Laurent Latorre

Documents

Identifiants chercheurs

laurent-latorre
0000-0003-0478-1572
IdRef : 160859581

Présentation

Publications

florence-azais

	Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2021, 40 (11), pp.2400-2410. ⟨10.1109/TCAD.2020.3043318⟩ Article dans une revue lirmm-03426162v1
	Low-Cost Digital Test Solution for Symbol Error Detection of RF ZigBee Transmitters Thibault Vayssade , Florence Azaïs , Laurent Latorre , Francois Lefèvre IEEE Transactions on Device and Materials Reliability, 2019, 19 (1), pp.16-24. ⟨10.1109/TDMR.2019.2898769⟩ Article dans une revue lirmm-02077048v1
	SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE Florence Azaïs , Stéphane David-Grignot , Laurent Latorre , François Lefevre Journal of Electronic Testing: : Theory and Applications, 2016, 32 (1), pp.69-82. ⟨10.1007/s10836-015-5556-y⟩ Article dans une revue lirmm-01347312v1
	Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits Florence Azaïs , Stéphane David-Grignot , Laurent Latorre , François Lefevre Journal of Circuits, Systems, and Computers, 2016, 25 (3), pp.#1640014. ⟨10.1142/S0218126616400144⟩ Article dans une revue lirmm-01233013v1
	Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre Journal of Electronic Testing: : Theory and Applications, 2015, 31 (5-6), pp.443-459. ⟨10.1007/s10836-015-5548-y⟩ Article dans une revue lirmm-01233017v1
	A Level-Crossing Approach for the Analysis of RF Modulated Signals using only Digital Test Resources Nicolas Pous , Florence Azaïs , Laurent Latorre , Jochen Rivoir Journal of Electronic Testing: : Theory and Applications, 2011, 27 (3), pp.289-303. ⟨10.1007/s10836-011-5222-y⟩ Article dans une revue lirmm-00702746v1
	Electro-thermal stimuli for MEMS testing in FSBM technology Norbert Dumas , Florence Azaïs , Laurent Latorre , Pascal Nouet Journal of Electronic Testing: : Theory and Applications, 2006, 22 (2), pp.189-198. ⟨10.1007/s10836-005-6132-7⟩ Article dans une revue lirmm-00112942v1

