM memory - test and flight data

Douglas Almeida dos Santos , Lucas Matana Luza , André Martins Pio de Mattos , Thomas Borel , Viyas Gupta
TEC-QEC Final Presentation Days, Jun 2023, Noordwijk, Netherlands
Communication dans un congrès hal-04295893v1

CRATEBO: A High-speed, Radiation-Tolerant and Versatile Testing Platform for FPGA Radiation Qualification for High-Energy Particle Accelerator applications

Antonio Scialdone , Rudy Ferraro , Panagiotis Gkountoumis , Salvatore Danzeca , Luigi Dilillo
TWEPP 2023 Topical Workshop on Electronics for Particle Physics, Oct 2023, Geremeas, Italy
Communication dans un congrès hal-04122431v1
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Characterization of a Fault-Tolerant RISC-V System-on-Chip for Space Environments

Douglas Santos , André Mattos , Douglas Melo , Luigi Dilillo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313549⟩
Communication dans un congrès hal-04266887v1
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Hardening a Real-Time Operating System for a Dependable RISC-V System-on-Chip

Benjamin Mezger , Douglas Santos , Luigi Dilillo , Douglas Melo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-Les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313566⟩
Communication dans un congrès hal-04266886v1
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A Low-Cost Hardware Accelerator for CCSDS 123 Lossless Hyperspectral Image Compression

Wesley Grignani , Douglas Santos , Luigi Dilillo , Felipe Viel , Douglas Melo
DFT 2023 - 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2023, Juan-les-Pins, France. pp.1-6, ⟨10.1109/DFT59622.2023.10313567⟩
Communication dans un congrès hal-04266881v1

Objectives and outcomes of WP6 in the second year of RADNEXT: Methodologies for Radiation Test of Systems

Luigi Dilillo , Luis Entrena
RADNEXT 2nd Annual Meeting, May 2023, Seville, Spain
Communication dans un congrès hal-04296158v1
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Investigation on Radiation-Induced Single-Event Latch-up in SRAM Memories on-Board PROBA-V

André Martins Pio de Mattos , Douglas Almeida dos Santos , Viyas Gupta , Thomas Borel , Luigi Dilillo
RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès hal-04266897v1
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Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos , Pablo M. Aviles , André Martins Pio de Mattos , Mario García Valderas , Luis Entrena
RADECS 2023 - European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès hal-04266891v1
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Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments

André Martins Pio de Mattos , Douglas Almeida dos Santos , Carolina Imianosky , Douglas Rossi Melo , Luigi Dilillo
IWASI 2023 - 9th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2023, Bari, Italy. pp.227-232, ⟨10.1109/IWASI58316.2023.10164578⟩
Communication dans un congrès hal-04266899v1
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Enhancement of System Observability During System-Level Radiation Testing through Total Current Consumption Monitoring

Ivan Slipukhin , Andrea Coronetti , Rubén García Alía , Frédéric Saigné , Jérôme Boch
2023 European Conference on Radiation and Its Effects on Components and Systems, Sep 2023, Toulouse, France
Communication dans un congrès hal-04266900v1

Objectives and outcomes of WP6 in the first year of RADNEXT Methodologies for Radiation test of Systems

Luigi Dilillo
RADNEXT DAYS 2022 - 1st Annual Meeting, Jun 2022, Geneva, Switzerland
Communication dans un congrès hal-04295913v1
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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Douglas Almeida dos Santos , André Martins Pio de Mattos , Lucas Matana Luza , Carlo Cazzaniga , Maria Kastriotou
DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩
Communication dans un congrès lirmm-03833983v1
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Qualification methodology for Radio Frequency Integrated Circuit for wireless-based platforms in radiation environments

Antonio Scialdone , Rudy Ferraro , Luigi Dilillo , Frédéric Saigné , Jérôme Boch
RADECS 2022 - European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy
Communication dans un congrès hal-04124165v1
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Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices

Lucas Matana Luza , Frédéric Wrobel , Luis Entrena , Luigi Dilillo
ETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-10, ⟨10.1109/ets54262.2022.9810454⟩
Communication dans un congrès lirmm-03833958v1
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Effects of High-Energy Protons on a Self-Refresh DRAM

Lucas Matana Luza , Carolina Imianosky , André Martins Pio de Mattos , Douglas Almeida dos Santos , Daniel Söderström
SELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects, May 2022, Virtual Event, Italy
Communication dans un congrès lirmm-03832662v1
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Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks

Annachiara Ruospo , Lucas Matana Luza , Alberto Bosio , Marcello Traiola , Luigi Dilillo
LATS 2021 - IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩
Communication dans un congrès lirmm-03435567v1
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Design and Evaluation of Implementation Impact on a Fault-Tolerant Network-on-Chip Router

Douglas Rossi de Melo , Cesar Albenes Zeferino , Eduardo Augusto Bezerra , Luigi Dilillo
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505053⟩
Communication dans un congrès lirmm-03358975v1
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A Model-Based Framework to Assess the Reliability of Safety-Critical Applications

Lucas Matana Luza , Annachiara Ruospo , Alberto Bosio , Ernesto Sanchez , Luigi Dilillo
DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩
Communication dans un congrès hal-03266848v1
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Characterization of a RISC-V System-on-Chip under Neutron Radiation

Douglas Almeida dos Santos , Lucas Matana Luza , Maria Kastriotou , Carlo Cazzaniga , Cesar A Zeferino
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩
Communication dans un congrès lirmm-03357515v1
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Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study

Lucas Matana Luza , Daniel Söderström , André Martins Pio De Mattos , Eduardo Augusto Bezerra , Carlo Cazzaniga
DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
Communication dans un congrès lirmm-03357444v1
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Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

Lucas Matana Luza , Daniel Soderstrom , Helmut Puchner , Ruben Garcia Alia , Manon Letiche
DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩
Communication dans un congrès lirmm-03025721v1
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A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems

Douglas Almeida dos Santos , Lucas Matana Luza , Cesar Albenes Zeferino , Luigi Dilillo , Douglas Rossi de Melo
DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩
Communication dans un congrès lirmm-03026132v1

On-board Compressing of Hyperspectral Images using CCSDS 123

Douglas Almeida dos Santos , Cesar Albenes Zeferino , Eduardo Augusto Bezerra , Luigi Dilillo , Douglas Rossi Melo
Computer on the Beach, Sep 2020, Balneário Camboriú, Brazil. pp.332-336, ⟨10.14210/cotb.v11n1.p332-336⟩
Communication dans un congrès lirmm-03025767v1
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Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

Daniel Soderstrom , Lucas Matana Luza , Heikki Kettunen , Arto Javanainen , Wilfrid Farabolini
NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference, Nov 2020, Santa Fe (virtual), United States
Communication dans un congrès lirmm-03028881v1
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Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

Lucas Matana Luza , Daniel Soderstrom , Georgios Tsiligiannis , Helmut Puchner , Carlo Cazzaniga
DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩
Communication dans un congrès lirmm-03025736v1
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Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash

Viyas Gupta , Alexandre Louis Bosser , Lucas Matana Luza , Daniel Söderström , Arto Javanainen
RADECS 2019 - 30th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France
Communication dans un congrès lirmm-03358989v1
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Analyzing the Error Propagation in a Parameterizable Network-on-Chip Router

