- 11
- 4
LD
Luigi Dilillo
15
Documents
Identifiants chercheurs
- luigi-dilillo
- IdRef : 18891885X
- 0000-0002-1295-2688
Présentation
Publications
- 4
- 3
- 3
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 15
- 12
- 10
- 9
- 8
- 4
- 3
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 2
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 1
- 15
- 5
- 1
- 1
- 3
- 6
- 4
Gate voltage contribution to neutron-induced SEB of Trench Gate Fieldstop IGBTRADECS: Radiation and Its Effects on Components and Systems, Sep 2013, Oxford, United Kingdom. ⟨10.1109/RADECS.2013.6937428⟩
Communication dans un congrès
lirmm-01237617v1
|
|
Dynamic-Stress Neutrons Test of Commercial SRAMsIEEE Nuclear and Space Radiation Effects Conference, Jul 2012, Las Vegas, NV, United States. pp.1-4
Communication dans un congrès
lirmm-00805349v1
|
|
Neutron-Induced Multiple Bit Upsets on Dynamically-Stressed Commercial SRAM ArraysRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.274-280, ⟨10.1109/RADECS.2011.6131396⟩
Communication dans un congrès
lirmm-00805314v1
|
|
Neutron-Induced Failure in Super-Junction, IGBT, and SiC Power DevicesRADECS: Radiation and Its Effects on Components and Systems, Sep 2011, Seville, Spain. pp.226-231, ⟨10.1109/RADECS.2011.6131395⟩
Communication dans un congrès
lirmm-00805339v1
|
|
Neutron Detection in Atmospheric Environment through Static and Dynamic SRAM-Based Test BenchIEEE Latin American test Workshop, Mar 2011, Porto de Galinhas, Brazil. pp.1-6
Communication dans un congrès
lirmm-00805120v1
|
|
Robust Data Collection and Transfer Framework for a Distributed SRAM Based Neutron SensorIEEE International Workshop on Advances in Sensors and Interfaces, Jun 2011, Savelletri di Fasano, Italy. pp.176-180, ⟨10.1109/IWASI.2011.6004712⟩
Communication dans un congrès
lirmm-00805394v1
|
|
Impact of Resistive-Open Defects on SRAM sensitivity to Soft ErrorsRADECS: European Conference on Radiation and Its Effects on Components and Systems, Sep 2010, Langenfeld, Austria
Communication dans un congrès
lirmm-00566847v1
|
|
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell LayoutsIOLTS: International On-Line Testing Symposium, Jul 2010, Corfu, Greece. pp.29-34, ⟨10.1109/IOLTS.2010.5560236⟩
Communication dans un congrès
lirmm-00559034v1
|
|
A Memory Fault Simulator for Radiation-Induced Effects in SRAMsATS: Asian Test Symposium, 2010, Shanghai, China. pp.100-105
Communication dans un congrès
lirmm-00545102v1
|
A Roaming Memory Test Bench for Detecting Particle Induced SEUsITC 2010 - International Test Conference, Nov 2010, Austin, TX, United States. 2010, ⟨10.1109/TEST.2010.5699302⟩
Poster de conférence
lirmm-00537879v1
|