	Low-cost digital solution for production test of ZigBee transmitters - Special Session “AMS-RF testing” Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre LATS 2023 - IEEE 24th Latin American Test Symposium, Mar 2023, Veracruz, Mexico. pp.1-2, ⟨10.1109/LATS58125.2023.10154484⟩ Communication dans un congrès lirmm-04257082v1
	Digital test of ZigBee transmitters: Validation in industrial test environment Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre DATE 2021 - 24th Design, Automation and Test in Europe Conference and Exhibition, Feb 2021, Grenoble, France. pp.396-401, ⟨10.23919/DATE51398.2021.9474090⟩ Communication dans un congrès lirmm-03426209v1
	Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli Thibault Vayssade , Mouhamad Chehaitly , Florence Azaïs , Laurent Latorre , François Lefèvre ETS 2021 - 26th IEEE European Test Symposium, May 2021, Bruges, Belgium. pp.1-6, ⟨10.1109/ETS50041.2021.9465473⟩ Communication dans un congrès lirmm-03426321v1
	Low-cost testing of a 2.4GHz ZigBee transmitter using standard digital ATE Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre ETS 2020 - 25th IEEE European Test Symposium, May 2020, Tallinn, Estonia Communication dans un congrès lirmm-03001537v1
	Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs Florence Azaïs , Serge Bernard , Mariane Comte , Bastien Deveautour , Sophie Dupuis IOLTS 2020 - 26th IEEE International Symposium on On-Line Testing and Robust System Design, Jul 2020, Napoli, Italy. pp.1-4, ⟨10.1109/IOLTS50870.2020.9159723⟩ Communication dans un congrès lirmm-02993384v1
	EVM measurement of RF ZigBee transceivers using standard digital ATE Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefèvre DFT 2020 - 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2020, Frascati, Italy. pp.1-6, ⟨10.1109/DFT50435.2020.9250900⟩ Communication dans un congrès lirmm-03000882v1
	Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefevre ETS 2019 - 24th IEEE European Test Symposium, May 2019, Baden-Baden, Germany. ⟨10.1109/ETS.2019.8791540⟩ Communication dans un congrès lirmm-02274367v1
	Test of 2.4 GHz ZigBee Transmitter using Standard Digital ATE Thibault Vayssade , Florence Azaïs , Laurent Latorre , François Lefevre SETS 2019 - South European Test Seminar, 2019, Pitztal, Austria Communication dans un congrès lirmm-02375880v1
	Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE Thibault Vayssade , Florence Azaïs , Laurent Latorre , Francois Lefèvre IOLTS: International On-Line Testing Symposium, Jul 2018, Platja d'Aro, Spain. pp.17-22, ⟨10.1109/IOLTS.2018.8474229⟩ Communication dans un congrès lirmm-01997910v1
	Embedded test instrument for on-chip phase noise evaluation of analog/IF signals Florence Azaïs , Stéphane David-Grignot , Laurent Latorre , François Lefevre DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2015, Belgrade, Serbia. pp.237-242, ⟨10.1109/DDECS.2015.11⟩ Communication dans un congrès lirmm-01233136v1
	Digital on-chip measurement circuit for built-in phase noise testing Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre IMSTW: International Mixed-Signals Test Workshop, Jun 2015, Paris, France. ⟨10.1109/IMS3TW.2015.7177880⟩ Communication dans un congrès lirmm-01233161v1
	A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre ETS: European Test Symposium, May 2015, Cluj-Napoca, Romania. pp.1-6, ⟨10.1109/ETS.2015.7138761⟩ Communication dans un congrès lirmm-01233093v1
	A digital technique for the evaluation of SSB phase noise of analog/RF signals Florence Azaïs , Stéphane David-Grignot , François Lefevre , Laurent Latorre LATS: Latin-American Test Symposium, Mar 2015, Puerto Vallarta, Mexico. ⟨10.1109/LATW.2015.7102407⟩ Communication dans un congrès lirmm-01233125v1
	Stochastic model for phase noise measurement from 1-bit signal acquisition Stéphane David-Grignot , Florence Azaïs , François Lefevre , Laurent Latorre IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop, Sep 2014, Porto Alegre, Brazil. ⟨10.1109/IMS3TW.2014.6997400⟩ Communication dans un congrès lirmm-01119368v1
	Low-cost phase noise testing of complex RF ICs using standard digital ATE Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre ITC: International Test Conference, Oct 2014, Seattle, WA, United States. ⟨10.1109/TEST.2014.7035301⟩ Communication dans un congrès lirmm-01119356v1
	Phase noise measurement on IF analog signals using standard digital ATE resources Stéphane David-Grignot , Laurent Latorre , Florence Azaïs , François Lefevre NEWCAS: New Circuits and Systems, Jun 2014, Trois-Rivieres, Canada. pp.121-124, ⟨10.1109/NEWCAS.2014.6933998⟩ Communication dans un congrès lirmm-01119359v1
	Low-cost SNR estimation of analog signals using standard digital Automated Test Equipment (ATE) Florence Azaïs , Laurent Latorre NEWCAS: International New Circuits and Systems Conference, Jun 2012, Montréal, Canada. pp.197-200, ⟨10.1109/NEWCAS.2012.6328990⟩ Communication dans un congrès lirmm-00803558v1
	Level-Crossing based QAM Demodulation for Low-Cost Analog/RF Testing Nicolas Pous , Florence Azaïs , Laurent Latorre , Gabriel Confais , Jochen Rivoir NEWCAS: International New Circuits and Systems Conference, Jun 2011, Bordeaux, France. pp.309-312, ⟨10.1109/NEWCAS.2011.5981317⟩ Communication dans un congrès lirmm-00702763v1