Douglas Rossi de Melo , Cesar Zeferino , Luigi Dilillo , Eduardo Augusto Bezerra
LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704580⟩
Communication dans un congrès lirmm-02008414v1
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A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites

Cézar Antônio Rigo , Lucas Matana Luza , Elder Dominghini Tramontin , Victor Martins , Sara Vega Martinez
LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704551⟩
Communication dans un congrès lirmm-02008436v1
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Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory

Lucas Matana Luza , Alexandre Bosser , Viyas Gupta , Arto Javanainen , Ali Mohammadzadeh
DFT 2019 - 32th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2019, Noordwijk, Netherlands. pp.1-6, ⟨10.1109/DFT.2019.8875475⟩
Communication dans un congrès lirmm-03025660v1

COTS Optocoupler radiation qualification process for LHC applications based on mixed-energy neutron irradiations

Rudy Ferraro , Gilles Foucard , Angelo Infantino , Luigi Dilillo , Markus Brugger
RADECS 2019 - 30th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France
Communication dans un congrès hal-03363644v1
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Characterization of a RISC-V Microcontroller Through Fault Injection

Dario Asciolla , Luigi Dilillo , Douglas Almeida dos Santos , Douglas Melo , Alessandra Menicucci
APPLEPIES 2019 - International Conference on Applications in Electronics Pervading Industry, Environment and Society, Sep 2019, Pisa, Italy. pp.91-101, ⟨10.1007/978-3-030-37277-4_11⟩
Communication dans un congrès lirmm-03025657v1
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Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam

Daniel Söderström , Lucas Matana Luza , Alexandre Bosser , Thierry Gil , Kay-Obbe Voss
RADECS 2019 - 30th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France
Communication dans un congrès lirmm-03359010v1
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Design and Implementation of a Flexible Interface for TID Detector

Iacopo Fara , Lucas Matana Luza , Jérôme Boch , Gianluca Furano , Marco Ottavi
IWASI 2019 - 8th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2019, Otranto, Italy. pp.158-162, ⟨10.1109/IWASI.2019.8791299⟩
Communication dans un congrès lirmm-02415559v1

Study of the Impact of the LHC Radiation Environments on the Synergistic Displacement Damage and Ionizing Dose Effect on Electronic Components

Rudy Ferraro , Salvatore Danzeca , Luigi Dilillo , Chiara Cangialosi , Rubén García Alía
RADECS: Radiation Effects on Components and Systems, Sep 2018, Göteborg, Sweden
Communication dans un congrès lirmm-02008384v1
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Enabling deep-space CubeSat missions through state-of-the-art radiation-hardened technologies

Lucas Matana Luza , Cézar Antônio Rigo , Elder Dominghini Tramontin , Victor Manuel Goncalves Martins , Sara Vega Martinez
3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil
Communication dans un congrès lirmm-02008460v1
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Implementation of fault tolerance techniques for integrated network interfaces

Douglas Rossi de Melo , Cesar Zeferino , Antonio Ramos , Luigi Dilillo , Eduardo Augusto Bezerra
3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil
Communication dans un congrès lirmm-02008453v1
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Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cells

Emna Farjallah , Valentin Gherman , Jean-Marc Armani , Luigi Dilillo
DTIS 2018 - 13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, LIRMM, Apr 2018, Taormina, Italy. ⟨10.1109/DTIS.2018.8368578⟩
Communication dans un congrès lirmm-02008214v1
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Refresh frequency reduction of data stored in SSDs based on A-timer and timestamps

Marcelino Seif , Emna Farjallah , Franck Badets , Emna Chabchoub , Christophe Layer
ETS 2017 - 22nd IEEE European Test Symposium, May 2017, Limassol, Cyprus. pp.7968233, ⟨10.1109/ETS.2017.7968233⟩
Communication dans un congrès lirmm-01687675v1
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Improvement of the tolerated raw bit-error rate in NAND Flash-based SSDs with the help of embedded statistics

Valentin Gherman , Emna Farjallah , Jean-Marc Armani , Marcelino Seif , Luigi Dilillo
ITC 2017 - 48th International Test Conference, Oct 2017, Fort Worth, United States. ⟨10.1109/TEST.2017.8242066⟩
Communication dans un congrès lirmm-01582185v1

A calculation method to estimate single event upset cross section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Jérôme Boch
ESREF 2017 - 28th European Symposium on Reliability of Electron devices, Failure physics and analysis, Sep 2017, Bordeaux, France. pp.644-649, ⟨10.1016/j.microrel.2017.07.056⟩
Communication dans un congrès hal-01929212v1

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere
RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland
Communication dans un congrès hal-01929267v1

Comparison of the Effects of Muon and Low-Energy Proton Irradiation on a 65 nm Low-Power SRAM

Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Helmut Puchner
RADECS: Radiation and Its Effects on Components and Systems, Sep 2016, Bremen, Germany
Communication dans un congrès lirmm-01337405v1

The Power Law Shape of Heavy Ions Experimental Cross Section

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Eric Lorfèvre
NSREC: Nuclear and Space Radiation Effects Conference, IEEE NPSS (Nuclear & Plasma Sciences Society ), Jul 2016, Portland, United States
Communication dans un congrès lirmm-01298421v1
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Design of a Radiation Tolerant System for Total Ionizing Dose Monitoring Using Floating Gate and RadFET Dosimeters

Rudy Ferraro , Salvatore Danzeca , Matteo Brucoli , Alessandro Masi , Markus Brugger
TWEPP: Topical Workshop on Electronics for Particle Physics, Sep 2016, Karlsruhe, Germany
Communication dans un congrès lirmm-01382578v1

An effective BIST architecture for power-gating mechanisms in low-power SRAMs

Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel , Leonardo B. Zordan
ISQED 2016 - 17th International Symposium on Quality Electronic Design, Mar 2016, Santa Clara, CA, United States. pp.185-191, ⟨10.1109/ISQED.2016.7479198⟩
Communication dans un congrès lirmm-01457424v1

Muon effects on SRAMs

Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, CNRS - GDR ERRATA, Jun 2016, Paris, France
Communication dans un congrès lirmm-01382532v1

MTCube project: COTS memory SEE ground-test results and in-orbit error rate prediction

Viyas Gupta , Alexandre Louis Bosser , Frédéric Wrobel , Frédéric Saigné , Laurent Dusseau
4S: Small Satellites Systems and Services Symposium, Centre national d'études spatiales (CNES); European Space Agency (ESA), May 2016, La Valletta, Malta
Communication dans un congrès lirmm-01298423v1

Real-Time SRAM Based Particle Detector

Luigi Dilillo , Alexandre Louis Bosser , Viyas Gupta , Frédéric Wrobel , Frédéric Saigné
IWASI: International Workshop on Advances in Sensors and Interfaces, Politecnico di Bari, Jun 2015, Gallipoli, Italy. pp.58-62, ⟨10.1109/IWASI.2015.7184968⟩
Communication dans un congrès lirmm-01238435v1
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Exploring the impact of functional test programs re-used for power-aware testing

Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
DATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.1277-1280, ⟨10.7873/DATE.2015.1031⟩
Communication dans un congrès lirmm-01272937v1

