Plasma etching defect formation and changes in the electronic and structural properties of InP/InAsP quantum wells
Jean-Pierre Landesman
,
Juan Jiménez
,
Christophe Levallois
,
Cesare Frigeri
,
Alfredo Torres
,
et al.
18th Canadian Semiconductor Science and Technology Conference (CSSTC 2017) , Oct 2017, Waterloo, Canada
Communication dans un congrès
hal-01710287v1
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Mechanical stress in InP and GaAs ridges formed by reactive ion etching
Jean-Pierre Landesman
,
Marc Fouchier
,
Erwine Pargon
,
Solène Gérard
,
Névine Rochat
,
et al.
Article dans une revue
hal-03043725v1
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Effect of growth interruptions on TiO2 films deposited by plasma enhanced chemical vapour deposition
D. Li
,
A. Goullet
,
Michèle Carette
,
A. Granier
,
Jean-Pierre Landesman
Article dans une revue
hal-01395443v1
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Nano robots pour la manipulation de nanofils de silicium
Jean-Pierre Landesman
,
Laurent Pichon
,
Françis Gouttefangeas
Journal sur l'enseignement des sciences et technologies de l'information et des systèmes , 2018
Article dans une revue
hal-02458119v1
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GROWTH AND RAMAN ANALYSIS OF SILICON AND GERMANIUM NANOWIRES
Mahmoud Israel
,
Regis Rogel
,
Alain Moréac
,
Jean-Pierre Landesman
,
Laurent Pichon
5th workshop NIMS , Oct 2015, Rennes, France
Communication dans un congrès
hal-02457706v1
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DOP characterization of oxide-confined GaAs based VCSEL operating at 850 nm
Merwan Mokhtari
,
Philippe Pagnod-Rossiaux
,
Francois Laruelle
,
Jean-Pierre Landesman
,
Christophe Levallois
,
et al.
11th European Workshop on VCSELs (VCSEL Day 2018) , Apr 2018, Ulm, Germany
Communication dans un congrès
hal-02290642v1
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Defect formation during chlorine-based dry etching and their effects on the electronic and structural properties of InP/InAsP quantum wells
Jean-Pierre Landesman
,
Juan Jimenez
,
Christophe Levallois
,
Frédéric Pommereau
,
Cesare Frigeri
,
et al.
Article dans une revue
hal-01372796v1
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Guides monomodes sur polymères SOG/SU-8, mesures des pertes optiques
Nicolas Pelletier
,
Bruno Bêche
,
Etienne Gaviot
,
Rolland Hierle
,
Jean-Pierre Landesman
,
et al.
Journées Nationales de l’Optique Guidée, JNOG , 2004, Paris, France. pp.170-172
Communication dans un congrès
hal-01552427v1
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Microcapteurs à base de photonique intégrée sur matériaux polymères pour le développement de dispositifs dédiés aux mesures de pression et aux mesures de flux thermiques
Nicolas Pelletier
,
Bruno Bêche
,
Najat Tahani
,
Etienne Gaviot
,
Lionel Camberlein
,
et al.
JNOG, Journées Nationales de l’Optique Guidée , 2005, Chambéry France
Communication dans un congrès
hal-01552423v1
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Bond Reliability Improvement at High Temperature by Pd Addition on Au Bonding Wires
Bahi M.A.
,
P. Lecuyer
,
A. Gentil
,
H. Fremont
,
Jean-Pierre Landesman
,
et al.
10th Electronics Packaging Technology Conference (EPTC 2008) , Dec 2008, Singapore. pp.EPTC 2008
Communication dans un congrès
hal-00400185v1
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Croissance et caractérisation de nanofils Si et Ge synthétisés par la méthode VLS
Israel M.
,
Alain Moréac
,
Thomas Delhaye
,
Lannic J. Le
,
Rogel R.
,
et al.
Journées Narionales du Réseau Doctoral en Microélectronique, JNRDM 2013, Grenoble , Jun 2013, Grenoble, France
Poster de conférence
hal-01153182v1
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Micro-PL and DOP characterization of Vertical Cavity Surface Emitting Lasers (VCSEL) for emission at 850 nm with Al oxide confinement layers
Merwan Mokhtari
,
Philippe Pagnod-Rossiaux
,
François Laruelle
,
Jean-Pierre Landesman
,
Alain Moréac
,
et al.
17th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII) , Oct 2017, Valladolid, Spain
Communication dans un congrès
hal-01711100v1
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Micro-PL characterization of oxide-confined GaAs VCSEL operating at 850 nm
Merwan Mokhtari
,
Philippe Pagnod-Rossiaux
,
François Laruelle
,
Jean-Pierre Landesman
,
Alain Moréac
,
et al.
10th European Workshop on VCSELs (VCSEL Day 2017) , Jun 2017, Cardiff, United Kingdom
Poster de conférence
hal-01710323v1
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Optical Characterizations of VCSEL for Emission at 850 nm with Al Oxide Confinement Layers
Merwan Mokhtari
,
Philippe Pagnod-Rossiaux
,
Francois Laruelle
,
Jean-Pierre Landesman
,
Alain Moréac
,
et al.
Journal of Electronic Materials , 2018, Special Section: 17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII), 47 (9), pp.4987-4992.
