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	Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs Daniel Söderström , Lucas Matana Luza , André Martins Pio de Mattos , Thierry Gil , Heikki Kettunen IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.1861-1869. ⟨10.1109/TNS.2023.3295435⟩ Article dans une revue hal-04192915v1
	Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere IEEE Transactions on Nuclear Science, 2018, 65 (8), pp.1708-1714. ⟨10.1109/TNS.2018.2797543⟩ Article dans une revue lirmm-02007922v1

	Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam Daniel Söderström , Lucas Matana Luza , Alexandre Bosser , Thierry Gil , Kay-Obbe Voss RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745715⟩ Communication dans un congrès lirmm-03359010v1
	Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random- Access Memory Alexandre Louis Bosser , Viyas Gupta , Arto Javanainen , Georgios Tsiligiannis , Stephen D. Lalumondiere RADECS: Radiation and Its Effects on Components and Systems, Oct 2017, Genève, Switzerland Communication dans un congrès hal-01929267v1

	Technology Dependence of Stuck Bits and Single Event Upsets in 110, 72, and 63-nm SDRAMs Daniel Söderström , Lucas Matana Luza , André Martins Pio de Mattos , Thierry Gil , Heikki Kettunen RADECS 2022 - RADiation and its Effects on Components and Systems, Oct 2022, Venice, Italy. , 2022 Poster de conférence lirmm-03834026v1

Luigi Dilillo