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩
Communication dans un congrès hal-01932433v1

Heavy-ion radiation impact on a 4Mb FRAM under Different Test Conditions

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen
RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365617⟩
Communication dans un congrès lirmm-01238392v1

Impact of Stacked-Layer Structure on SEE Rate of SRAMs

Viyas Gupta , Alexandre Louis Bosser , Georgios Tsiligiannis , Ali Mohammadzadeh , Arto Javanainen
NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States
Communication dans un congrès lirmm-01238384v1

Generic Analytic Expression of Heavy Ion SEU Cross Section Derived from Monte-Carlo Diffusion-Based Prediction Code

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Robert Ecoffet
NSREC: Nuclear and Space Radiation Effects Conference, IEEE / NPSS, Jul 2015, Boston, United States
Communication dans un congrès lirmm-01238388v1

Design-for-Diagnosis Architecture for Power Switches

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.43-48, ⟨10.1109/DDECS.2015.18⟩
Communication dans un congrès lirmm-01272684v1

A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Rudy Ferraro , Christopher Frost
RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365578⟩
Communication dans un congrès lirmm-01238397v1

An effective hybrid fault-tolerant architecture for pipelined cores

Imran Wali , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. ⟨10.1109/ETS.2015.7138733⟩
Communication dans un congrès lirmm-01272730v1

An effective ATPG flow for Gate Delay Faults

Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel , Paolo Bernardi
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127350⟩
Communication dans un congrès lirmm-01272719v1

Proton-Induced SDRAM Cell Degradation

Axel Rodriguez , Frédéric Wrobel , Anne Samaras , Francoise Bezerra , Benjamin Vandevelde
RADECS: Radiation and Its Effects on Components and Systems, Sep 2015, Moscou, Russia. ⟨10.1109/RADECS.2015.7365650⟩
Communication dans un congrès lirmm-01238408v1

An ATPG Flow to Generate Crosstalk-Aware Path Delay Pattern

Anu Asokan , Alberto Bosio , Arnaud Virazel , Luigi Dilillo , Patrick Girard
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2015, Montpellier, France. pp.515-520, ⟨10.1109/ISVLSI.2015.99⟩
Communication dans un congrès lirmm-01272933v1

Scan-chain intra-cell defects grading

Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127349⟩
Communication dans un congrès lirmm-01272696v1

Methods for radiation test of memories

Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS), Jun 2015, Paris, France
Communication dans un congrès lirmm-01238437v1

Single Event Upset Prediction from Heavy Ions Cross Sections with No Parameters

Frédéric Wrobel , Antoine Touboul , Vincent Pouget , Luigi Dilillo , Frédéric Saigné
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès lirmm-01237668v1

Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce

Anu Asokan , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.207-212, ⟨10.1109/DDECS.2014.6868791⟩
Communication dans un congrès lirmm-01248599v1

Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults

Imran Wali , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.223-225, ⟨10.1109/DDECS.2014.6868794⟩
Communication dans un congrès lirmm-01248598v1

SEU Cross Section Calculation Based on Experimental Data of Another kind of Particle

Annelise Touboul , Antoine Touboul , Frédéric Wrobel , V. Pouget , Luigi Dilillo
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès hal-01934616v1

Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration

Yuanqing Cheng , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard
ASP-DAC: Asia and South Pacific Design Automation Conference, Jan 2014, Singapore, Singapore. pp.544-549, ⟨10.1109/ASPDAC.2014.6742948⟩
Communication dans un congrès lirmm-01248596v1

Test of 90nm SRAMs at Concordia Station in Antarctica

Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, GDR ERRATA (CNRS); Institut Carnot STAR (Marseille), Jun 2014, Paris, France
Communication dans un congrès lirmm-01238438v1
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A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise

Anu Asokan , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard
ISVLSI: International Symposium on Very Large Scale Integration, Jul 2014, Tampa, FL, United States. pp.226-231, ⟨10.1109/ISVLSI.2014.42⟩
Communication dans un congrès lirmm-01248592v1

Test and diagnosis of power switches

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Aida Todri-Sanial , Arnaud Virazel
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.213-218, ⟨10.1109/DDECS.2014.6868792⟩
Communication dans un congrès lirmm-01248590v1

Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude Vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation

Tarek Saad Saoud , Soilihi Moindjie , Jean-Luc Autran , Daniela Munteanu , Frédéric Wrobel
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès lirmm-01237717v1

On the Generation of Diagnostic Test Set for Intra-cell Defects

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
ATS: Asian Test Symposium, Nov 2014, Hangzhou, China. pp.312-317, ⟨10.1109/ATS.2014.57⟩
Communication dans un congrès lirmm-01272539v1
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Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components

Alexandre Louis Bosser , Luigi Dilillo , Viyas Gupta , Arto Javanainen , Heikki Kettunen
Physics Days, Finnish Physical Society, Tampere University of Technology (TUT), and Tavicon Ltd., Mar 2014, Tampere, Finland
Communication dans un congrès lirmm-01238439v1
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An intra-cell defect grading tool

Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial , Stefano Bernabovi
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.298-301, ⟨10.1109/DDECS.2014.6868814⟩
Communication dans un congrès lirmm-01248591v1

Timing-aware ATPG for critical paths with multiple TSVs

Carolina Momo Metzler , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.116-121, ⟨10.1109/DDECS.2014.6868774⟩
Communication dans un congrès lirmm-01248600v1

Radiation Study of a 4Mbit Ferroelectric RAM for Space Applications

Helmut Puchner , Georgios Tsiligiannis , Luigi Dilillo
SEE: Single Event Effects, Aeroflex Corporation, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University, May 2014, San Diego, United States
Communication dans un congrès lirmm-01297441v1

Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès lirmm-01237709v1

iBoX — Jitter based Power Supply Noise sensor

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Aida Todri-Sanial , Arnaud Virazel
ETS: European Test Symposium, May 2014, Paderborn, United States. ⟨10.1109/ETS.2014.6847830⟩
Communication dans un congrès lirmm-01248601v1

Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation

Georgios Tsiligiannis , Luigi Dilillo , Viyas Gupta , Alberto Bosio , Patrick Girard
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2014, Paris, France
Communication dans un congrès lirmm-01237660v1

A Comprehensive Evaluation of Functional Programs for Power-Aware Test

Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, ⟨10.1109/NATW.2014.23⟩
Communication dans un congrès lirmm-01248597v1
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TSV aware timing analysis and diagnosis in paths with multiple TSVs

Carolina Momo Metzler , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard
VTS: VLSI Test Symposium, Apr 2014, Napa, CA, United States. ⟨10.1109/VTS.2014.6818772⟩
Communication dans un congrès lirmm-01248594v1
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Presentation of the MTCube CubeSat Project

Viyas Gupta , Luigi Dilillo , Frédéric Wrobel , Ali Mohammad Zadeh , Muriel Bernard
4S Symposium 2014 - Small Satellites Systems and Services, European Space Agency (ESA); Centre National d'Etudes Spatiales (CNES), May 2014, Majorca, Spain
Communication dans un congrès lirmm-01272951v1
Image document

Performance Characterization of TAS-MRAM Architectures in Presence of Capacitive Defects

