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Luigi Dilillo
12
Documents
Identifiants chercheurs
luigi-dilillo- IdRef : 18891885X
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0000-0002-1295-2688
Présentation
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Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMsIEEE Transactions on Nuclear Science, 2023, 70 (8), pp.1861-1869. ⟨10.1109/TNS.2023.3295435⟩
Article dans une revue
hal-04192915v1
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Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural NetworksIEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882. ⟨10.1109/TETC.2021.3116999⟩
Article dans une revue
lirmm-03382380v1
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Neutron-Induced Effects on a Self-Refresh DRAMMicroelectronics Reliability, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩
Article dans une revue
lirmm-03435635v1
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Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian EnvironmentIEEE Transactions on Nuclear Science, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩
Article dans une revue
lirmm-03358914v1
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Effects of High-Energy Protons on a Self-Refresh DRAMSELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects, May 2022, Virtual Event, Italy
Communication dans un congrès
lirmm-03832662v1
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Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative StudyDTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩
Communication dans un congrès
lirmm-03357444v1
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Effects of Thermal Neutron Irradiation on a Self-Refresh DRAMDTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩
Communication dans un congrès
lirmm-03025721v1
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Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian EnvironmentNSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference, Nov 2020, Santa Fe (virtual), United States
Communication dans un congrès
lirmm-03028881v1
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Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing SystemsDFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩
Communication dans un congrès
lirmm-03025736v1
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Stuck and Weakened Bits in SDRAM from a Heavy-Ion MicrobeamRADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745715⟩
Communication dans un congrès
lirmm-03359010v1
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Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND FlashRADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745668⟩
Communication dans un congrès
lirmm-03358989v1
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