Karim Inal
1
Documents
Présentation
Thèse Orsay-ENSAM, ATER ENSAM Paris, MCF ENSAM Metz puis Aix en Provence, Pr ENSMSE Gardanne, Pr MinesParisTech Sophia
Publications
- 1
- 1
- 1
- 1
- 1
- 1
- 1
Investigation of local stress around TSVs by micro-Raman spectroscopy and finite element simulationInternational Interconnect Technology Conference and Materials for Advanced Metallization 2011, May 2011, Dresde, Germany. pp.1-3, ⟨10.1109/IITC.2011.5940351⟩
Communication dans un congrès
emse-00638030v1
|