João Azevedo , Arnaud Virazel , Yuanqing Cheng , Alberto Bosio , Luigi Dilillo
VALID: Advances in System Testing and Validation Lifecycle, Oct 2013, Venice, Italy. pp.39-44
Communication dans un congrès lirmm-01433308v1

Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2013, Bari, Italy. pp.75-80, ⟨10.1109/IWASI.2013.6576070⟩
Communication dans un congrès lirmm-00839046v1

Analyzing resistive-open defects in SRAM core-cell under the effect of process variability

Elena Ioana Vatajelu , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
ETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569373⟩
Communication dans un congrès lirmm-01921630v1

Improving Defect Localization Accuracy by means of Effect-Cause Intra-Cell Diagnosis at Transistor Level

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
SDD: Silicon Debug and Diagnosis, Sep 2013, Anaheim, CA, United States
Communication dans un congrès lirmm-00806872v1

Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures

Elena Ioana Vatajelu , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2013, Abu Dhabi, United Arab Emirates. pp.39-44, ⟨10.1109/DTIS.2013.6527775⟩
Communication dans un congrès lirmm-01248603v1

SEU Monitoring in Mixed-Field Radiation Environments of Particle Accelerators

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937419⟩
Communication dans un congrès lirmm-00839085v1

Worst-Case Power Supply Noise and Temperature Distribution Analysis for 3D PDNs with Multiple Clock Domains

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
NEWCAS: New Circuits and Systems, Jun 2013, Paris, France. ⟨10.1109/NEWCAS.2013.6573628⟩
Communication dans un congrès lirmm-00839042v1
Image document

Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic Mode

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. pp.1-4, ⟨10.1109/RADECS.2013.6937429⟩
Communication dans un congrès lirmm-00839062v1

Effect-Cause Intra-Cell Diagnosis at Transistor Level

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
ISQED 2013 - 14th International Symposium on Quality Electronic Design, Mar 2013, Santa Clara, CA, United States. pp.460-467, ⟨10.1109/ISQED.2013.6523652⟩
Communication dans un congrès lirmm-00817224v1

Fast and Accurate Electro-Thermal Analysis of Three-Dimensional Power Delivery Networks

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, Apr 2013, Wroclaw, Poland. pp.1-4, ⟨10.1109/EuroSimE.2013.6529956⟩
Communication dans un congrès lirmm-00839043v1

Temperature Impact on the Neutron SER of a Commercial 90nm SRAM

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2013, San Francisco, Ca, United States. pp.1-4
Communication dans un congrès lirmm-00805291v1

Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBT

Lionel Foro , Antoine Touboul , Frédéric Wrobel , Paolo Rech , Luigi Dilillo
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937428⟩
Communication dans un congrès lirmm-01237617v1

On the Reuse of Read and Write Assist Circuits to Improve Test Efficiency in Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
ITC: International Test conference, Sep 2013, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2013.6651927⟩
Communication dans un congrès lirmm-00818977v1

A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
VTS: VLSI Test Symposium, Apr 2013, Berkeley, CA, United States. pp.1-6, ⟨10.1109/VTS.2013.6548894⟩
Communication dans un congrès lirmm-00805366v1

Computing Detection Probability of Delay Defects in Signal Line TSVs

Carolina Momo Metzler , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard
ETS: European Test Symposium, May 2013, Avignon, France. ⟨10.1109/ETS.2013.6569349⟩
Communication dans un congrès lirmm-00839044v1

An Integrated Solid Detector For Onboard Detection Of Natural Radiations In Atmosphere

Frédéric Wrobel , Jean-Roch Vaillé , Antoine Touboul , Luigi Dilillo , Frédéric Saigné
iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL synchrotron, Jun 2013, Paris, France
Communication dans un congrès lirmm-01238432v1
Image document

Test Solution for Data Retention Faults in Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
DATE 2013 - 16th Design, Automation and Test in Europe Conference, Mar 2013, Grenoble, France. pp.442-447, ⟨10.7873/DATE.2013.099⟩
Communication dans un congrès lirmm-00805140v1
Image document

Comparison of the transient current shapes obtained with the diffusion model and the double exponential law — Impact on the SER

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Frédéric Saigné
RADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937441⟩
Communication dans un congrès lirmm-01237599v1

A novel method to mitigate TSV electromigration for 3D ICs

Yuanqing Cheng , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard
ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Aug 2013, Natal, Brazil. pp.121-126, ⟨10.1109/ISVLSI.2013.6654633⟩
Communication dans un congrès lirmm-01248617v1

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell

Elena Ioana Vatajelu , Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard
DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩
Communication dans un congrès lirmm-01238413v1

Evaluating An SEU Monitor For Mixed-Field Radiation Environments

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
iWoRID: International Workshop on Radiation Imaging Detectors, SOLEIL Synchrotron, Jun 2013, Paris, France
Communication dans un congrès lirmm-01238433v1

Mitigate TSV Electromigration for 3D ICs - From the Architecture Perspective

Yuanqing Cheng , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard
International Symposium on VLSI, Natale, Brazil. pp.6
Communication dans un congrès lirmm-00839052v1

SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations

Georgios Tsiligiannis , Elena Ioana Vatajelu , Luigi Dilillo , Alberto Bosio , Patrick Girard
IOLTS: International On-Line Testing Symposium, Jul 2013, Chania, Crete, Greece. pp.145-150, ⟨10.1109/IOLTS.2013.6604066⟩
Communication dans un congrès lirmm-00818955v1

A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès lirmm-00805163v1

Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM Architectures

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
JNRDM: Journées Nationales du Réseau Doctoral en Microélectronique, 2012, Paris, France
Communication dans un congrès lirmm-00806827v1

Characteristics of the Transient Currents Induced by Atmospheric Neutrons on a 40nm Electrode of an NMOS Transistor

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Jean-Roch Vaillé , Frédéric Saigné
NSREC: Nuclear and Space Radiation Effects Conference, Jul 2012, Miami, Florida, United States. pp.1-4
Communication dans un congrès lirmm-00805275v1

Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty Measurements

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
Colloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès lirmm-00806859v1

Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
IOLTS: International On-Line Testing Symposium, Jun 2012, Sitges, Spain. pp.212-222, ⟨10.1109/IOLTS.2012.6313853⟩
Communication dans un congrès lirmm-00805373v1

Test and Reliability of Magnetic Random Access Memories

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
GDR SOC-SIP'11: Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès lirmm-00679516v1

Resistive-Open Defect Analysis for Through-Silicon-Vias

Carolina Momo Metzler , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard
DCIS 2012 - 27th Conference on Design of Circuits and Integrated Systems, Nov 2012, Avignon, France
Communication dans un congrès lirmm-00806803v1

Defect Analysis in Power Mode Control Logic of Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
ETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233033⟩
Communication dans un congrès lirmm-00805374v1

Dynamic Mode Testing of SRAMS under Neutron Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
Sixième colloque du GDR SOC-SIP du CNRS, Jun 2012, Paris, France
Communication dans un congrès lirmm-00807053v1

Power Supply Noise Sensor Based on Timing Uncertainty Measurements

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.161-166, ⟨10.1109/ATS.2012.46⟩
Communication dans un congrès lirmm-00806890v1

