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Luigi Dilillo

29

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luigi-dilillo
IdRef : 18891885X
0000-0002-1295-2688

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Publications

lucas-matana-luza

	Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-V André M P Mattos , Douglas A Santos , Lucas M Luza , Viyas Gupta , Thomas Borel IEEE Transactions on Nuclear Science, inPress, ⟨10.1109/tns.2024.3378668⟩ Article dans une revue hal-04526731v1
	Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs Daniel Söderström , Lucas Matana Luza , André Martins Pio de Mattos , Thierry Gil , Heikki Kettunen IEEE Transactions on Nuclear Science, 2023, 70 (8), pp.1861-1869. ⟨10.1109/TNS.2023.3295435⟩ Article dans une revue hal-04192915v1
	A Survey on Deep Learning Resilience Assessment Methodologies Annachiara Ruospo , Ernesto Sanchez , Lucas Matana Luza , Luigi Dilillo , Marcello Traiola Computer, 2023, 56, pp.57-66. ⟨10.1109/MC.2022.3217841⟩ Article dans une revue lirmm-03834128v1
	Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks Lucas Matana Luza , Annachiara Ruospo , Daniel Soderstrom , Carlo Cazzaniga , Maria Kastriotou IEEE Transactions on Emerging Topics in Computing, 2022, 10 (4), pp.1867-1882. ⟨10.1109/TETC.2021.3116999⟩ Article dans une revue lirmm-03382380v1
	Neutron-Induced Effects on a Self-Refresh DRAM Lucas Matana Luza , Daniel Söderström , Helmut Puchner , Rubén García Alía , Manon Letiche Microelectronics Reliability, 2022, 128, pp.#114406. ⟨10.1016/j.microrel.2021.114406⟩ Article dans une revue lirmm-03435635v1
	Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment Daniel Söderström , Lucas Matana Luza , Heikki Kettunen , Arto Javanainen , Wilfrid Farabolini IEEE Transactions on Nuclear Science, 2021, 68 (5), pp.716-723. ⟨10.1109/TNS.2021.3068186⟩ Article dans une revue lirmm-03358914v1
	On the evaluation of FPGA radiation benchmarks Gaetan Bricas , Georgios Tsiligiannis , Antoine Touboul , Jérôme Boch , Maria Kastriotou Microelectronics Reliability, 2021, 126, pp.#114276. ⟨10.1016/j.microrel.2021.114276⟩ Article dans une revue lirmm-03382368v1
	Reliability analysis of a fault-tolerant RISC-V system-on-chip Douglas Almeida dos Santos , Lucas Matana Luza , Luigi Dilillo , Cesar Albenes Zeferino , Douglas Rossi de Melo Microelectronics Reliability, 2021, 125, pp.#114346. ⟨10.1016/j.microrel.2021.114346⟩ Article dans une revue lirmm-03358839v1

