Alexandre Jaffré, Hakim Arezki, Mohamed Boutchich, J Alvarez, Jean-Paul Kleider. Coupling on a confocal imaging system µ-Raman, µ-PL, AFM and electrical extensions at a sub micrometric scale
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International Workshop on Nanostructure Characterization and Nanomaterials, Thai Organic and Printed Electronics Innovation Center (TOPIC) / NECTEC, Aug 2015, Bangkok, Thailand.
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