Nombre de documents

26

CV


Article dans une revue11 documents

  • Son Ha Tran, Laurent Dupont, Zoubir Khatir. Electrothermal evaluation of single and multiple solder void effects on low-voltage Si MOSFET behavior in forward bias conditions. IEEE Transactions on Components, Packaging and Manufacturing Technology, 2017, 9p. 〈10.1109/TCPMT.2016.2633582〉. 〈hal-01466016〉
  • Benoit Thollin, Laurent Dupont, Yvan Avenas, Jean Christophe Crebier, Zoubir Khatir. Numerical and Experimental Evaluation of the Microsecond Pulsed Heating Curve Technique Dedicated to Die Interconnection Characterization. IEEE Transactions on Components, Packaging and Manufacturing Technology, 2016, 6 (6), pp. 835-45. 〈10.1109/TCPMT.2016.2554538〉. 〈hal-01466101〉
  • Laurent Dupont, Yvan Avenas. Preliminary Evaluation of Thermo-Sensitive Electrical Parameters Based on the Forward Voltage for Online Chip Temperature Measurements of IGBT Devices. IEEE Transactions on Industry Applications, Institute of Electrical and Electronics Engineers, 2015, 6 (51), pp.4688-4698. 〈10.1109/TIA.2015.2458973〉. 〈hal-01466116〉
  • Laurent Dupont, Yvan Avenas, Pierre Olivier Jannin. Comparison of junction temperature evaluations in a power IGBT module using an IR camera and three thermo-sensitive electrical parameters. IEEE Transactions on Industry Applications, Institute of Electrical and Electronics Engineers, 2013, 49 (4), pp. 1599-1608. 〈10.1109/TIA.2013.2255852〉. 〈hal-01059069〉
  • Laurent Dupont, Yvan Avenas, Pierre-Olivier Jeannin. Comparison of junction temperature evaluations in a power IGBT module using an IR camera and three thermo-sensitive electrical parameters. IEEE Transactions on Industry Applications, Institute of Electrical and Electronics Engineers, 2013, 49 (4), pp.1599-1608. 〈hal-00988200〉
  • Yvan Avenas, Laurent Dupont, Zoubir Khatir. Temperature Measurement of Power Semiconductor Devices by Thermo-Sensitive Electrical Parameters – A Review. IEEE Transactions on Power Electronics, Institute of Electrical and Electronics Engineers, 2012, 27 (6), pp 3081-3092. 〈hal-01073933〉
  • Yvan Avenas, Laurent Dupont, Zoubir Khatir. Temperature Measurement of Power Semiconductor Devices by Thermo-Sensitive Electrical Parameters--A Review. IEEE Transactions on Power Electronics, Institute of Electrical and Electronics Engineers, 2012, 27 (6), pp.3081 - 3092. 〈hal-00709838〉
  • Yvan Avenas, Laurent Dupont. Evaluation of IGBT thermo-sensitive electrical parameters under different dissipation conditions - Comparison with infrared measurements. Microelectronics Reliability, Elsevier, 2012, 52 (11), pp.2617-2626. 〈hal-00742139〉
  • Yvan Avenas, Laurent Dupont. Evaluation of IGBT thermo-sensitive electrical parameters under different dissipation conditions – Comparison with infrared measurements. Microelectronics Reliability, Elsevier, 2012, 52 (11), pp. 2617-2626. 〈10.1016/j.microrel.2012.03.032〉. 〈hal-01059453〉
  • Mounira Bouarroudj-Berkani, Zoubir Khatir, Jean-Pierre Ousten, F. Badel, Laurent Dupont, et al.. Degradation behavior of 600 V-200 A IGBT modules under power cycling and high temperature environment conditions. Microelectronics Reliability, Elsevier, 2007, 47, pp.719-1724. 〈hal-00869421〉
  • Laurent Dupont, Stépahne Lefebvre, Zoubir Khatir, Gérard Coquery, Jean-Claude Faugiere. Banc de cyclage actif pour l’analyse de la fatigue thermique des brasures de composants IGBTs. REE - Revue de l’électricité électronique, See, 2004, pp.45-51. 〈hal-00861641〉

