Lionel Bastard
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(Invited) Second Harmonic Generation: A Powerful Non-Destructive Characterization Technique for Dielectric-on-Semiconductor InterfacesECS Transactions, 2020, 97 (1), pp.119-130. ⟨10.1149/09701.0119ecst⟩
Article dans une revue
hal-02861584v1
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