Dynamic-Stress Neutrons Test of Commercial SRAMs

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné
IEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4
Communication dans un congrès lirmm-00805349v1

Peak Power Estimation: A Case Study on CPU Cores

Paolo Bernardi , Mauricio de Carvalho , Ernesto Sanchez , Matteo Sonza Reorda , Alberto Bosio
IEEE Asian Test Symposium, Nov 2012, Niigata, Japan. pp.167-172, ⟨10.1109/ATS.2012.58⟩
Communication dans un congrès lirmm-00805389v1

Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test Solutions

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
ITC'2012: International Test Conference, Nov 2012, Anaheim, CA, United States. pp.1-10, ⟨10.1109/TEST.2012.6401578⟩
Communication dans un congrès lirmm-00805143v1

SRAM testing under Neutron Radiation for the evaluation of different algorithms stress

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
15ème Journées Nationales du Réseau Doctoral en Microélectronique, Jun 2012, Marseille, France
Communication dans un congrès lirmm-00807054v1

A Silicon Diode Based Detector for the Natural Radiative Environment Measurement in Altitude

Denis Pantel , Jean-Roch Vaillé , Frédéric Wrobel , Luigi Dilillo , Jean-Marc J.-M. Galliere
IEEE (Nuclear Plasma Society) Real Time Conference, Jun 2012, Berkeley, CA, United States. pp.1-6, ⟨10.1109/RTC.2012.6418104⟩
Communication dans un congrès lirmm-00805169v1

Complete Framework for the Estimation of the SRAM Core-Cell Resilience to Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
RADECS: Radiation and its Effects on Components and Systems, Sep 2012, Biarritz, France
Communication dans un congrès hal-01935785v1

Robustness Improvement of Digital Circuits A New Hybrid Fault Tolerant Architecture

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
JNRDM'11: Journées Nationales du Réseau Doctoral de Microélectronique, Paris, France
Communication dans un congrès lirmm-00679509v1

Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
Colloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès lirmm-00806842v1

Through-Silicon-Via Resistive-Open Defect Analysis

Carolina Momo Metzler , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard
ETS: European Test Symposium, May 2012, Annecy, France. ⟨10.1109/ETS.2012.6233037⟩
Communication dans un congrès lirmm-00806848v1

An Error Resilient Platform for Data Transfer and Power Management for a Distributed SRAM-based Neutron Detection Test Bench

Luigi Dilillo
RADSOL: Electronique et rayonnements naturels au niveau du sol, Jun 2012, Paris, France
Communication dans un congrès lirmm-00805398v1

Why and How Controlling Power Consumption During Test: A Survey

Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial , Arnaud Virazel
ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp. 221-226, ⟨10.1109/ATS.2012.30⟩
Communication dans un congrès lirmm-00818984v1

A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès lirmm-00679513v1

Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
Colloque GDR SoC-SiP, 2012, Paris, France
Communication dans un congrès lirmm-00806841v1

Fault Localization Improvement through an Intra-Cell Diagnosis Approach

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
ISTFA 2012 - 38th International Symposium for Testing and Failure Analysis, Nov 2012, Phoenix, AZ, United States. pp.509-519
Communication dans un congrès lirmm-00806863v1

Alpha particle-induced transient currents in 65 nm and 40 nm technologies

Frédéric Wrobel , Luigi Dilillo , Antoine Touboul , Frédéric Saigné
SEE'2012: Single Event Effects Symposium, Apr 2012, San Diego, CA, United States. pp.1
Communication dans un congrès lirmm-00805378v1

Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron Radiation

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Aida Todri-Sanial
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès lirmm-00805165v1

Radiation Induced Effects on Electronic Systems and ICs

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
SETS: South European Test Seminar, Mar 2012, Sauze d'Oulx, Italy
Communication dans un congrès lirmm-00807055v1

Impact of Resistive-Open Defects on the Heat Current of TAS-MRAM Architectures

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
DATE 2012 - 15th Design, Automation and Test in Europe Conference and Exhibition, Mar 2012, Dresden, Germany. pp.532-537, ⟨10.1109/DATE.2012.6176526⟩
Communication dans un congrès lirmm-00689024v1

Advanced Test Methods for SRAMs

Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel
VTS: VLSI Test Symposium, Apr 2012, Hyatt Maui, HI, United States. pp.300-301, ⟨10.1109/VTS.2012.6231070⟩
Communication dans un congrès lirmm-00805049v1

A Pseudo-Dynamic Comparator for Error Detection in Fault Tolerant Architectures

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
VTS: VLSI Test Symposium, Apr 2012, Hawaii, United States. pp.50-55, ⟨10.1109/VTS.2012.6231079⟩
Communication dans un congrès lirmm-00806778v1
Image document

Impact of Resistive-Bridge Defects in TAS-MRAM Architectures

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
ATS: Asian Test Symposium, Nov 2012, Niigata, Japan. pp.125-130, ⟨10.1109/ATS.2012.37⟩
Communication dans un congrès lirmm-00806809v1

Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line Coupling

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France
Communication dans un congrès lirmm-00679522v1
Image document

Electro-Thermal Analysis of 3D Power Delivery Networks

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
DAC: Design Automation Conference, 2012, San Francisco, United States
Communication dans un congrès lirmm-00806836v1

Proton Flux Anisotropy in the Atmosphere: Experiment and Modeling

Frédéric Wrobel , Jean-Roch Vaillé , Denis Pantel , Luigi Dilillo , Jean-Marc J.-M. Galliere
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2012, Biarritz, France. pp.1-4
Communication dans un congrès lirmm-00805150v1
Image document

A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
ATS 2011 - 20th IEEE Asian Test Symposium, Nov 2011, New Delhi, India. pp.136-141, ⟨10.1109/ATS.2011.89⟩
Communication dans un congrès lirmm-00651238v1

On Using Address Scrambling for Defect Tolerance in SRAMs

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
International test Conference, Sep 2011, Anaheim, CA, United States. pp.1-8, ⟨10.1109/TEST.2011.6139149⟩
Communication dans un congrès lirmm-00805334v1

Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling

Kohei Miyase , Yuta Uchinodan , Kazunari Enokimoto , Yuta Yamato , Xiaoqing Wen
ATS: Asian Test Symposium, 2011, New Delhi, India. pp.21-23
Communication dans un congrès lirmm-00651247v1

Optimized March Test Flow for Detecting Memory Faults in SRAM Devices Under Bit Line Coupling

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
DDECS'11: 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits ans Systems, Netherlands. pp.353-358
Communication dans un congrès lirmm-00592182v1

Power-Aware Test Pattern Generation for At-Speed LOS Testing

Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial , Arnaud Virazel
ATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.506-510
Communication dans un congrès lirmm-00651917v1

Power Supply Noise and Ground Bounce Aware Pattern Generation for Delay Testing

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
NEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.73-76, ⟨10.1109/NEWCAS.2011.5981222⟩
Communication dans un congrès lirmm-00647815v1

A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply Noise

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2011, Cottbus, Germany. pp.189-194, ⟨10.1109/DDECS.2011.5783078⟩
Communication dans un congrès lirmm-00592000v1

