- 6
LD
Luigi Dilillo
6
Documents
Identifiants chercheurs
- luigi-dilillo
- IdRef : 18891885X
- 0000-0002-1295-2688
Présentation
Publications
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Analysis and Fault Modeling of Actual Resistive Defects in ATMELtm eFlash MemoriesJournal of Electronic Testing: : Theory and Applications, 2012, 28 (2), pp.215-228. ⟨10.1007/s10836-012-5277-4⟩
Article dans une revue
lirmm-00806773v1
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A DfT Solution for Oxide Thickness Varitions in ATMEL eFlash TechnologyDTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece
Communication dans un congrès
lirmm-00647750v1
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On using a SPICE-like TSTAC™ eFlash model for design and testDDECS: Design and Diagnostics of Electronic Circuits ans Systems, Apr 2011, Cottbus, Germany. pp.359-370, ⟨10.1109/DDECS.2011.5783111⟩
Communication dans un congrès
lirmm-00592203v1
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Analyse et modélisation des défauts résistifs affectant les mémoires FlashGDR SOC-SIP'10 : Colloque GDR SoC-SiP, Cergy, France
Communication dans un congrès
lirmm-00553947v1
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A Two-Layer SPICE Model of the ATMEL TSTAC eFlash Memory Technology for Defect Injection and Faulty Behavior PredictionETS: European Test Symposium, May 2010, Prague, Czech Republic. pp.81-86
Communication dans un congrès
lirmm-00493204v1
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NAND Flash Testing: A Preliminary Study on Actual DefectsITC: International Test Conference, Nov 2009, Austin, TX, United States. 2009, ⟨10.1109/TEST.2009.5355898⟩
Poster de conférence
lirmm-00433765v1
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