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Plasma etching defect formation and changes in the electronic and structural properties of InP/InAsP quantum wells

 Jean-Pierre Landesman , Juan Jiménez , Christophe Levallois , Cesare Frigeri , Alfredo Torres , et al.
18th Canadian Semiconductor Science and Technology Conference (CSSTC 2017), Oct 2017, Waterloo, Canada
Communication dans un congrès hal-01710287v1
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Mechanical stress in InP and GaAs ridges formed by reactive ion etching

 Jean-Pierre Landesman , Marc Fouchier , Erwine Pargon , Solène Gérard , Névine Rochat , et al.
Journal of Applied Physics, 2020, 128 (22), ⟨10.1063/5.0032838⟩
Article dans une revue hal-03043725v1

Effect of growth interruptions on TiO2 films deposited by plasma enhanced chemical vapour deposition

 D. Li , A. Goullet , Michèle Carette , A. Granier , Jean-Pierre Landesman
Materials Chemistry and Physics, 2016, 182, pp.409-417. ⟨10.1016/j.matchemphys.2016.07.049⟩
Article dans une revue hal-01395443v1

Nano robots pour la manipulation de nanofils de silicium

 Jean-Pierre Landesman , Laurent Pichon , Françis Gouttefangeas
Journal sur l'enseignement des sciences et technologies de l'information et des systèmes, 2018
Article dans une revue hal-02458119v1

GROWTH AND RAMAN ANALYSIS OF SILICON AND GERMANIUM NANOWIRES

 Mahmoud Israel , Regis Rogel , Alain Moréac , Jean-Pierre Landesman , Laurent Pichon
5th workshop NIMS, Oct 2015, Rennes, France
Communication dans un congrès hal-02457706v1

DOP characterization of oxide-confined GaAs based VCSEL operating at 850 nm

 Merwan Mokhtari , Philippe Pagnod-Rossiaux , Francois Laruelle , Jean-Pierre Landesman , Christophe Levallois , et al.
11th European Workshop on VCSELs (VCSEL Day 2018), Apr 2018, Ulm, Germany
Communication dans un congrès hal-02290642v1

Defect formation during chlorine-based dry etching and their effects on the electronic and structural properties of InP/InAsP quantum wells

 Jean-Pierre Landesman , Juan Jimenez , Christophe Levallois , Frédéric Pommereau , Cesare Frigeri , et al.
Journal of Vacuum Science & Technology A, 2016, 34 (4), pp.041304. ⟨10.1116/1.4950445⟩
Article dans une revue hal-01372796v1

Guides monomodes sur polymères SOG/SU-8, mesures des pertes optiques

 Nicolas Pelletier , Bruno Bêche , Etienne Gaviot , Rolland Hierle , Jean-Pierre Landesman , et al.
Journées Nationales de l’Optique Guidée, JNOG , 2004, Paris, France. pp.170-172
Communication dans un congrès hal-01552427v1

Microcapteurs à base de photonique intégrée sur matériaux polymères pour le développement de dispositifs dédiés aux mesures de pression et aux mesures de flux thermiques

 Nicolas Pelletier , Bruno Bêche , Najat Tahani , Etienne Gaviot , Lionel Camberlein , et al.
JNOG, Journées Nationales de l’Optique Guidée, 2005, Chambéry France
Communication dans un congrès hal-01552423v1

Bond Reliability Improvement at High Temperature by Pd Addition on Au Bonding Wires

 Bahi M.A. , P. Lecuyer , A. Gentil , H. Fremont , Jean-Pierre Landesman , et al.
10th Electronics Packaging Technology Conference (EPTC 2008), Dec 2008, Singapore. pp.EPTC 2008
Communication dans un congrès hal-00400185v1

Croissance et caractérisation de nanofils Si et Ge synthétisés par la méthode VLS