	On the Use of Standard Digital ATE for the Analysis of RF Signals Nicolas Pous , Florence Azaïs , Laurent Latorre , Jochen Rivoir ETS 2010 - 15th IEEE European Test Symposium, May 2010, Prague, Czech Republic. pp.43-48, ⟨10.1109/ETSYM.2010.5512782⟩ Communication dans un congrès lirmm-00492828v1
	AM-Demodulation of Analog/RF Signals Using Digital Tester Channels Nicolas Pous , Florence Azaïs , Laurent Latorre , Jochen Rivoir IMS3TW 2010 - 16th IEEE International Mixed-Signals, Sensors and Systems Test Workshop, Jun 2010, La Grande Motte, France. ⟨10.1109/IMS3TW.2010.5503013⟩ Communication dans un congrès lirmm-00494546v1
	Experiments on the Analysis of Phase/Frequency-Modulated RF Signals Using Digital Tester Channels Nicolas Pous , Florence Azaïs , Laurent Latorre , Pascal Nouet , Jochen Rivoir LATW'10: 11th Latin-American Test Workshop, Punta del Este, Uruguay. pp.N/A Communication dans un congrès lirmm-00473524v1
	Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals using Digital ATE Florence Azaïs , Laurent Latorre , Pascal Nouet , Nicolas Pous , Jochen Rivoir ATS: Asian Test Symposium, 2009, Taichung, Taiwan. pp.261-266, ⟨10.1109/ATS.2009.56⟩ Communication dans un congrès lirmm-00436384v1
	Use of a Statistical Approach for Efficient Implementation of Oscillation-Based Test Strategy Aboubacar Chaehoi , Laurent Latorre , Florence Azaïs , Pascal Nouet IMSTW'03: 9th IEEE International Mixed-Signal Testing Workshop, Sevilla (Spain), France. pp. 99-103 Communication dans un congrès lirmm-00269582v1
	European Network for Test Education Yves Bertrand , Marie-Lise Flottes , Florence Azaïs , Serge Bernard , Laurent Latorre DELTA'02: 1st International Workshop on Electronic DesignTest and Applications, Christchurch, New Zeland, pp.230-239 Communication dans un congrès lirmm-00268490v1
	Conception de MEMS : de l'idée à l'integration SoC/SiP Olivier Leman , Boris Alandry , El Mehdi Boujamaa , Norbert Dumas , Frédérick Mailly GDR SoC-SiP: System-On-Chip & Sytem-In-Package, Jun 2008, Paris, France Communication dans un congrès lirmm-00361232v1
	On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field Sensor Olivier Leman , Florence Azaïs , Laurent Latorre , Frédérick Mailly , Pascal Nouet LATW'06: 7th IEEE Latin American Test Workshop, Mar 2006, Buenos Aires, Argentina. pp.29-34 Communication dans un congrès lirmm-00102750v1
	BIST Implementation of Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor Norbert Dumas , Florence Azaïs , Laurent Latorre , Pascal Nouet LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.207-212 Communication dans un congrès lirmm-00106516v1
	Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias Modulation Frédérick Mailly , Norbert Dumas , Laurent Latorre , Florence Azaïs , Pascal Nouet LATW: Latin American Test Workshop, Mar 2005, Salvador, Bahia, Brazil. pp.213-218 Communication dans un congrès lirmm-00106517v1
	On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor Norbert Dumas , Florence Azaïs , Laurent Latorre , Pascal Nouet VTS'05: 23rd IEEE VLSI Test Symposium, May 2005, Palm Springs, CA (USA), pp.213-218 Communication dans un congrès lirmm-00105996v1
	Superposition vs. Modulation: A Comparative Analysis for Electro-Thermal On-Line MEMS Testing Frédérick Mailly , Florence Azaïs , Norbert Dumas , Laurent Latorre , Pascal Nouet IMSTW'05: 11th IEEE International Mixed-Signal Testing Workshop, Jun 2005, Cannes, pp.212-219 Communication dans un congrès lirmm-00106522v1
	Towards On-Line Testing of MEMS Using Electro-Thermal Excitation Frédérick Mailly , Florence Azaïs , Norbert Dumas , Laurent Latorre , Pascal Nouet ETS: European Test Symposium, May 2005, Tallinn, Estonia. pp.76-81 Communication dans un congrès lirmm-00106009v1
	On the Use of Electrical Stimuli for MEMS Testing Norbert Dumas , Florence Azaïs , Laurent Latorre , Pascal Nouet LATW'04: 5th IEEE Latin American Test Workshop, Mar 2004, Cartagena, Spain. pp.118-122 Communication dans un congrès lirmm-00108651v1
	Electrically-Induced Thermal Stimuli for MEMS Testing Norbert Dumas , Florence Azaïs , Laurent Latorre , Pascal Nouet ETS: European Test Symposium, May 2004, Ajaccio, Corsica, France. pp.60-65 Communication dans un congrès lirmm-00108904v1
	Test Digital, Test de Mémoires, Test Mixte : 5 Centres de Compétence pour la Formation en Europe Laurent Latorre , Florence Azaïs , Marie-Lise Flottes , Serge Bernard , Régis Lorival CNFM'04 : 8ème Journées Pédagogiques du Comité National de Formation en Microélectronique, 2004, Saint Malo, France. p. 242 Communication dans un congrès lirmm-00108671v1
	EuNICE-Test Project: A remote Access to Engineering Test for European Universities Yves Bertrand , Marie-Lise Flottes , Florence Azaïs , Serge Bernard , Laurent Latorre EWME: European Workshop on Microelectronics Education, 2002, Vigo, Spain. pp.133-136 Communication dans un congrès lirmm-00268489v1
	A Remote Access to Engineering Test Facilities for the Distant Education of European Microelectronics Students Yves Bertrand , Marie-Lise Flottes , Florence Azaïs , Serge Bernard , Laurent Latorre 32nd Annual Frontiers in Education (FIE), Nov 2002, Boston, MA, United States. pp.T2E-24, ⟨10.1109/FIE.2002.1157943⟩ Communication dans un congrès lirmm-00269423v1

