Marie-Christine Baietto, Jean-Yves Buffiere, Alain Combescure, Anthony Gravouil, François Hild, et al.. X-ray microtomography, X-3D-Digital Image Correlation and X-FEM multigrid, a general tool for 3D crack growth law identification.
8th. World Congress on Computational Mechanics (WCCM8), 5th. European Congress on Computational Methods in Applied Sciences and Engineering (ECCOMAS 2008), Jun 2008, Venise, Italy.
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