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LD

Luigi Dilillo

7
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849041
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Exploring the impact of functional test programs re-used for power-aware testing

Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
DATE 2015 - 18th Design, Automation and Test in Europe Conference and Exhibition, Mar 2015, Grenoble, France. pp.1277-1280, ⟨10.7873/DATE.2015.1031⟩
Communication dans un congrès lirmm-01272937v1

An effective ATPG flow for Gate Delay Faults

Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel , Paolo Bernardi
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127350⟩
Communication dans un congrès lirmm-01272719v1

Scan-chain intra-cell defects grading

Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Arnaud Virazel
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, Apr 2015, Naples, Italy. ⟨10.1109/DTIS.2015.7127349⟩
Communication dans un congrès lirmm-01272696v1
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An intra-cell defect grading tool

Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial , Stefano Bernabovi
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.298-301, ⟨10.1109/DDECS.2014.6868814⟩
Communication dans un congrès lirmm-01248591v1

A Comprehensive Evaluation of Functional Programs for Power-Aware Test

Aymen Touati , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial
NATW: North Atlantic Test Workshop, May 2014, Johnson City, NY, United States. pp.69-72, ⟨10.1109/NATW.2014.23⟩
Communication dans un congrès lirmm-01248597v1

Peak Power Estimation: A Case Study on CPU Cores

Paolo Bernardi , Mauricio de Carvalho , Ernesto Sanchez , Matteo Sonza Reorda , Alberto Bosio
IEEE Asian Test Symposium, Nov 2012, Niigata, Japan. pp.167-172, ⟨10.1109/ATS.2012.58⟩
Communication dans un congrès lirmm-00805389v1