	Analog Measurements based on Digital Test Equipment for Low-Cost Testing of Analog/RF Circuits Stéphane David-Grignot , Florence Azaïs , Laurent Latorre , François Lefevre ETS: European Test Symposium, May 2013, Avignon, France. , 18th IEEE European Test Symposium, 2013 Poster de conférence lirmm-00820084v1

	Test de Circuits et de Systèmes Intégrés Florence Azaïs , Serge Bernard , Yves Bertrand , Marie-Lise Flottes , Patrick Girard Collection EGEM, Ed.Hermès, 2004, 2-7462-0864-4 Ouvrages lirmm-00109158v1

	Method And Apparatus For Measuring Phase Noise Florence Azaïs , Laurent Latorre , Stéphane David-Grignot , François Lefevre France, Patent n° : 81582852EP01. 2013, pp.32 Brevet lirmm-00985404v1

	Project Management and Trainer Education Deliverable: Management Report, Attendees and Training Contents, Training Evaluation Marie-Lise Flottes , Yves Bertrand , Florence Azaïs , Régis Lorival , Serge Bernard 2002 Autre publication scientifique lirmm-00268593v1

Laurent Latorre

Présentation

Publications

Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition

Low-Cost Digital Test Solution for Symbol Error Detection of RF ZigBee Transmitters

SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE

Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits

Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range

A Level-Crossing Approach for the Analysis of RF Modulated Signals using only Digital Test Resources

Electro-thermal stimuli for MEMS testing in FSBM technology

Low-cost digital solution for production test of ZigBee transmitters - Special Session “AMS-RF testing”

Digital test of ZigBee transmitters: Validation in industrial test environment

Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli

Low-cost testing of a 2.4GHz ZigBee transmitter using standard digital ATE

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

EVM measurement of RF ZigBee transceivers using standard digital ATE

Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition

Test of 2.4 GHz ZigBee Transmitter using Standard Digital ATE

Low-cost functional test of a 2.4 GHz OQPSK transmitter using standard digital ATE

Embedded test instrument for on-chip phase noise evaluation of analog/IF signals

Digital on-chip measurement circuit for built-in phase noise testing

A New Technique for Low-Cost Phase Noise Production Testing from 1-bit Signal Acquisition

A digital technique for the evaluation of SSB phase noise of analog/RF signals

Stochastic model for phase noise measurement from 1-bit signal acquisition

Low-cost phase noise testing of complex RF ICs using standard digital ATE

Phase noise measurement on IF analog signals using standard digital ATE resources

Low-cost SNR estimation of analog signals using standard digital Automated Test Equipment (ATE)

Level-Crossing based QAM Demodulation for Low-Cost Analog/RF Testing

On the Use of Standard Digital ATE for the Analysis of RF Signals

AM-Demodulation of Analog/RF Signals Using Digital Tester Channels

Experiments on the Analysis of Phase/Frequency-Modulated RF Signals Using Digital Tester Channels

Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals using Digital ATE

Use of a Statistical Approach for Efficient Implementation of Oscillation-Based Test Strategy

European Network for Test Education

Conception de MEMS : de l'idée à l'integration SoC/SiP

On the Testing of the Electronic Conditioning Chain of a CMOS MEMS Based Magnetic Field Sensor

BIST Implementation of Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor

Electro-Thermal On-Line Testing of a MEMS Magnetometer Through Bias Modulation

On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor

Superposition vs. Modulation: A Comparative Analysis for Electro-Thermal On-Line MEMS Testing

Towards On-Line Testing of MEMS Using Electro-Thermal Excitation

On the Use of Electrical Stimuli for MEMS Testing

Electrically-Induced Thermal Stimuli for MEMS Testing

Test Digital, Test de Mémoires, Test Mixte : 5 Centres de Compétence pour la Formation en Europe

EuNICE-Test Project: A remote Access to Engineering Test for European Universities

A Remote Access to Engineering Test Facilities for the Distant Education of European Microelectronics Students

Analog Measurements based on Digital Test Equipment for Low-Cost Testing of Analog/RF Circuits

Test de Circuits et de Systèmes Intégrés

Method And Apparatus For Measuring Phase Noise

Project Management and Trainer Education Deliverable: Management Report, Attendees and Training Contents, Training Evaluation