⟨10.1007/s11664-018-6221-x⟩
Article dans une revue
hal-01861355v1
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Low temperature micro-photoluminescence spectroscopy of microstructures with InAsP/InP strained quantum wells
Jean-Pierre Landesman
,
Nebile Isik Goktas
,
Ray Lapierre
,
Christophe Levallois
,
Shahram Ghanad-Tavakoli
,
et al.
Article dans une revue
hal-03324107v1
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Mechanical Stress in InP Structures Etched in an Inductively Coupled Plasma Reactor with Ar/Cl-2/CH4 Plasma Chemistry
Jean-Pierre Landesman
,
Daniel T Cassidy
,
Marc Fouchier
,
Erwine Pargon
,
Christophe Levallois
,
et al.
Journal of Electronic Materials , 2018, Special Section: 17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVII), 47 (9), pp.4964-4969.
⟨10.1007/s11664-018-6152-6⟩
Article dans une revue
hal-01861357v1
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Mechanical and optical properties of amorphous silicon nitride-based films prepared by electron cyclotron resonance plasma-enhanced chemical vapor deposition
Brahim Ahammou
,
Paramita Bhattacharyya
,
Christophe Levallois
,
Fahmida Azmi
,
Jean-Pierre Landesman
,
et al.
Article dans une revue
hal-04228208v1
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Strain engineering in III-V photonic components through structuration of SiN x films
Brahim Ahammou
,
Aysegul Abdelal
,
Jean-Pierre Landesman
,
Christophe Levallois
,
Peter Mascher
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics , 2022, 40 (1), pp.012202.
⟨10.1116/6.0001352⟩
Article dans une revue
hal-03481497v1
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Croissance et caractérisation raman de nanofils de germanium
Mahmoud Israel
,
Régis Rogel
,
Alain Moréac
,
Jean-Pierre Landesman
,
Laurent Pichon
Réunion pleinière des GDR PULSE et GDR NANOFILS , Oct 2014, Toulouse, France
Communication dans un congrès
hal-01113529v1
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Raman analysis of silicon and germanium nanowires
Israel M.
,
Alain Moréac
,
Rogel R.
,
Jean-Pierre Landesman
,
Laurent Pichon
EMRS Spring Meeting 2014 , May 2014, Lille, France
Communication dans un congrès
hal-01152385v1
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Raman analysis of gold catalyst vapor liquid solid germanium nanowires
Israel M.
,
Alain Moréac
,
Rogel R.
,
Jean-Pierre Landesman
,
Laurent Pichon
Article dans une revue
istex
hal-01170266v1
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Mechanical strain mapping of GaAs based VCSELs
Merwan Mokhtari
,
Philippe Pagnod-Rossiaux
,
Christophe Levallois
,
Francois Laruelle
,
Daniel T Cassidy
,
et al.
Article dans une revue
hal-03190309v1
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Degree of polarization of luminescence from InP under SiN stripes: fits to FEM simulations
Daniel T Cassidy
,
Jean-Pierre Landesman
Article dans une revue
hal-04133163v1
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Characterization of Plasma Induced Damage and Strain on InP Patterns and Their Impact on Luminescence
Marc Fouchier
,
Maria Fahed
,
Erwine Pargon
,
Névine Rochat
,
Jean-Pierre Landesman
,
et al.
Article dans une revue
hal-01904717v1
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Effect of the plasma etching on InAsP/InP quantum well structures measured through low temperature micro-photoluminescence and cathodoluminescence
Jean-Pierre Landesman
,
Nebile Isik Goktas
,
R.R. Lapierre
,
Shahram Ghanad-Tavakoli
,
Erwine Pargon
,
et al.
237th ECS Meeting with the 18th International Meeting on Chemical Sensors, IMCS 2020 , May 2020, Montréal, Canada. pp.43-55
Communication dans un congrès
hal-02892615v1
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Guides monomodes sur polymères plasmas organosiliciés (SiOxCyHz)
Thomas Begou
,
Bruno Bêche
,
Antoine Goullet
,
Agnès A. Granier
,
Christophe Cardinaud
,
et al.
Journées Nationales de l’Optique Guidée, JNOG , 2006, Metz France. pp.291-293
Communication dans un congrès
hal-01552426v1
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Polarimetric photoluminescence microscope for strain imaging on semiconductor devices
Emmanuel Schaub
,
Brahim Ahammou
,
Jean-Pierre Landesman
Article dans une revue
hal-03564469v1
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Spatially resolved luminescence properties of quantum well etched microstructures
Jean-Pierre Landesman
20th International Conference on Crystal Growth and Epitaxy , Antonio Vecchione, SPIN-CNR, Salerno, Italy; Andrea Zappettini, IMEM-CNR, Parma, Italy, Jul 2023, Naples (Italie), Italy
Communication dans un congrès
hal-04433309v1
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Raman analysis of gold catalyst vapor liquid solid germanium nanowires
M. Israel
,
Alain Moréac
,
R. Rogel
,
Jean-Pierre Landesman
,
L. Pichon
Article dans une revue
istex
hal-03776601v1
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Evidence of chlorine ion penetration in InP/InAsP quantum well structures during dry etching processes and effects of induced-defects on the electronic and structural behaviour
Jean-Pierre Landesman
,
Christophe Levallois
,
J. Jimenez
,
F. Pommereau
,
Yoan Léger
,
et al.
Microelectronics Reliability , 2015, Proceedings of the 26th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2015), 55 (9-10), pp.1750-1753.
⟨10.1016/j.microrel.2015.07.029⟩
Article dans une revue
hal-01225634v1
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