On Using Address Scrambling to Implement Defect Tolerance in SRAMs

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
ITC'2011: International Test Conference, Sep 2011, Anaheim, CA, United States. pp.N/A
Communication dans un congrès lirmm-00647773v1

Impact of Resistive-Bridging Defects in SRAM Core-Cell

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
DELTA'10: International Symposium on Electronic Design, Test & Applications, Ho Chi Minh, Vietnam. pp.265-270
Communication dans un congrès lirmm-00553592v1

Impact of Atmospheric Neutrons on SRAMs through a Modular Test Bench

Luigi Dilillo
RADSOL - Electronique et rayonnements naturels au niveau du sol, Jun 2011, Paris, France
Communication dans un congrès lirmm-00805407v1

Mapping Test Power to Functional Power through Smart X-Filling for LOS Scheme

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway
Communication dans un congrès lirmm-00651905v1

Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector

Luigi Dilillo , Alberto Bosio , Miroslav Valka , Patrick Girard , Serge Pravossoudovitch
DFT 2011 - International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2011, Vancouver, Canada. pp.294-301, ⟨10.1109/DFT.2011.41⟩
Communication dans un congrès lirmm-00651226v1

Test Relaxation and X-filling to Reduce Peak Power During At-Speed LOS Testing

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès lirmm-00553989v1

Detecting NBTI Induced Failures in SRAM Core-Cells

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
VTS'10: VLSI Test Symposium, Santa Cruz, CA, United States. pp.75-80
Communication dans un congrès lirmm-00553612v1

Failure Analysis and Test Solutions for Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
ATS: Asian Test Symposium, Nov 2011, New Delhi, India. pp.459-460, ⟨10.1109/ATS.2011.97⟩
Communication dans un congrès lirmm-00805123v1

Analysis of Resistive-Open Defects in TAS-MRAM Array

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
ITC: International Test Conference, Sep 2011, Anaheim, CA, United States
Communication dans un congrès lirmm-00679524v1

Robust Structure for Data Collection and Transfer in a Distributed SRAM Based Neutron Test Bench

Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel
Workshop on Dependability Issues in Deep-Submicron Technologies, Trondheim, Norway
Communication dans un congrès lirmm-00651796v1

Simultaneous Power and Thermal Integrity Analysis for 3D Integrated Systems

Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability, Trondheim, Norway
Communication dans un congrès lirmm-00651802v1

A DfT Solution for Oxide Thickness Varitions in ATMEL eFlash Technology

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece
Communication dans un congrès lirmm-00647750v1

Variability Analysis of an SRAM Test Chip

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
ETS: European Test Symposium, May 2011, Trondheim, Norway
Communication dans un congrès lirmm-00651791v1

On using a SPICE-like TSTAC™ eFlash model for design and test

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
DDECS: Design and Diagnostics of Electronic Circuits ans Systems, Apr 2011, Cottbus, Germany. pp.359-370, ⟨10.1109/DDECS.2011.5783111⟩
Communication dans un congrès lirmm-00592203v1

Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece. ⟨10.1109/DTIS.2011.5941434⟩
Communication dans un congrès lirmm-00647760v1

Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM Arrays

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Alessio Griffoni , Frédéric Wrobel
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩
Communication dans un congrès lirmm-00805314v1

A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing

Miroslav Valka , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
ETS 2011 - 16th IEEE European Test Symposium, May 2011, Trondheim, Norway. pp.153-158, ⟨10.1109/ETS.2011.21⟩
Communication dans un congrès lirmm-00647822v1

Analyse et modélisation des défauts résistifs affectant les mémoires Flash

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès lirmm-00553947v1

Versatile March Test Generator for Hands-on Memory Testing Laboratory

Jean-Marc J.-M. Galliere , Luigi Dilillo
MSE: Microelectronic Systems Education, Jun 2011, San Diego, CA, United States. pp.41-42, ⟨10.1109/MSE.2011.5937088⟩
Communication dans un congrès lirmm-00805300v1

Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test Bench

Luigi Dilillo , Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel
IEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6
Communication dans un congrès lirmm-00805120v1

Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron Sensor

Luigi Dilillo , Alberto Bosio , Paolo Rech , Patrick Girard , Frédéric Wrobel
IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. pp.176-180, ⟨10.1109/IWASI.2011.6004712⟩
Communication dans un congrès lirmm-00805394v1

Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
JNRDM'10 : Journées Nationales du Réseau Doctoral de Microélectronique, Montpellier, France
Communication dans un congrès lirmm-00553935v1

Tolérance aux fautes et rendement de fabrication

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
GDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès lirmm-00553995v1

X-Identification of Transition Delay Fault Tests for Launch-off Shift Scheme

Kohei Miyase , Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard
WRTLT'10: 11th IEEE Workshop On RTL and High Level Testing, Shanghai, China. pp.N/A
Communication dans un congrès lirmm-00566869v1

Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power Devices

Alessio Griffoni , Jeroen van Duivenbode , Dimitri Linten , Eddy Simoen , Paolo Rech
RADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.226-231, ⟨10.1109/RADECS.2011.6131395⟩
Communication dans un congrès lirmm-00805339v1
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Setting Test Conditions for Improving SRAM Reliability

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.257-262
Communication dans un congrès lirmm-00492741v1

Setting Test Conditions for Detecting Faults Induced by Random Dopant Fluctuation in SRAM Core-Cells

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
VARI: Workshop on CMOS Variability, 2010, Montpellier, France
Communication dans un congrès lirmm-00553626v1

Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
LPonTR: 
Impact of Low-Power design on Test and Reliability, May 2010, Prague, Czech Republic
Communication dans un congrès lirmm-00553930v1

A Comprehensive System-on-Chip Logic Diagnosis

Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
ATS: Asian Test Symposium, 2010, Shanghai, China. pp.237-242
Communication dans un congrès lirmm-00545131v1

A Statistical Simulation Method for Reliability Analysis of SRAM Core-Cells

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
DAC: Design Automation Conference, Jun 2010, Anaheim, United States. pp.853-856
Communication dans un congrès lirmm-00553619v1

Analysis of Power Consumption and Transition Fault Coverage for LOS and LOC Testing Schemes

Wu Fangmei , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
DDECS'10: 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2010, Vienna, Austria. pp.376-381
Communication dans un congrès lirmm-00475734v1

A Memory Fault Simulator for Radiation-Induced Effects in SRAMs

Paolo Rech , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel
ATS: Asian Test Symposium, 2010, Shanghai, China. pp.100-105
Communication dans un congrès lirmm-00545102v1

Impact of Resistive-Open Defects on SRAM sensitivity to Soft Errors

Paolo Rech , Jean-Marc J.-M. Galliere , Patrick Girard , Frédéric Wrobel , Frédéric Saigné
RADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria
Communication dans un congrès lirmm-00566847v1

Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts

Paolo Rech , Michelangelo Grosso , Fabio Melchiori , Domenico Loparco , Davide Appello
IOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. pp.29-34, ⟨10.1109/IOLTS.2010.5560236⟩
Communication dans un congrès lirmm-00559034v1
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Analysis of Resistive-Bridging Defects in SRAM Core-Cells: a Comparative Study from 90nm down to 40nm Technology Nodes