	Hybrid Radiation Hardening Approach: a RISC-V System-on-Chip case study Luigi Dilillo , Douglas Almeida dos Santos , Lucas Matana Luza , André Martins Pio de Mattos , Douglas Rossi de Melo G-RADNEXT Workshop, Nov 2023, Geneva, Switzerland Communication dans un congrès hal-04296178v1
	Radiation-induced SEL in a COTS SRAM memory - test and flight data Douglas Almeida dos Santos , Lucas Matana Luza , André Martins Pio de Mattos , Thomas Borel , Viyas Gupta TEC-QEC Final Presentation Days, Jun 2023, Noordwijk, Netherlands Communication dans un congrès hal-04295893v1
	Effects of High-Energy Protons on a Self-Refresh DRAM Lucas Matana Luza , Carolina Imianosky , André Martins Pio de Mattos , Douglas Almeida dos Santos , Daniel Söderström SELSE 2022 - 18th IEEE Workshop on Silicon Errors in Logic – System Effects, May 2022, Virtual Event, Italy Communication dans un congrès lirmm-03832662v1
	Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices Lucas Matana Luza , Frédéric Wrobel , Luis Entrena , Luigi Dilillo ETS 2022 - 27th IEEE European Test Symposium, May 2022, Barcelona, Spain. pp.1-10, ⟨10.1109/ets54262.2022.9810454⟩ Communication dans un congrès lirmm-03833958v1
	Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip Douglas Almeida dos Santos , André Martins Pio de Mattos , Lucas Matana Luza , Carlo Cazzaniga , Maria Kastriotou DFT 2022 - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2022, Austin, United States. pp.1-6, ⟨10.1109/DFT56152.2022.9962335⟩ Communication dans un congrès lirmm-03833983v1
	Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks Annachiara Ruospo , Lucas Matana Luza , Alberto Bosio , Marcello Traiola , Luigi Dilillo LATS 2021 - IEEE 22nd Latin American Test Symposium, Oct 2021, Punta del Este, Uruguay. pp.1-5, ⟨10.1109/LATS53581.2021.9651807⟩ Communication dans un congrès lirmm-03435567v1
	A Model-Based Framework to Assess the Reliability of Safety-Critical Applications Lucas Matana Luza , Annachiara Ruospo , Alberto Bosio , Ernesto Sanchez , Luigi Dilillo DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩ Communication dans un congrès hal-03266848v1
	Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study Lucas Matana Luza , Daniel Söderström , André Martins Pio De Mattos , Eduardo Augusto Bezerra , Carlo Cazzaniga DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505143⟩ Communication dans un congrès lirmm-03357444v1
	Characterization of a RISC-V System-on-Chip under Neutron Radiation Douglas Almeida dos Santos , Lucas Matana Luza , Maria Kastriotou , Carlo Cazzaniga , Cesar A Zeferino DTIS 2021 - 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Jun 2021, Montpellier, France. ⟨10.1109/DTIS53253.2021.9505054⟩ Communication dans un congrès lirmm-03357515v1
	A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems Douglas Almeida dos Santos , Lucas Matana Luza , Cesar Albenes Zeferino , Luigi Dilillo , Douglas Rossi de Melo DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-5, ⟨10.1109/DTIS48698.2020.9081185⟩ Communication dans un congrès lirmm-03026132v1
	Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment Daniel Soderstrom , Lucas Matana Luza , Heikki Kettunen , Arto Javanainen , Wilfrid Farabolini NSREC 2020 - IEEE Nuclear and Space Radiation Effects Conference, Nov 2020, Santa Fe (virtual), United States Communication dans un congrès lirmm-03028881v1
	Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems Lucas Matana Luza , Daniel Soderstrom , Georgios Tsiligiannis , Helmut Puchner , Carlo Cazzaniga DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250865⟩ Communication dans un congrès lirmm-03025736v1
	Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM Lucas Matana Luza , Daniel Soderstrom , Helmut Puchner , Ruben Garcia Alia , Manon Letiche DTIS 2020 - 15th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, Apr 2020, Marrakech, Morocco. pp.1-6, ⟨10.1109/DTIS48698.2020.9080918⟩ Communication dans un congrès lirmm-03025721v1
	A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites Cézar Antônio Rigo , Lucas Matana Luza , Elder Dominghini Tramontin , Victor Martins , Sara Vega Martinez LATS 2019 - 20th IEEE Latin American Test Symposium, Mar 2019, Santiago, Chile. ⟨10.1109/LATW.2019.8704551⟩ Communication dans un congrès lirmm-02008436v1
	Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash Viyas Gupta , Alexandre Louis Bosser , Lucas Matana Luza , Daniel Söderström , Arto Javanainen RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745668⟩ Communication dans un congrès lirmm-03358989v1
	Design and Implementation of a Flexible Interface for TID Detector Iacopo Fara , Lucas Matana Luza , Jérôme Boch , Gianluca Furano , Marco Ottavi IWASI 2019 - 8th IEEE International Workshop on Advances in Sensors and Interfaces, Jun 2019, Otranto, Italy. pp.158-162, ⟨10.1109/IWASI.2019.8791299⟩ Communication dans un congrès lirmm-02415559v1
	Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam Daniel Söderström , Lucas Matana Luza , Alexandre Bosser , Thierry Gil , Kay-Obbe Voss RADECS 2019 - 19th European Conference on Radiation and Its Effects on Components and Systems, Sep 2019, Montpellier, France. ⟨10.1109/RADECS47380.2019.9745715⟩ Communication dans un congrès lirmm-03359010v1
	Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory Lucas Matana Luza , Alexandre Bosser , Viyas Gupta , Arto Javanainen , Ali Mohammadzadeh DFT 2019 - 32th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2019, Noordwijk, Netherlands. pp.1-6, ⟨10.1109/DFT.2019.8875475⟩ Communication dans un congrès lirmm-03025660v1
	Enabling deep-space CubeSat missions through state-of-the-art radiation-hardened technologies Lucas Matana Luza , Cézar Antônio Rigo , Elder Dominghini Tramontin , Victor Manuel Goncalves Martins , Sara Vega Martinez 3rd IAA Latin American CubeSat Workshop (IAA-LACW 2018), Dec 2018, Ubatuba, Brazil Communication dans un congrès lirmm-02008460v1

	Machine learning application to space particle discrimination from multiple-cell upsets in a memory device Andrea Coronetti , Lucas Matana Luza , Sanaa Barik , Alexandre Bosser , Ruben Garcia Alia RADECS 2022 - European Conference on Radiation and Its Effects on Components and Systems, Oct 2022, Venice, Italy. , 2022 Poster de conférence lirmm-03837246v1
	Technology Dependence of Stuck Bits and Single Event Upsets in 110, 72, and 63-nm SDRAMs Daniel Söderström , Lucas Matana Luza , André Martins Pio de Mattos , Thierry Gil , Heikki Kettunen RADECS 2022 - RADiation and its Effects on Components and Systems, Oct 2022, Venice, Italy. , 2022 Poster de conférence lirmm-03834026v1