 Israel M. , Alain Moréac , Thomas Delhaye , Lannic J. Le , Rogel R. , et al.
Journées Narionales du Réseau Doctoral en Microélectronique, JNRDM 2013, Grenoble, Jun 2013, Grenoble, France
Poster de conférence hal-01153182v1

Micro-PL and DOP characterization of Vertical Cavity Surface Emitting Lasers (VCSEL) for emission at 850 nm with Al oxide confinement layers

 Merwan Mokhtari , Philippe Pagnod-Rossiaux , François Laruelle , Jean-Pierre Landesman , Alain Moréac , et al.
17th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII), Oct 2017, Valladolid, Spain
Communication dans un congrès hal-01711100v1

Micro-PL characterization of oxide-confined GaAs VCSEL operating at 850 nm

 Merwan Mokhtari , Philippe Pagnod-Rossiaux , François Laruelle , Jean-Pierre Landesman , Alain Moréac , et al.
10th European Workshop on VCSELs (VCSEL Day 2017), Jun 2017, Cardiff, United Kingdom
Poster de conférence hal-01710323v1
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Optical Characterizations of VCSEL for Emission at 850 nm with Al Oxide Confinement Layers

 Merwan Mokhtari , Philippe Pagnod-Rossiaux , Francois Laruelle , Jean-Pierre Landesman , Alain Moréac , et al.
Journal of Electronic Materials, 2018, Special Section: 17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII), 47 (9), pp.4987-4992. ⟨10.1007/s11664-018-6221-x⟩
Article dans une revue hal-01861355v1
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Low temperature micro-photoluminescence spectroscopy of microstructures with InAsP/InP strained quantum wells

 Jean-Pierre Landesman , Nebile Isik Goktas , Ray Lapierre , Christophe Levallois , Shahram Ghanad-Tavakoli , et al.
Journal of Physics D: Applied Physics, 2021, 54 (44), pp.445106. ⟨10.1088/1361-6463/ac1a33⟩
Article dans une revue hal-03324107v1
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Mechanical Stress in InP Structures Etched in an Inductively Coupled Plasma Reactor with Ar/Cl-2/CH4 Plasma Chemistry

 Jean-Pierre Landesman , Daniel T Cassidy , Marc Fouchier , Erwine Pargon , Christophe Levallois , et al.
Journal of Electronic Materials, 2018, Special Section: 17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII), 47 (9), pp.4964-4969. ⟨10.1007/s11664-018-6152-6⟩
Article dans une revue hal-01861357v1
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Chemical imaging of oxide confinement layers in GaAs/AlxGa1−xAs VCSELs

 Merwan Mokhtari , Philippe Pagnod-Rossiaux , Christophe Levallois , Alexandre Pofelski , François Laruelle , et al.
Semiconductor Science and Technology, 2022, 37 (7), pp.075016. ⟨10.1088/1361-6641/ac7070⟩
Article dans une revue hal-03695451v1

Investigation of processing-induced defects in GaAs based vertical cavity surface emitting lasers with Al oxide confinement layers

 Merwan Mokhtari , Philippe Pagnod-Rossiaux , François Laruelle , Jean-Pierre Landesman , Alain Moréac , et al.
18th Canadian Semiconductor Science and Technology Conference (CSSTC 2017), Aug 2017, Waterloo, Canada
Poster de conférence hal-01710316v1

Mapping of mechanical strain by DOP of oxide-confined GaAs based VCSEL operating at 850 nm

 Merwan Mokhtari , Philippe Pagnod-Rossiaux , François Laruelle , Jean-Pierre Landesman , Christophe Levallois , et al.
12th European Workshop on VCSELs (VCSEL Day 2019), May 2019, Brussels, Belgium
Communication dans un congrès hal-02290406v1

Low-temperature spatially-resolved luminescence spectroscopy of microstructures with strained III-V quantum wells

