Luigi Dilillo

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	Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cells Emna Farjallah , Valentin Gherman , Jean-Marc Armani , Luigi Dilillo DTIS 2018 - 13th International Conference on Design and Technology of Integrated Systems in Nanoscale Era, LIRMM, Apr 2018, Taormina, Italy. ⟨10.1109/DTIS.2018.8368578⟩ Communication dans un congrès lirmm-02008214v1