Communication dans un congrès14 documents

  • Ibrahima Ka, Yvan Avenas, Laurent Dupont, Mickael Petit. Développement d'une puce instrumentée adaptée à la mesure de température dans les modules de puissance. 2ème Symposium de Génie Electrique (SGE 2016), Jun 2016, Grenoble, France. SGE 2016 - Symposium de Génie Electrique, 2016, 〈https://sge2016.sciencesconf.org/〉. 〈hal-01466194〉
  • Nick Baker, Francesco Iannuzzo, Stig Munk-Nielsen, Laurent Dupont, Yvan Avenas. Experimental Evaluation of IGBT Junction Temperature Measurement via a Modified-VCE (VCE_VGE) Method with Series Resistance Removal. CIPS2016 - 9th Conference on Integrated Power Electronics Systems, Mar 2016, Nuremberg, Germany. Institute of Electrical and Electronics Engineers - IEEE, CIPS2016 - 9th Conference on Integrated Power Electronics Systems, 6p, 2016. 〈hal-01466153〉
  • Ibrahima Ka, Yvan Avenas, Laurent Dupont, Mickaël Petit. Développement d'une puce instrumentée adaptée à la mesure de température dans les modules de puissance. Symposium de Genie Electrique, Jun 2016, Grenoble, France. 〈hal-01361641〉
  • S.H. Tran, Laurent Dupont, Zoubir Khatir. Solder void position and size effects on electro thermal behaviour of MOSFET transistors in forward bias conditions. ESREF-25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Sep 2014, BERLIN, Germany. ELSEVIER, ESREF-25th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 54 (9-10), pp.PP.1921-1926, 2014, 〈10.1016/j.microrel.2014.07.152〉. 〈hal-01471815〉
  • Son Ha Tran, Laurent Dupont, Zoubir Khatir. Evaluation du comportement électrothermique de transistors MOSFET en conduction en présence de défaut dans la brasure. SGE'14 - Symposium de Génie Électrique, Jul 2014, Cachan, France. ENGINEERING FOUNDATION - EF, SGE'14 - Symposium de Génie Électrique, 2014. 〈hal-01319239〉
  • Laurent Dupont, Yvan Avenas. Evaluation of Thermo-Sensitive Electrical Parameters Based on the Forward Voltage for On-line Chip Temperature Measurements of IGBT Devices. ECCE2014, Sep 2014, Pittsburg, United States. 2014. 〈hal-01069990〉
  • Laurent Dupont, Yvan Avenas. Evaluation de paramètres thermosensibles basés sur la mesure de la tension directe de composants IGBT pour une utilisation dans des conditions d'usage. Symposium de Génie Electrique - SGE2014, Jul 2014, Cachan, France. 2014. 〈hal-01024080〉
  • Benoît Thollin, Laurent Dupont, Zoubir Khatir, Yvan Avenas, Jean-Christophe Crébier, et al.. Partial Thermal Impedance Measurement for Die Interconnection Characterization by a microsecond "Pulsed Heating Curve Technique. EPE'13 ECCE Europe, 2013, Lille, France. 2013. 〈hal-00988257〉
  • Benoit Thollin, Laurent Dupont, Zoubir Khatir, Yvan Avenas, Jean Christophe Crebier, et al.. Partial Thermal Impedance Measurement for Die Interconnection Characterization by a Microsecond 'Pulsed Heating Curve Technique'. European Conference on Power Electronics and Applications, Sep 2013, France. 10p, 2013. 〈hal-01056909〉
  • N. Baker, M. Liserre, Laurent Dupont, Yvan Avenas. Junction temperature measurements via thermo-sensitive electrical parameters and their application to condition monitoring and active thermal control of power converters. Annual Conference of the IEEE Industrial Electronics Society, IECON, 2013, Vienne, Austria. pp.942-948, 2013. 〈hal-00988264〉
  • Aurelie Charles, Matthieu Lauras, Laurent Dupont. Designing a humanitarian supply network: one way to deal with demand uncertainty. . 4th International Conference on Information Systems, Logistics and Supply Chain, ILS 2012, Aug 2012, Québec, Canada. 8 p. 〈hal-01551446〉
  • Laurent Dupont, Yvan Avenas, Pierre-Olivier Jeannin. Comparison of junction temperature evaluations in a power IGBT module using an IR camera and three thermo-sensitive electrical parameters. Applied Power Electronics Conference and Exposition APEC 2012, Feb 2012, Orlando, United States. p 182 à 189, 2012. 〈hal-00673411〉
  • Benoît Thollin, Jean-Christophe Crébier, Yvan Avenas, Pierre-Olivier Jeannin, Zoubir Khatir, et al.. Development and Electrical Characterization of a Vertical Electrical and Thermal Test Chip (VTTC). ECCE 2011, Sep 2011, Phoenix, United States. 2011. 〈hal-00627287〉
  • Laurent Dupont, Stéphane Lefebvre, Zoubir Khatir, Jean Claude Faugiere. Power Cycling Test Circuit for Thermal Fatigue Resistance Analysis of Solder Joints in IGBT. 10th European Conférence on Power Electronics and Applications, Sep 2003, France. 8p, 2003. 〈hal-00868868〉

Autre publication1 document

  • Laurent Dupont. Contribution à l’étude de la durée de vie des assemblages de puissance dans des environnements haute température avec des cycles thermiques de grande amplitude. déjà déposée dans TEL. 2006, 189 p. 〈hal-00983098〉