CV Accueil - Archive ouverte HAL

	Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption Paolo Bernardi , Mauricio de Carvalho , Ernesto Sanchez , Matteo Sonza Reorda , Alberto Bosio Journal of Low Power Electronics, 2013, 9 (2), pp.253-263. ⟨10.1166/jolpe.2013.1259⟩ Article dans une revue lirmm-00934937v1

	Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems Lucas Matana Luza , Daniel Soderstrom , Georgios Tsiligiannis , Helmut Puchner , Carlo Cazzaniga DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩ Communication dans un congrès lirmm-03025736v1
	Peak Power Estimation: A Case Study on CPU Cores Paolo Bernardi , Mauricio de Carvalho , Ernesto Sanchez , Matteo Sonza Reorda , Alberto Bosio IEEE Asian Test Symposium, Nov 2012, Niigata, Japan. pp.167-172, ⟨10.1109/ATS.2012.58⟩ Communication dans un congrès lirmm-00805389v1

Luigi Dilillo