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.132-137
Communication dans un congrès lirmm-00493236v1
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A Two-Layer SPICE Model of the ATMEL TSTAC eFlash Memory Technology for Defect Injection and Faulty Behavior Prediction

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
ETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.81-86
Communication dans un congrès lirmm-00493204v1

Delay Fault Diagnosis in Sequential Circuits

Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
ATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. pp.355-360
Communication dans un congrès lirmm-00406968v1

Using TMR Architectures for SoC Yield Improvement

Julien Vial , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
VALID'09: The First International Conference on Advances in System Testing and Validation Lifecycle, 2009, Porto, Portugal. pp.155-160
Communication dans un congrès lirmm-00406967v1

A Fault-Simulation-Based Approach for Logic Diagnosis

Youssef Benabboud , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2009, Cairo, Egypt. pp.216-221
Communication dans un congrès lirmm-00371377v1
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Neutron Detection through an SRAM-Based Test Bench

Luigi Dilillo , Frédéric Wrobel , Jean-Marc J.-M. Galliere , Frédéric Saigné
IWASI'09: International Workshop On Advances in Sensors and Interfaces, Jun 2009, Trani, Italy. pp.64-69, ⟨10.1109/IWASI.2009.5184769⟩
Communication dans un congrès lirmm-00438842v1

Influence of Gate Oxide Short Defects on the Stability of Minimal Sized SRAM Core-Cell by Applying Non-Split Models

Jean-Marc J.-M. Galliere , Florence Azaïs , Michel Renovell , Luigi Dilillo
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2009, Cairo, Egypt. pp.225-229
Communication dans un congrès lirmm-00370798v1

Comprehensive Bridging Fault Diagnosis based on the SLAT Paradigm

Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
DDECS'09: 12th IEEE Symposium on Design and Diagnostics of Electronic Systems, pp.264-269
Communication dans un congrès lirmm-00371198v1

Trade-off Between Power Dissipation and Delay Fault Coverage For LOS and LOC Testing Schemes

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
Impact of Low-Power Design on Test and Reliability, Spain
Communication dans un congrès lirmm-00435005v1
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A New Design-for-Test Technique for SRAM Core-Cell Stability Faults

Alexandre Ney , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel
DATE: Design, Automation and Test in Europe, Apr 2009, Nice, France. pp.1344-1348, ⟨10.1109/DATE.2009.5090873⟩
Communication dans un congrès lirmm-00371374v1

Use of BOBST for the Detection of Neutrons Induced Errors in SRAM

Luigi Dilillo , Frédéric Wrobel , Jean-Marc J.-M. Galliere , F. Saigné
IWASI: International Workshop on Advances in Sensors and Interfaces, Jun 2009, Trani, Italy
Communication dans un congrès hal-01957246v1

A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs

Alexandre Ney , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
ITC'2008: International Test Conference, Oct 2008, Santa Clara, CA, United States. pp.1-10, ⟨10.1109/TEST.2008.4700555⟩
Communication dans un congrès lirmm-00341798v1

Impact of Technology Scaling on Defects and Parameter Deviations in Embedded SRAMs

Luigi Dilillo , Patrick Girard , Christian Landrault , Serge Pravossoudovitch , Arnaud Virazel
VLSI Test Symposium, Apr 2008, San Diego, California, United States. pp.336
Communication dans un congrès lirmm-00324151v1
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A Signature-based Approach for Diagnosis of Dynamic Faults in SRAMs

Alexandre Ney , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Mar 2008, Tunis, Tunisia. pp.001-006, ⟨10.1109/DTIS.2008.4540243⟩
Communication dans un congrès lirmm-00324143v1

A History-Based Technique for Faults Diagnosis in SRAMs

Alexandre Ney , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
Colloque GDR SoC-SiP, France
Communication dans un congrès lirmm-00341821v1

March CRF: an Efficient Test for Complex Read Faults in SRAM Memories

Luigi Dilillo , Bashir M. Al Hashimi
DDECS: Design and Diagnostics of Electronic Circuits and Systems, IEEE, Apr 2007, Cracovie, Poland. ⟨10.1109/DDECS.2007.4295276⟩
Communication dans un congrès lirmm-01239052v1

March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit

Luigi Dilillo , Patrick Girard , Magali Bastian Hage-Hassan , Serge Pravossoudovitch , Arnaud Virazel
DDECS'06: Design and Diagnostics of Electronic Circuits and Systems, Apr 2006, Prague, République Tchèque, pp.256-261
Communication dans un congrès lirmm-00134776v1
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Minimizing Test Power in SRAM through Pre-charge Activity Reduction

Luigi Dilillo , Paul Rosinger , Patrick Girard , Bashir Al-Hashimi
DATE: Design, Automation and Test in Europe, Mar 2006, Munich, Germany. pp.1159-1165, ⟨10.1109/DATE.2006.244016⟩
Communication dans un congrès lirmm-00137598v1

Leakage Read Fault in Nanoscale SRAM: Analysis, Test and Diagnosis

Luigi Dilillo , Bashir Al-Hashimi , Paul Rosinger , Patrick Girard
IDT'06: IEEE International Design and Test Workshop, Nov 2006, Dubai, United Arab Emirates. pp.110-115
Communication dans un congrès lirmm-00137603v1
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Data Retention Fault in SRAM Memories: Analysis and Detection Procedures

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
VTS 2005 - 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA, United States. pp.183-188, ⟨10.1109/VTS.2005.37⟩
Communication dans un congrès lirmm-00105995v1

Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison between 0.13μm and 90nm Technologies

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
DAC: Design Automation Conference, May 2005, Anaheim, CA, United States. pp.857-862, ⟨10.1145/1065579.1065804⟩
Communication dans un congrès lirmm-00106558v1

Resistive-Open Defect Injection in SRAM Core-Cell: Analysis and Comparison Between 0.13 um and 90 nm Technologies

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
DAC: Design Automation Conference, Jun 2005, Anaheim, CA, United States. pp.857-862
Communication dans un congrès lirmm-00136906v1

Incidence des Défauts Résistifs dans les Circuits de Précharge des Mémoires SRAM

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
JNRDM 2005 - 8e Journées Nationales du Réseau Doctoral de Microélectronique, May 2005, Paris, France
Communication dans un congrès lirmm-00106529v1

Resistive-Open Defect Influence in SRAM Pre-Charge Circuits: Analysis and Characterization

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
ETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.116-121, ⟨10.1109/ETS.2005.33⟩
Communication dans un congrès lirmm-00106010v1
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Efficient Test of Dynamic Read Destructive Faults in SRAM Memories

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Magali Bastian Hage-Hassan
LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.40-45
Communication dans un congrès lirmm-00106515v1
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An A/D Interface for Resonant Piezoresistive MEMS Sensor

Luigi Dilillo , Vincent Beroulle , Norbert Dumas , Laurent Latorre , Pascal Nouet
ISIE 2004 - IEEE International Symposium on Industrial Electronics, May 2004, Ajaccio, France. pp.83-88, ⟨10.1109/ISIE.2004.1571786⟩
Communication dans un congrès lirmm-00108896v1
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March iC-: An Improved Version of March C- for ADOFs Detection

