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	Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩ Article dans une revue lirmm-02007922v1

	Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash Viyas Gupta , Alexandre Louis Bosser , Lucas Matana Luza , Daniel Söderström , Arto Javanainen RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745668⟩ Communication dans un congrès lirmm-03358989v1
	Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland Communication dans un congrès hal-01929267v1
	Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs Alexandre Louis Bosser , Viyas Gupta , Georgios Tsiligiannis , Arto Javanainen , Heikki Kettunen NSREC: Nuclear and Space Radiation Effects Conference, Jul 2015, Boston, MA, United States. ⟨10.1109/TNS.2015.2496874⟩ Communication dans un congrès hal-01932433v1

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