CV Accueil - Archive ouverte HAL

	A Comprehensive System-on-Chip Logic Diagnosis Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch ATS: Asian Test Symposium, 2010, Shanghai, China. pp.237-242 Communication dans un congrès lirmm-00545131v1
	A Fault-Simulation-Based Approach for Logic Diagnosis Youssef Benabboud , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch , Arnaud Virazel DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2009, Cairo, Egypt. pp.216-221 Communication dans un congrès lirmm-00371377v1
	Delay Fault Diagnosis in Sequential Circuits Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch ATS: Asian Test Symposium, Nov 2009, Taichung, Taiwan. pp.355-360 Communication dans un congrès lirmm-00406968v1
	Comprehensive Bridging Fault Diagnosis based on the SLAT Paradigm Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel DDECS'09: 12th IEEE Symposium on Design and Diagnostics of Electronic Systems, pp.264-269 Communication dans un congrès lirmm-00371198v1

	A Logic Diagnosis Approach for Sequential Circuits Youssef Benabboud , Alberto Bosio , Luigi Dilillo , Patrick Girard , Serge Pravossoudovitch ETS 2009 - 14th IEEE European Test Symposium, May 2009, Sevilla, Spain. , 2009, Ph. D. Forum Poster de conférence lirmm-00433792v1

Luigi Dilillo