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri
VTS: VLSI Test Symposium, Apr 2004, Napa Valley, CA, United States. pp.129-134, ⟨10.1109/VTEST.2004.1299236⟩
Communication dans un congrès lirmm-00108772v1
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Test March pour la Détection des Fautes Dynamiques dans les Décodeurs de Mémoires SRAM

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri
JNRDM'04 : 7ièmes Journées Nationales du Réseau Doctoral de Microélectronique, May 2004, Marseille, France. pp.495-497
Communication dans un congrès lirmm-00108644v1
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Dynamic Read Destructive Faults in Embedded-SRAMs: Analysis and March Test Solution

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri
ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.140-145
Communication dans un congrès lirmm-00108795v1
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Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri
ATS: Asian Test Symposium, Nov 2004, Kenting, Taiwan. pp.266-271
Communication dans un congrès lirmm-00108800v1
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March Tests Improvements for Address Decoder Open and Resistive Open Fault Detection

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri
LATW: Latin American Test Workshop, Mar 2004, Cartagena, Colombia. pp.31-36
Communication dans un congrès lirmm-00108642v1

Comparison of open and resistive-open defect test conditions in SRAM address decoders

Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel , Simone Borri
ATS: Asian Test Symposium, Nov 2003, Xian, China. pp.250-255, ⟨10.1109/ATS.2003.1250818⟩
Communication dans un congrès lirmm-01238821v1
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Machine learning application to space particle discrimination from multiple-cell upsets in a memory device

Andrea Coronetti , Lucas Matana Luza , Sanaa Barik , Alexandre Bosser , Ruben Garcia Alia
RADECS 2022 - European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy. , 2022
Poster de conférence lirmm-03837246v1
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A Performance Evaluation of a Fault-tolerant RISC-V with Vector Instruction Support to Space Applications

Carolina Imianosky , Douglas Almeida dos Santos , Douglas Rossi de Melo , Luigi Dilillo , Cesar Albenes Zeferino
LASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022
Poster de conférence lirmm-03834121v1
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Assessing the Reliability of a Network-on-Chip through Physical Validation

Gustavo S. Mafra , Thiago H. Rausch , Douglas Almeida dos Santos , Luigi Dilillo , Eduardo Augusto Bezerra
LASSS/LACW 2022 - Joint 3rd IAA Latin American Symposium on Small Satellites and 5th IAA Latin American CubeSat Workshop, Nov 2022, Brasilia, Brazil. , 2022
Poster de conférence lirmm-03834119v1
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Technology Dependence of Stuck Bits and Single Event Upsets in 110, 72, and 63-nm SDRAMs

Daniel Söderström , Lucas Matana Luza , André Martins Pio de Mattos , Thierry Gil , Heikki Kettunen
RADECS 2022 - RADiation and its Effects on Components and Systems, Oct 2022, Venice, Italy. , 2022
Poster de conférence lirmm-03834026v1

Interconnection Architecture for Dependable Multicore Systems

Douglas Rossi de Melo , Cesar Zeferino , Luigi Dilillo , Eduardo Augusto Bezerra
PhD Forum - 26th IFIP/IEEE International Conference on Very Large Scale Integration, Oct 2018, Torino, Italy. 2018
Poster de conférence lirmm-02008476v1

Fault-Effect Propagation Based Intra-cell Scan Chain Diagnosis

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
Colloque GDR SoC-SiP, Jun 2013, Lyon, France. 2013
Poster de conférence lirmm-00839113v1

Performance Evaluation of Capacitive defects on TAS-MRAMs

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
Colloque GDR SoC-SiP, 2013, Lyon, France. 2013
Poster de conférence lirmm-00839093v1

Investigating Multiple-Cell-Upsets on a 90mn SRAM

Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
Colloque GDR SoC-SiP, 2013, Lyon, France. 2013
Poster de conférence lirmm-00839108v1

Resistive Open Defect Analysis for Through-Silicon-Vias

Carolina Momo Metzler , Aida Todri-Sanial , Arnaud Virazel , Alberto Bosio , Luigi Dilillo
ETS: European Test Symposium, May 2012, Annecy, France. 17th IEEE European Test Symposium, pp.183, 2012
Poster de conférence lirmm-00806795v1

Coupling-Based Resistive-Open Defects in TAS-MRAM Architectures

João Azevedo , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
ETS: European Test Symposium, May 2012, Annecy, France. Test Symposium (ETS), 2012 17th IEEE European, 2012, ⟨10.1109/ETS.2012.6233034⟩
Poster de conférence lirmm-00806793v1

A Roaming Memory Test Bench for Detecting Particle Induced SEUs

Jean-Marc J.-M. Galliere , Paolo Rech , Patrick Girard , Luigi Dilillo
ITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩
Poster de conférence lirmm-00537879v1

Is Test Power Reduction Through X-Filling Good Enough?

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. 2010
Poster de conférence lirmm-00537926v1

Parity Prediction Synthesis for Nano-Electronic Gate Designs

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
ITC'2010: International Test Conference, Nov 2010, Austin, Texas, United States. pp.N/A, 2010
Poster de conférence lirmm-00537938v1

Test des Mémoires FLASH NAND

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
Colloque GDR SoC-SiP, France. 2009
Poster de conférence lirmm-00433770v1

Analysis of Resistive-Bridging Defects in SRAM Core-Cell: Impact within the Core-Cell and in the Memory Array

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
ETS: European Test Symposium, May 2009, Sevilla, Spain. 14th IEEE European Test Symposium, 2009
Poster de conférence lirmm-00433796v1

SoC Yield Improvement for Future Nanoscale Technologies

Julien Vial , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
ETS 2009 - 14th IEEE European Test Symposium | PhD Forum, May 2009, Sevilla, Spain. 2009
Poster de conférence lirmm-00433798v1

A Logic Diagnosis Approach for Sequential Circuits

Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch
ETS 2009 - 14th IEEE European Test Symposium, May 2009, Sevilla, Spain. , 2009, Ph. D. Forum
Poster de conférence lirmm-00433792v1

SRAM Core-cell Quality Metrics

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
GDR SOC SIP, France. 2009
Poster de conférence lirmm-00434962v1

Trade-off Between Power Dissipation and Delay Fault Coverage for LOS and LOC Testing Schemes

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch
GDR SOC SIP, France. 2009
Poster de conférence lirmm-00434959v1

NAND Flash Testing: A Preliminary Study on Actual Defects

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard
ITC: International Test Conference, Nov 2009, Austin, TX, United States. 2009, ⟨10.1109/TEST.2009.5355898⟩
Poster de conférence lirmm-00433765v1

Space Radiation Effects in Electronics

Luigi Dilillo , Alexandre Louis Bosser , Arto Javanainen , Ari Virtanen
Rad-hard Semiconductor Memories, Series in Electronic Materials and Devices, River Publishers, pp.1-56, 2018, 9788770220200
Chapitre d'ouvrage lirmm-02007913v1

Electromigration Alleviation Techniques for 3D Integrated Circuits

Yuanqing Cheng , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard
Chao Wang. High Performance Computing for Big Data: Methodologies and Applications, CRC Press, pp.37-58, 2017, 9781498783996
Chapitre d'ouvrage lirmm-01800220v1