 Jean-Pierre Landesman , Nebile Isik Goktas , Ray Lapierre , Shahram Ghanad-Tavakoli , Erwine Pargon , et al.
241st Electrochemical Society Meeting, The Electrochemical Society, May 2022, Vancouver (BC), Canada
Communication dans un congrès hal-04433319v1
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Degree of polarization of luminescence from GaAs and InP as a function of strain: a theoretical investigation

 Daniel T Cassidy , Jean-Pierre Landesman
Applied optics, 2020, 59 (18), pp.5506. ⟨10.1364/AO.394624⟩
Article dans une revue hal-03029987v1

Photonics integrated circuits on plasma-polymer-HMDSO: Single-mode TE00-TM00 straight waveguides, S-Bends, Y-Junctions and Mach-Zehnder Interferometers

 Thomas Begou , Bruno Bêche , Antoine Goullet , Agnès A. Granier , Christophe Cardinaud , et al.
IEEE conference publications, 2006, IEEE Industrial Electronics, ⟨10.1109/IECON.2006.347474⟩
Article dans une revue hal-01552413v1

Structural and Optical Properties of PECVD TiO 2 -SiO 2 Mixed Oxide Films for Optical Applications

 Dayu Li , Stéphane Elisabeth , Agnès A. Granier , Michèle Carette , Antoine Goullet , et al.
Plasma Processes and Polymers, 2016, 13 (9), pp.918 - 928. ⟨10.1002/ppap.201600012⟩
Article dans une revue istex hal-01723409v1

Integrated Mach-Zehnder interferometer on SU-8 polymer for designing pressure sensors

 Nicolas Pelletier , Bruno Bêche , Najat Tahani , Lionel Camberlein , Etienne Gaviot , et al.
IEEE Sensors Journal, 2005, 4 pp.640-643. ⟨10.1109/ICSENS.2005.1597780⟩
Article dans une revue hal-01552268v1

Mechanical Stress in InP Structures Etched in an Inductively Coupled Plasma Reactor with Chlorine Chemistry

 Jean-Pierre Landesman , Daniel T Cassidy , Erwine Pargon , Christophe Levallois , Merwan Mokhtari , et al.
17th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII), Oct 2017, Valladolid, Spain
Communication dans un congrès hal-01711092v1

Mechanical and optical properties of amorphous silicon nitride-based films prepared by electron cyclotron resonance plasma-enhanced chemical vapor deposition

 Brahim Ahammou , Paramita Bhattacharyya , Christophe Levallois , Fahmida Azmi , Jean-Pierre Landesman , et al.
Journal of Vacuum Science & Technology A, 2023, 41 (5), pp.053113. ⟨10.1116/6.0002896⟩
Article dans une revue hal-04228208v1
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Strain engineering in III-V photonic components through structuration of SiN x films

 Brahim Ahammou , Aysegul Abdelal , Jean-Pierre Landesman , Christophe Levallois , Peter Mascher
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, 2022, 40 (1), pp.012202. ⟨10.1116/6.0001352⟩
Article dans une revue hal-03481497v1
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Degree of polarization of luminescence from InP under SiN stripes: fits to FEM simulations

 Daniel T Cassidy , Jean-Pierre Landesman
Optics Continuum , 2023, 2 (6), pp.1505-1522. ⟨10.1364/optcon.481902⟩
Article dans une revue hal-04133163v1

Croissance et caractérisation raman de nanofils de germanium

 Mahmoud Israel , Régis Rogel , Alain Moréac , Jean-Pierre Landesman , Laurent Pichon
Réunion pleinière des GDR PULSE et GDR NANOFILS, Oct 2014, Toulouse, France
Communication dans un congrès hal-01113529v1

Raman analysis of silicon and germanium nanowires

 Israel M. , Alain Moréac , Rogel R. , Jean-Pierre Landesman , Laurent Pichon
EMRS Spring Meeting 2014, May 2014, Lille, France
Communication dans un congrès hal-01152385v1
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